Automated area and coverage optimization of minimal latency checkersAzad, Siavoosh Payandeh; Niazmand, Behrad; Apneet Kaur; Raik, Jaan; Jervan, Gert; Hollstein, Thomas2017 22nd IEEE European Test Symposium (ETS 2017), Limassol, Cyprus, 22 – 26 May 2017 : proceedings2017 / p. 7-8 : ill https://doi.org/10.1109/ETS.2017.7968211