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Challenges of reliability assessment and enhancement in autonomous systemsJenihhin, Maksim; Sonza Reorda, Matteo; Balakrishnan, Aneesh; Alexandrescu, Dan2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2019)2019 / 6 p https://doi.org/10.1109/DFT.2019.8875379

Effect of PM parameters variability on the operation quantities of a wind generatorKallaste, Ants; Belahcen, Anouar; Vaimann, Toomas2015 IEEE Workshop on Electrical Machines Design, Control and Diagnosis (WEMDCD) : proceedings : Castello del Valentino, Torino, Italy, 26-27 March, 20152015 / p. 242-247 : ill http://dx.doi.org/10.1109/WEMDCD.2015.7194536

Event-based control for differentially flat systems: application to autonomous underwater vehicleKaldmäe, Arvo; Kotta, Ülle; Meurer, Christian; Simha, AshutoshIFAC-PapersOnLine2019 / p. 180-185 https://doi.org/10.1016/j.ifacol.2019.11.775 Conference proceedings at Scopus Article at Scopus Article at WOS

Fault tolerance in integration interfaces of business softwareLemmik, Rivo; Karjust, Kristo; Otto, TaunoInternational Journal Of Scientific Knowledge (Computing and Information Technology) IJSK2014 / p. 35-43 : ill

FESDA : fog-enabled secure data aggregation in smart grid IoT networkSaleem, Ahsan; Khan, Abid; Malik, Saif Ur Rehman; Pervaiz, Haris; Malik, Hassan; Alam, Masoom; Jindal, AnishIEEE Internet of Things Journal2020 / p. 6132-6142 https://doi.org/10.1109/JIOT.2019.2957314 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

Handling of SETs on NoC links by exploitation of inherent redundancy in circular input buffers [Online resource]Janson, Karl; Pihlak, Rene; Azad, Siavoosh Payandeh; Niazmand, Behrad; Jervan, Gert; Raik, JaanBEC 2018 : 2018 16th Biennial Baltic Electronics Conference (BEC) : proceedings of the 16th Biennial Baltic Electronics Conference, October 8-10, 20182018 / 4 p.: ill https://doi.org/10.1109/BEC.2018.8600989

Hybrid DC–DC converters with topology morphing control and post-fault operation capabilityVinnikov, Dmitri; Chub, Andrii; Korkh, Oleksandr; Blinov, Andrei; Liivik, ElizavetaElectrimacs 2019 : Selected Papers, Vol. 12020 / p. 433-445 https://doi.org/10.1007/978-3-030-37161-6_33 Conference proceeding at Scopus Article at Scopus

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RESCUE EDA Toolset for interdependent aspects of reliability, security and quality in nanoelectronic systems designGürsoy, Cemil Cem; Cardoso Medeiros, Guilherme; Chen, Juanho; Balakrishnan, Aneesh; Lai, Xinhui; Bagbaba, Ahmet Cagri; Raik, Jaan; Jenihhin, MaksimDATE 20192019 / 1 p. : ill https://doi.org/10.5281/zenodo.3362529 https://past.date-conference.com/

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Self-healing photovoltaic microconverter with zero redundancy and accurate low-cost fault detectionBakeer, Abualkasim Ahmed Ali; Chub, Andrii; Vinnikov, DmitriIEEE transactions on industrial electronics2024 / p. 646-656 https://doi.org/10.1109/TIE.2023.3250836

Short-circuit fault detection and remedial in full-bridge rectifier of series resonant DC-DC converter based on inductor voltage signatureBakeer, Abualkasim Ahmed Ali; Chub, Andrii; Vinnikov, Dmitri2020 IEEE 61st International Scientific Conference on Power and Electrical Engineering of Riga Technical University (RTUCON), Riga, Latvia, Nov. 5-7, 2020 : conference proceedings2020 / 6 p. : ill https://doi.org/10.1109/RTUCON51174.2020.9316482

Systematic review of fault tolerant techniques in underwater sensor networksVihman, Lauri; Kruusmaa, Maarja; Raik, JaanSensors2021 / art. 3264 https://doi.org/10.3390/s21093264 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

Topology-morphing photovoltaic microconverter with wide MPPT voltage window and post-fault operation capabilityVinnikov, Dmitri; Chub, Andrii; Zinchenko, Denys; Sidorov, VadimIEEE Access2020 / art. 9171332, p. 153941-153955 : ill https://doi.org/10.1109/ACCESS.2020.3017805 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

Toward software-defined networking-based IoT frameworks : a systematic literature review, taxonomy, open challenges and prospectsSiddiqui, Shahbaz; Hameed, Sufian; Shah, Syed Attique; Aneiba, Adel; Draheim, Dirk; Dustdar, SchahramIEEE Access2022 / p. 70850-70901 https://doi.org/10.1109/ACCESS.2022.3188311 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS