QoSinNoC: analysis of QoS-aware NoC architectures for mixed-criticality applicationsAvramenko, Serhiy; Azad, Siavoosh Payandeh; Niazmand, Behrad; Raik, Jaan; Jenihhin, Maksim21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems : DDECS 2018 : Budapest, Hungary 25-27 April, 2018 : proceedings2018 / p. 67-72 : ill https://doi.org/10.1109/DDECS.2018.00-10

Replication-based deterministic testing of 2-dimensional arrays with highly interrelated cellsAzad, Siavoosh Payandeh; Oyeniran, Adeboye Stephen; Ubar, Raimund-Johannes21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems : DDECS 2018 : Budapest, Hungary 25-27 April, 2018 : proceedings2018 / p. 21-26 : ill https://doi.org/10.1109/DDECS.2018.00011

Software-level TMR approach for on-board data processing in space applicationsJanson, Karl; Treudler, Carl Johann; Hollstein, Thomas; Raik, Jaan; Jenihhin, Maksim; Fey, Goerschwin21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems : DDECS 2018 : Budapest, Hungary 25-27 April, 2018 : proceedings2018 / p. 147-152 : ill https://doi.org/10.1109/DDECS.2018.00033