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Kiletükk tõotab läbimurret kadunuks jäänute otsinguil : [ettevõtja Neinar Seli ja teadlase Mati Karelsoni koostöös loodud kilemarkerist]Niitra, Nils; Karelson, Mati; Seli, NeinarTartu Postimees2007 / 12. märts, lk. 1 https://majandus.postimees.ee/1639075/kiletukk-tootab-labimurret-kadunuks-jaanute-otsinguil

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Nonlinear waves in a layer with energy influxEngelbrecht, Jüri; Peipman, TõnuWave motion1992 / 16, p. 173-181

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Polypyrrole-polyparaphenylene blend films electrochemically deposited onto light transparent substratesGolovtsov, Igor; Öpik, AndresInternational Conference on Science and Technology of Synthetic Metals : book of abstracts2002 / p. 32

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Исследование весового метода для аттестации мер толщины пленокLaaneots, Rein; Saar, BernhardСборник статей по машиностроению. 81971 / с. 71-77 : илл https://www.ester.ee/record=b2190317*est https://digikogu.taltech.ee/et/Item/9e5336a6-6d17-4555-8a2c-a8b547231bbb/

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Критерии оценки толщины пленкиBoguslavski, M.; Laaneots, ReinИзмерительная техника : ежемесячный научно-технический журнал1972 / с. 35-36 : рис https://www.ester.ee/record=b1448551*est

Крупные волны при двухфазном противоточном пленочном теченииTreimann, Aksel; Siirde, EnnoПроцессы и аппараты химической технологии и технология неорганических веществ. 51974 / с. 3-11 : илл https://www.ester.ee/record=b1531723*est https://digikogu.taltech.ee/et/Item/438b60cb-3265-444e-adba-b3c2c222f12a

Метод определения толщины конденсированной пленки влагиVeimer, Vladimir; Semikova, I.XXV студенческая научно-техническая конференция вузов Прибалтийских республик, Белорусской ССР и Молдавской ССР, 21-23 апреля 1981 года : тезисы докладов. Том 1, Общественные науки. Физико-математические науки. Строительство. Экономика1981 / с.70 https://www.ester.ee/record=b1322624*est

Минимальная плотность орошения при однофазном пленочном течении жидкости (в отсутствии тепло- и массообмена)Reile, Rein; Kallas, Juha; Siirde, EnnoПроцессы и аппараты химической технологии и технология неорганических веществ. 41973 / с. 33-37 : илл https://www.ester.ee/record=b1386707*est https://digikogu.taltech.ee/et/Item/72e7c5b1-8453-41a6-9821-41853b98368d

Обеспечение единства измерений толщин пленок и покрытийBoguslavski, M.; Laaneots, ReinОпыт внедрения методов и средств технического контроля качества на предприятиях Ленинграда : материалы к краткосрочному семинару 16-18 мая1972 / с. 86-87

Образцовые меры толщины пленокLaaneots, ReinИнформационный листок (Ленинградский центр научно-технической информации)1971 / с. 1-4

Определение оптимальных размеров и характеристик мер толщины пленокLaaneots, ReinИзмерительная техника : ежемесячный научно-технический журнал1973 / с. 30-31 : рис., таб https://www.ester.ee/record=b1448551*est

Оптические и фотоэлектрические свойства пленок сульфида кадмия, химически осажденных пульверизациейKerm, Karin; Tilling, Aino; Antsov, U.Физическая химия соединений AIIBVI1981 / с. 59-65

Оценка качества толщиномеров пленокLaaneots, ReinТезисы докладов научно-технической конференции по квалиметрии 1972 г1972 / с. 48-50 https://www.ester.ee/record=b4088204*est

Пневматический метод измерения толщины пленкиLaaneots, ReinИзмерительная техника : ежемесячный научно-технический журнал1974 / с. 47-48 https://www.ester.ee/record=b1448551*est

Поверка толщиномеров пленокLaaneots, ReinСборник статей по машиностроению. 81971 / с. 79-86 https://www.ester.ee/record=b2190317*est https://digikogu.taltech.ee/et/Item/9e5336a6-6d17-4555-8a2c-a8b547231bbb/

Прибор для измерения толщины пленкиLaaneots, ReinСборник статей по машиностроению. 91972 / с. 43-52 : илл https://www.ester.ee/record=b2190570*est https://digikogu.taltech.ee/et/Item/3aab34ef-a920-43ae-9a14-2c99ba3caad2

Улучшение однородности исходных порошковых материалов CdS, используемых при вакуумном напылении пленокMellikov, Enn; Hiie, Jaan; Karpenko, I.V.; Putškova, K.N.; Rändur, Õie; Krunks, Malle; Veel, Ene; Türn, LeoПолупроводниковые материалы. 31976 / с. 43-51 https://www.ester.ee/record=b1403374*est https://digikogu.taltech.ee/et/Item/5f8fd05c-ff69-4315-9d64-1d9c9611667b

Устройство для поверки толщиномеров жидкостных плёнок. ПроспектLaaneots, Rein1988

Фазовый состав пленок CdS и CdSe, полученных химическим распылениемKerm, KarinПолупроводниковые материалы. 21972 / с. 39-43 https://www.ester.ee/record=b1476073*est https://digikogu.taltech.ee/et/Item/75bd57ba-4543-4614-ab7c-3230cb13e005

Фотолюминесценция как метод оценки качества химически пульверизованных пленокErm, Ants; Krunks, Malle; Mellikov, EnnПрименение металлоорганических соединений для получения неорганических покрытий и материалов : тезисы докладов V всесоюзного совещания, Горький, 8-10 сентября 1987 г.1987 / с. 191-192 https://www.ester.ee/record=b2351386*est

Экспериментальное исследование термического сопротивления окисной пленки методом регулярного теплового режимаVinogradova, V.; Anson, PavelXVI студенческая научно-техническая конференция вузов Прибалтики, Белорусской ССР и Калининградской области, посвященная 100-летию со дня рождения В. И. Ленина : 20-25 апреля 1970 г. : (тезисы докладов). Электротехника и энергетика1970 / с. 106-107 https://www.ester.ee/record=b1379483*est