High temperature investigation of ZnS:Ga and CdSe:Ga

vastutusandmed
K.Lott, T.Nirk, O.Volobujeva, S.Shinkarenko, A.Grebennik and A.Vishnjakov
allikas
The 23rd International Conference on Defects in Semiconductors : ICDS-23 : Awaji island, Japan, July 24 - July 29, 2005 : program and abstracts
ilmumiskoht
[S. l.]
ilmumisaasta
leheküljed
p. 210 : ill
märkused
Bibliogr.: 2 ref
keel
inglise