Automatic test generation system for VLSIJervan, Gert; Markus, Antti; Raik, Jaan; Ubar, Raimund-JohannesProceedings of the First Electronic Circuits and Systems Conference : Bratislava, Slovakia, September 4-5, 19971997 / p. 255-258

Fast modelling of oscillator transientsKukk, VelloProceedings of the First Electronic Circuits and Systems Conference : Bratislava, Slovakia, September 4-5, 19971997 / p. 27-30: ill

High-Q active bandbass filtersÖöpik, Priit; Koort, Marko; Kipper, Rein; Kukk, VelloProceedings of the First Electronic Circuits and Systems Conference : Bratislava, Slovakia, September 4-5, 19971997 / p. 133-136: ill

Interactive synthesiser developmentKoort, Marko; Kukk, VelloProceedings of the First Electronic Circuits and Systems Conference : Bratislava, Slovakia, September 4-5, 19971997 / p. 67-70 : ill

Representing transparency conditions in test generation for VLSI by decision diagramsUbar, Raimund-JohannesProceedings of the First Electronic Circuits and Systems Conference : Bratislava, Slovakia, September 4-5, 19971997 / p. 213-216