An improved test generation approach for sequential circuits using decision diagrams
vastutusandmed
Marina Brik, Raimund Ubar
ilmumiskoht
[Tallinn]
ilmumisaasta
leheküljed
p. 155-158: ill
ISBN
9985-59-081-3
märkused
Bibl. 8 ref
Brik, M., Ubar, R. An improved test generation approach for sequential circuits using decision diagrams // BEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings. [Tallinn], 1998. p. 155-158: ill.