CdS monograin layers as detector of visible and X-raysHiie, Jaan; Iljina, Natalja; Kukk, Peeter-Enn; Mellikov, Enn; Varema, Tiit9th International Symposium of the Technical Commitee on Photon-Detectors ; Visegrad, 9 - 12 september 19801980 / p. 8-9

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Investigation of the mineral composition of Estonian oil-shale ash using X-ray diffractometryPaat, Aadu; Traksmaa, RainerOil shale2002 / 4, p. 373-386 : ill

Isolated Potato Virus A coat protein possesses unusual properties and forms different short virus-like particlesKsenofontov, Alexander L.; Dobrov, Eugeny N.; Fedorova, Natalia V.; Paalme, Viiu; Järvekülg, LilianJournal of biomolecular structure and dynamics2017 / p. 1-11 : ill https://doi.org/10.1080/07391102.2017.1333457 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

Röntgen pluss raalAgur, UstusHorisont1977 / lk. 14-15 : ill https://www.ester.ee/record=b1072243*est http://www.digar.ee/id/nlib-digar:291344

Röntgenograafia : loengukonspektRusalep, Ervin1996 https://www.ester.ee/record=b1058403*est

Scintillators for high efficiency and high spatial resolution in - ray imaging applicationsDiawara, Y.; Durst, R.D.; Mednikova, G.; Thorson, T.; Hiie, Jaan; Valdna, VelloHard x-ray and gamma-ray detector physics. V2004 / p. 119-125 https://www.researchgate.net/publication/252160844_Scintillators_for_high_efficiency_and_high_spatial_resolution_in_x-ray_imaging_applications

Structural, optical, and scintillation characteristics of ZnO ceramicsGorokhova, Elena; Rodnyi, P.; Lokshin, E.; Lott, KaljuJournal of optical technology2011 / p. 753-760 https://www.researchgate.net/publication/249329462_Structural_optical_and_scintillation_characteristics_of_ZnO_ceramics

Tallinna Polütehnilise Instituudi toimetised = Труды Таллинского политехнического института. Серия А ; 172/1731960 https://www.ester.ee/record=b1415738*est https://digikogu.taltech.ee/et/Item/f90a96ea-b9d8-43e1-a06f-574f0be42ea0

X-ray diffraction studies of nanocrystalline niobiumKommel, Lembit; Traksmaa, Rainer; Kommel, Igor; Saarna, MartMaterials engineering & Baltrib 2010 : materials of the XIX-th International Baltic Conference : October 28-29, 2010, Riga, Latvia2010 / p. 20

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Некоторые сведения по рентгенографическому изучению эффекта БаушингераSchults, KaljoTallinna Polütehnilise Instituudi toimetised = Труды Таллинского политехнического института. Серия А ; 172/1731960 / 38 с. : илл https://www.ester.ee/record=b1415738*est https://digikogu.taltech.ee/et/Item/f90a96ea-b9d8-43e1-a06f-574f0be42ea0

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Простая техника метода аномального прохождения рентгеновских лучейRusalep, ErvinТруды по физике : сборник статей. 71975 / с. 29-33 : илл https://www.ester.ee/record=b2190700*est https://digikogu.taltech.ee/et/Item/bf8b5df4-d382-41b8-b242-1b2db192e257

Устройство для автоматического фотометрирования рентгеновских линийPilvre, UnoСборник трудов по физике. 21959 / с. 3-11 : илл https://www.ester.ee/record=b2181326*est https://digikogu.taltech.ee/et/Item/9340af8f-ba22-4238-b44c-9c7f4d4b79fb