DefSim-based exercises for studying defects in CMOS gatesJutman, Artur; Pleskacz, Witold A.; Boiko, Nikolai; Ubar, Raimund-JohannesEWME 2006 proceedings : 6th International Workshop on Microelectronics Education : 8-9 June, 2006, Stockholm, Sweden2006 / p. 23-26 : ill