Combinational fault simulation in sequential circuitsUbar, Raimund-Johannes; Kõusaar, Jaak; Gorev, Maksim; Devadze, Sergei2015 IEEE International Symposium on Circuits and Systems : 24-27 May 2015, Lisboa, Portugal : [proceedings]2015 / p. 2876-2879 : ill

Exact parallel critical path fault tracing to speed-up fault simulation in sequential circuitsKõusaar, Jaak; Ubar, Raimund-Johannes; Kostin, Sergei; Devadze, Sergei; Raik, JaanInternational journal of microelectronics and computer science2018 / p. 9−18 https://ijmcs.dmcs.pl/web/guest/vol.-9-no.-1 https://ijmcs.dmcs.pl/documents/10630/345460/IJMCS_1_2018_2.pdf

Modeling sequential circuits with shared structurally synthesized BDDsUbar, Raimund-Johannes; Marenkov, Mihhail; Mironov, Dmitri; Viies, VladimirProceedings of 2014 9th International Design & Test Symposium (IDT) : Sheraton Club des Pins Hotel, Algiers, Algeria, December 16-18, 20142014 / p. 130-135 : ill

Parallel critical path tracing fault simulation in sequential circuitsKõusaar, Jaak; Ubar, Raimund-Johannes; Kostin, Sergei; Devadze, Sergei; Raik, JaanProceedings of 25th International Conference MIXED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS : MIXDES 2018 : Gdynia, Poland, June 21–23, 20182018 / p. 305-310 : ill https://doi.org/10.23919/MIXDES.2018.8436880