A framework of awareness for artificial subjectsJantsch, Axel; Tammemäe, KalleCODES '14 : proceedings of the 2014 International Conference on Hardware/Software Codesign and System Synthesis2014 / [3] p

A new measure for calculating multiple fault coverage of microprocessor self-testOyeniran, Adeboye Stephen; Odozi, Uzochukwu Eddie; Ubar, Raimund-JohannesBEC 2016 : 2016 15th Biennial Baltic Electronics Conference : proceedings of the 15th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 3-5, 2016, Tallinn, Estonia2016 / p. 75-78 : ill http://www.ester.ee/record=b2150914*est

A proposal for optimisation of low-powered FSM testingBrik, Marina; Fomina, Jelena; Ubar, Raimund-JohannesProceedings of IEEE East-West Design & Test Workshop (EWDTW'05) : Odessa, Ukraine, September 15-19, 20052005 / p. 15-20

A study on effective knowledge reuse in multi-platform web applications user interfacesMarenkov, Jevgeni; Robal, Tarmo; Kalja, AhtoPICMET '15 Conference : Management of the Technology Age : August 2-6, 2015, Portland, Oregon, USA : conference bulletin2015 / p. 68

A study on user click behaviour for WIS user interface improvementsMarenkov, Jevgeni; Robal, Tarmo; Kalja, AhtoDatabases and information systems VIII : selected papers from the Eleventh International Baltic Conference, DB&IS 20142014 / p. 173-186 : ill

A synthesis-agnostic behavioral fault model for high gate-level fault coverageKarputkin, Anton; Raik, JaanProceedings of the 2016 Design, Automation & Test in Europe Conference & Exhibition (DATE) : 14-18 March 2016, ICC, Dresden, Germany2016 / p. 1124-1127 : ill https://ieeexplore.ieee.org/document/7459477/figures#figures

A system for teaching basic and advanced topics of IEEE 1149.1 boundary scan standard (extended abstract)Jutman, Artur; Rosin, Vjatšeslav; Sudnitsõn, Aleksander; Ubar, Raimund-Johannes; Wuttke, Heinz-DietrichProceedings of 16th EAEEIE Conference on Innovation in Education for Electrical and Information Engineering (EIE) : Lappeenranta, Finland, 6th-8th June 20052005 / [2] p. : ill

A tool for random test generation targeting high diagnostic resolutionOsimiry, Emmanuel Ovie; Kostin, Sergei; Raik, Jaan; Ubar, Raimund-JohannesBEC 2016 : 2016 15th Biennial Baltic Electronics Conference : proceedings of the 15th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 3-5, 2016, Tallinn, Estonia2016 / p. 79-82 : ill http://www.ester.ee/record=b2150914*est

A tool set for teaching design-for-testability of digital circuitsKostin, Sergei; Orasson, Elmet; Ubar, Raimund-JohannesEWME 2016 : 11th European Workshop on Microelectronics Education : May 11-13, 2016, Southampton, UK2016 / [6] p. : ill http://dx.doi.org/10.1109/EWME.2016.7496466

Aastad, mis möödusid linnulennulUbar, Raimund-JohannesRaimund-Johannes Ubar. Bibliograafia2016 / lk. 13-44 : ill., fot

Abstraction of clock interface for conversion of RTL VHDL to SystemCSaif Abrar, Syed; Jenihhin, Maksim; Raik, Jaan2014 IEEE International Advance Computing Conference (IACC) : February 21-22, 2014, Gurgaon, India2014 / p. 50-55 : ill

Accurate dialysis dose evaluation and extrapolation algorithms during online optical dialysis monitoringFridolin, Ivo; Karai, Deniss; Kostin, Sergei; Ubar, Raimund-JohannesIEEE transactions on biomedical engineering2013 / p. 1371-1377 : ill

Accurate NBTI-induced gate delay modeling based on intensive SPICE simulationsKostin, Sergei; Raik, Jaan; Ubar, Raimund-Johannes; Jenihhin, MaksimMEDIAN Finale : Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale : November 10-11, 2015, Tallinn, Estonia2015 / p. 21-26 : ill

Activity classification for real-time wearable systems : effect of window length, sampling frequency and number of features on classifier performanceAllik, Ardo; Pilt, Kristjan; Karai, Deniss; Fridolin, Ivo; Leier, Mairo; Jervan, Gert2016 IEEE EMBS Conference on Biomedical Engineering and Sciences (IECBES) : Kuala Lumpur, 4-8 December 20162016 / p. 460-464 : ill https://doi.org/10.1109/IECBES.2016.7843493

Address-based data processing over N-ary treesSklyarov, Valery; Skliarova, Iouliia; Kruus, Margus; Mihhailov, Dmitri; Sudnitsõn, AleksanderEuroCon 2013 : 01-04 July 2013, Zagreb, Croatia2013 / p. 1790-1797 : ill

Advanced technical education in the age of cyber physical systemsVierhaus, Heinrich Theodor; Schölzel, Mario; Raik, Jaan; Ubar, Raimund-Johannes10th European Workshop on Microelectronics Education : EWME 2014 : May 14-16, 2014, Tallinn, Estonia2014 / p. 193-198 : ill

Advances in Databases and Information Systems : proceedings of the 9th East-European Conference, ADBIS 2005 : Tallinn, September 12-15, 20052005 https://www.ester.ee/record=b2068111*est

Akadeemilisest vabadusest ja riisiterastUbar, Raimund-JohannesTallinna Tehnikaülikooli aastaraamat 20132014 / lk. 11-21

An ad-hoc implementation of a remote laboratoryAzad, Siavoosh Payandeh; Kinks, Hannes; Tajammul, Muhammad Adeel; Ellervee, Peeter2015 International Conference on Microelectronic Systems Education : MSE '15 : Pittsburgh, PA, May 20-21, 20152015 / p. 48-51 : ill http://dx.doi.org/10.1109/MSE.2015.7160015

An external test approach for network-on-a-chip switchesRaik, Jaan; Govind, Vineeth; Ubar, Raimund-JohannesATS '06 : Proceedings of the 15th Asian Test Symposium : November 20-23, 2006, Fukuoka, Japan2006 / p. 437-442 : ill http://dx.doi.org/10.1109/ATS.2006.23

Analysis and comparison of attainable hardware acceleration in all programmable systems-on-chipSklyarov, Valery; Skliarova, Iouliia; Silva, João; Sudnitsõn, AleksanderEuromicro Conference on Digital System Design : DSD 2015 : 26-28 August 2015, Funchal, Madeira, Portugal : proceedings2015 / p. 345-352 : ill http://dx.doi.org/10.1109/DSD.2015.45

Applets for learning digital design and test [Electronic resource]Ubar, Raimund-Johannes; Jutman, Artur; Kruus, Margus; Wuttke, Heinz-Dietrich1st International Conference on Interactive Mobile and Computer Aided Learning (IMCL2006) : Amman, Jordan, April 19-21, 20062006 / p. 1-4 : ill. [CD-ROM]

Application of extensible processing platforms for experiments with FPGA-based circuitsSklyarov, Valery; Skliarova, Iouliia; Silva, João; Rjabov, Artjom; Sudnitsõn, AleksanderMELECON 2014 : 2014 17th IEEE Mediterranean Electrotechnical Conference :  13-16 April 2014, Beirut, Lebanon2014 / p. 467-471 : ill

Application of sequential test set compaction to LFSR reseedingAleksejev, Igor; Jutman, Artur; Raik, Jaan; Ubar, Raimund-Johannes26th Norchip Conference : Tallinn, Estonia, 17-18 November 2008 : formal proceedings2008 / p. 102-107 : ill http://dx.doi.org/10.1109/NORCHP.2008.4738292

Applying user domain model to improve Web recommendationsRobal, Tarmo; Kalja, AhtoDatabases and information systems VII : selected papers from the tenth International Baltic Conference, DB&IS 20122013 / p. 118-131

APRICOT : a framework for teaching digital systems verificationRaik, Jaan; Jenihhin, Maksim; Tšepurov, Anton; Reinsalu, Uljana; Ubar, Raimund-Johannes19th EAEEIE Annual Conference : June 29-July 2, 2008, Tallinn, Estonia : formal proceedings2008 / p. 172-177 : ill http://dx.doi.org/10.1109/EAEEIE.2008.4610181

ArvutipõlvkonnadToomsalu, Arvo2004 http://www.ester.ee/record=b1881924*est

Arvutitehnika riistvara : õpik kõrgkoolideleEvartson, Teet2013 https://www.ester.ee/record=b2967116*est

Assessment of diagnostic test for automated bug localizationTihhomirov, Valentin; Tšepurov, Anton; Jenihhin, Maksim; Raik, Jaan; Ubar, Raimund-JohannesLATW2013 : 14th IEEE Latin-American Test Workshop, Cordoba, Argentina, April 3-5, 2013 : [proceedings]2013 / [6] p. : ill

Assessment of student's design results in e-learning-scenarios [Electronic resource]Wuttke, Heinz-Dietrich; Ubar, Raimund-Johannes; Henke, Karsten; Jutman, Artur8th International Conference on Technology Based Higher Education and Training : 10th to 13th July, 2007, KKR Hotel Kumamoto, Kumamoto, Japan : [proceedings]2007 / [6] p. [CD-ROM]

Asutajadekaanid : eesmärk on anda inimestele võimalus oma tööd paremini tehaOorn, Arvo; Jervan, Gert; Kanger, Tõnis; Listra, EnnMente et Manu2016 / lk. 18-23 : fot http://www.ttu.ee/public/u/ulikool/Tutvustus/ajaleht-mente-et-manu/MM_2016_05/index.html

Asynchronous fault detection in IEEE P1687 instrument networkShibin, Konstantin; Devadze, Sergei; Jutman, ArturIEEE 23rd North Atlantic Test Workshop : 14-16 May 2014, Binghampton, New York : proceedings2014 / p. 73-78 : ill

At-speed functional built-in self-test methodology for processors [Electronic resource]Ubar, Raimund-Johannes; Indus, Viljar; Kalmend, OliverProceedings of the IASTED International Conference on Engineering and Applied Science : December 27-29, 2012, Columbo, Sri Lanka2012 / p. 168-172 : ill [CD-ROM]

At-speed self-testing of high-performance pipe-lined processing architectures [Electronic resource]Gorev, Maksim; Ubar, Raimund-Johannes; Ellervee, Peeter; Devadze, Sergei; Raik, Jaan; Min, Mart31st Norchip Conference : Vilnius, Lithuania, 11-12 November 2013 : conference program and papers2013 / p. 1-6 : ill [USB]

At-speed testing and test quality evaluation for high-performance pipelined systems Töökiirusel testimine ja testi kvaliteedi hindamine kõrgjõudlus-konveierarhitektuuriga süsteemideleGorev, Maksim2015 https://digi.lib.ttu.ee/i/?3953

At-speed testing of inter-die connections of 3D-SICs in the presence of shore logicShibin, Konstantin; Chickermane, Vivek; Keller, Brion; Papameletis, Christos; Marinissen, Erik Jan2015 Asian Test Symposium : ATS 2015 : 22-25 November 2015, Mumbai, Maharashtra, India : proceedings2015 / p. 79-84 : ill http://dx.doi.org/10.1109/ATS.2015.21

Aukartus teaduse eesUbar, Raimund-JohannesRaimund-Johannes Ubar. Bibliograafia2016 / lk. 47-56

Aukartus teaduse ees : [essee]. Nikolai Alumäe medalUbar, Raimund-JohannesSirp2014 / lk. 3-5 : fot https://www.sirp.ee/s1-artiklid/c21-teadus/aukartus-teaduse-ees/

Automated design error debug using high-level decision diagrams and mutation operatorsRaik, Jaan; Repinski, Urmas; Tšepurov, Anton; Hantson, Hanno; Ubar, Raimund-Johannes; Jenihhin, MaksimMicroprocessors and microsystems2013 / p. 505-513 : ill

Automated design error localization in RTL designsJenihhin, Maksim; Tšepurov, Anton; Tihhomirov, Valentin; Raik, Jaan; Hantson, Hanno; Ubar, Raimund-Johannes; Bartsch, Günter; Meza Escobar, Jorge Hernan; Wuttke, Heinz-DietrichIEEE design & test of computers2014 / p. 83-92 : ill http://dx.doi.org/10.1109/MDAT.2013.2271420

Automated minimization of concurrent online checkers for network-on-chipsSaltarelli, Pietro; Niazmand, Behrad; Hariharan, Ranganathan; Raik, Jaan; Jervan, Gert; Hollstein, Thomas10th International Symposium on Reconfigurable and Communication-centric Systems-on-Chip (ReCoSoC 2015) : Bremen, 29 June - 1 July 20152015 / [8] p. : ill http://dx.doi.org/10.1109/ReCoSoC.2015.7238079

Automatic distribution of local testers for testing distributed systemsVain, Jüri; Halling, Evelin; Kanter, Gert; Anier, Aivo; Pal, DeepakDatabases and information systems IX : selected papers from the twelfth International Baltic Conference, DB&IS 20162016 / p. 297-310 : ill http://dx.doi.org/10.3233/978-1-61499-714-6-297

BASTION - board and SoC test instrumentation for Ageing and No Failure FoundDevadze, SergeiMEDIAN Finale : Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale : November 10-11, 2015, Tallinn, Estonia2015 / p. 77

BIST analyzer : a training platform for SoC testing [Electronic resource]Jutman, Artur; Tšertov, Anton; Tšepurov, Anton; Aleksejev, Igor; Ubar, Raimund-Johannes; Wuttke, Heinz-Dietrich37th Annual Frontiers in Education Conference : Global Engineering : Knowledge Without Borders, Opportunities Without Passports : Milwaukee, Wisconsin, October 10-13, 20072007 / p. S3H-8-S3H-13 : ill. [CD-ROM] http://dx.doi.org/10.1109/FIE.2007.4418125

Boolean fault dignosis with structurally synthesized BDDsUbar, Raimund-JohannesRecent progress in the Boolean domain2014 / p. 303-331 : ill

Bringing research issues into lab scenarios on the example of SoC testing [Electronic resource]Ubar, Raimund-Johannes; Jutman, Artur; Devadze, Sergei; Wuttke, Heinz-DietrichInternational Conference on Engineering Education - ICEE 2007 : September 3-7, 2007, Coimbra, Portugal2007 / [7] p. : ill. [CD-ROM] http://icee2007.dei.uc.pt/proceedings/papers/429.pdf

Clock manipulation for heterogeneous emulation environmentEllervee, Peeter; Arhipov, Anton; Tammemäe, KalleProceedings [of] 24th IEEE Norchip Conference : Linköping, Sweden, 20-21 November 20062006 / p. 213-216 : ill https://ieeexplore.ieee.org/abstract/document/4126984

CMS drift tubes sector collector relocation phase 1 upgrade [Electronic resource]Bedoya, C. F.; Jutman, Artur; Shibin, Konstantin; Devadze, Sergei2015 http://cms.cern.ch/iCMS/jsp/openfile.jsp?type=DN&year=2015&files=DN2015_011.pdf

Code compaction within CGRAsTajammul, Muhammad Adeel; Jafri, Syed Mohammad Asad Hassan; Ellervee, PeeterProceedings of the 8th Annual Conference of the Estonian National Doctoral School in Information and Communication Technologies : December 5-6, 2014, Rakvere2014 / p. 133-136 : ill

Code coverage analysis for concurrent programming languages using high-level decision diagramsJenihhin, Maksim; Raik, Jaan; Tšepurov, Anton; Reinsalu, Uljana; Ubar, Raimund-JohannesProceedings of the 12th European Workshop on Dependable Computing : EWDC 2009 : Toulouse, France, May 14-15, 20092009 / [4] p. : ill https://hal.archives-ouvertes.fr/hal-00381559

Combinational fault simulation in sequential circuitsUbar, Raimund-Johannes; Kõusaar, Jaak; Gorev, Maksim; Devadze, Sergei2015 IEEE International Symposium on Circuits and Systems : 24-27 May 2015, Lisboa, Portugal : [proceedings]2015 / p. 2876-2879 : ill

Combinatorial algorithms of discrete mathematicsZakrevskij, Arkadij; Pottosin, Yu.; Cheremisinova, L.2008 http://www.ester.ee/record=b2350865*est

Comparison of plan-driven and agile project management approaches : theoretical bases for a case study in Estonian software industryLepmets, Marion; Nael, MargusDatabases and Information Systems VI : selected papers from the Ninth International Baltic Conference, DB&IS 20102011 / p. 296-308 : ill

Comparison of two approaches to improve functional BIST fault coverageKostin, Sergei; Ubar, Raimund-Johannes; Gorev, Maksim; Mägi, GunnarBEC 2014 : 2014 14th Biennial Baltic Electronics Conference : proceedings of the 14th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 6-8, 2014, Tallinn, Estonia2014 / p. 105-108 : ill

Complementing ICT studies with learning objects on domain ontologiesRobal, Tarmo; Kruus, Helena; Kalja, AhtoProceedings of the 24th International Conference on European Association for Education in Electrical and Information Engineering : 30-31 May 2013, Chania, Greece2013 / p. 92-96 : ill

Complex delay fault reasoning with sequential 7-valued algebraKõusaar, Jaak; Ubar, Raimund-Johannes; Aleksejev, Igor2015 16th Latin American Test Symposium (LATS 2015) : Puerto Vallarta, Mexico, 25-27 March 20152015 / [6] p. : ill http://dx.doi.org/10.1109/LATW.2015.7102403

Comprehensive abstraction of VHDL RTL cores to ESL SystemC = Register-siirde taseme VHDL kirjelduste kompleksne abstraheerimine süsteemitaseme SystemC mudeliteksAbrar, Syed Saif2016 http://www.ester.ee/record=b4564850*est

Computing sorted subsets for data processing in communicating software/hardware control systemsSklyarov, Valery; Skliarova, Iouliia; Rjabov, Artjom; Sudnitsõn, AleksanderInternational journal of computers communications & control2016 / p. 126-141 : ill http://dx.doi.org/10.15837/ijccc.2016.1.1442

Constraints solving based hierarchical test generation for synchronous sequential circuits = Kitsenduste lahendamisel baseeruv hierarhiline testigenereerimine sünkroonsetele järjestikskeemideleViilukas, Taavi2012 https://www.ester.ee/record=b2888278*est

Construction of the tests of combinational circuit failures by analyzing the orthogonal disjunctive normal forms represented by the alternative graphsMatrosova, A.Yu.; Pleshkov, A.G.; Ubar, Raimund-JohannesAutomation and remote control2005 / p. 313-327 : ill http://dx.doi.org/10.1007/s10513-005-0054-9

Control intensive digital system synthesisTammemäe, Kalle1997 http://www.ester.ee/record=b1060033*est

Critical path tracing based simulation of transition delay faultsKõusaar, Jaak; Ubar, Raimund-Johannes; Devadze, Sergei; Raik, JaanProceedings of the 8th Annual Conference of the Estonian National Doctoral School in Information and Communication Technologies : December 5-6, 2014, Rakvere2014 / p. 61-66 : ill

Critical path tracing based simulation of transition delay faultsKõusaar, Jaak; Ubar, Raimund-Johannes; Devadze, Sergei; Raik, Jaan2014 17th Euromicro Conference on Digital System Design : DSD 2014 : 27-29 August 2014, Verona, Italy : proceedings2014 / p. 108-113 : ill

Customizable compression architecture for efficient configuration in CGRAsJafri, Syed Mohammad Asad Hassan; Ellervee, Peeter2014 IEEE 22nd International Symposium on Field-Programmable Custom Computing Machines : FCCM 2014 : 11-13 May 2014, Boston, Massachusetts, USA : proceedings2014 / p. 31 : ill

Customization methodology of a Coarse Grained Reconfigurable ArchitectureAzad, Siavoosh Payandeh; Farahini, Nasim; Hemani, AhmedNorchip : 32nd NORCHIP Conference, 27-28 October 2014, Tampere, Finland2014 / [4] p. : ill

Data type dependent energy consumption estimationRuberg, Priit; Lass, Keijo; Ellervee, Peeter2nd IEEE NORCAS Conference : 1-2 November 2016, Copenhagen, Denmark2016 / [5] p. : ill https://doi.org/10.1109/NORCHIP.2016.7792916

Databases and Information Systems : proceedings of the 11th International Baltic Conference, Baltic DB&IS 2014 : Tallinn, Estonia, 8-11 June, 20142014 http://www.ester.ee/record=b3088507*est

Databases and information systems : proceedings of the Eighth International Baltic Conference, Baltic DBAMPIS 2008 : Tallinn, June 2-5, 20082008 http://www.ester.ee/record=b2374996*est

Databases and information systems : proceedings of the Fifth International Baltic Conference : Baltic DB & IS 2002 : Tallinn, June 3-6, 20022002 http://www.ester.ee/record=b1641978*est

Databases and information systems VIII : selected papers from the Eleventh International Baltic Conference, DB&IS 20142014 https://www.ester.ee/record=b4447206*est

Deadlock-free generic routing algorithms for 3-dimensional Networks-on-Chip with reduced vertical link density topologiesYing, Haoyuan; Jaiswal, Ashok; Hollstein, Thomas; Hofmann, KlausJournal of systems architecture2013 / p. 528-542 : ill

Decision diagrams - from a mathematical notion to engineering applicationsStankovic, Radomir S.; Ubar, Raimund-Johannes; Astola, JaakkoFacta Universitatis [Niš]. Series electronics and energetics2011 / p. 281-301 : ill http://dx.doi.org/10.2298/FUEE1103281S

Decision diagrams for diagnostic modelingUbar, Raimund-JohannesMEDIAN Finale : Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale : November 10-11, 2015, Tallinn, Estonia2015 / p. 43

DefSim - the defective ICPleskacz, Witold A.; Jutman, Artur; Ubar, Raimund-Johannes; Devadze, SergeiDATE 2007 : Design Automation and Test in Europe : Nice, France, April 16-20, 20072007 / p. s96 (2 p.)

Department of Computer EngineeringKeevallik, Andres; Ubar, Raimund-JohannesResearch activities / Tallinn Technical University1993 / p. 75-78 https://www.ester.ee/record=b1053754*est

Dependable embedded systems : FP7 KhAI-ERA project experienceKharchenko, Vyacheslav; Kulanov, Vitaliy; Jervan, Gert10th European Workshop on Microelectronics Education : EWME 2014 : May 14-16, 2014, Tallinn, Estonia2014 / p. 26-30 : ill

Design of FPGA-based circuits using hierarchical finite state machinesSkliarova, Iouliia; Sklyarov, Valery; Sudnitsõn, Aleksander2012 http://www.ester.ee/record=b2857138*est

Design space exploration in multi-level computing systemsSklyarov, Valery; Skliarova, Iouliia; Silva, João; Sudnitsõn, AleksanderCompSysTech'14 : 15th International Conference on Computer Systems and Technologies : Ruse, Bulgaria, June 27-28, 20142014 / p. 40-47 : ill

Designing reliable cyber-physical systems : overview associated to the special session at FDL'16Aleksandrowicz, Gadi; Arbel, Eli; Bloem, Roderick; Devadze, Sergei; Jenihhin, Maksim; Jutman, Artur; Raik, Jaan; Shibin, KonstantinThe 2016 Forum on Specification & Design Languages : proceedings : Bremen, Germany, September 14-16, 20162016 / [8] p. : ill https://doi.org/10.1109/FDL.2016.7880382

Developing a data acquisition system for measuring microcontroller energy consumption using LabVIEWRuberg, Priit; Lass, Keijo; Ellervee, PeeterBEC 2016 : 2016 15th Biennial Baltic Electronics Conference : proceedings of the 15th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 3-5, 2016, Tallinn, Estonia2016 / p. 123-126 : ill http://www.ester.ee/record=b2150914*est

DfT-based external test and diagnosis of mesh-like networks on chips = Testitavusel põhinev välise testi ja diagnoosi meetod kahemõõtmelistele kiipvõrkudeleGovind, Vineeth2009 https://digi.lib.ttu.ee/i/?454 https://www.ester.ee/record=b2539211*est

Diagnostic modeling of digital systems with low- and high-level decision diagramsUbar, Raimund-JohannesLATW2013 : 14th IEEE Latin-American Test Workshop, Cordoba, Argentina, April 3-5, 2013 : [proceedings]2013 / [1] p

Diagnostic test generation for statistical bug localization using evolutionary computationGaudesi, Marco; Jenihhin, Maksim; Raik, Jaan; Tihhomirov, Valentin; Ubar, Raimund-JohannesApplications of Evolutionary Computation : 17th European Conference, EvoApplications 2014, Granada, Spain, April 23-25, 2014 : revised selected papers2014 / p. 425-436 : ill

DIAGNOZER : a laboratory tool for teaching research in diagnosis of electronic systems [Electronic resource]Ubar, Raimund-Johannes; Kostin, Sergei; Jutman, Artur; Raik, Jaan; Wuttke, Heinz-Dietrich2009 IEEE International Conference on Microelectronic Systems Education MSE '09 : 25-27 July 2009, San Francisco, California : [proceedings]2009 / p. 12-15 : ill. [CD-ROM] http://dx.doi.org/10.1109/MSE.2009.5270842

Digitaalsüsteemide diagnostikaUbar, Raimund-Johannes2005 http://www.ester.ee/record=b2097071*est

Digital system modeling and synthesis as an introduction to computer systems engineeringTajammul, Muhammad Adeel; Azad, Siavoosh Payandeh; Ellervee, Peeter2015 International Conference on Microelectronic Systems Education : MSE '15 : Pittsburgh, PA, May 20-21, 20152015 / p. 52-55 : ill http://dx.doi.org/10.1109/MSE.2015.7160016

Digital test in WEB-based environmentIvask, Eero2006 https://www.ester.ee/record=b2158119*est

Discovering logical constructs from Estonian children language = Loogiliste konstruktsioonide avastamine eesti laste keelestMatsak, Erika2009 https://www.ester.ee/record=b2557755*est

Diskreetne matemaatikaLensen, Harri; Kruus, Margus2006 http://www.ester.ee/record=b2223858*est

Diskreetne matemaatikaLensen, Harri; Kruus, Margus2002 http://www.ester.ee/record=b1850141*est

Distributed approach for parallel exact critical path tracing fault simulationIvask, Eero; Devadze, Sergei; Ubar, Raimund-JohannesInternational journal of microelectronics and computer science2010 / p. 165-174 : ill

Double phase fault collapsing with linear complexity in digital circuitsUbar, Raimund-Johannes; Jürimägi, Lembit; Orasson, Elmet; Josifovska, Galina; Oyeniran, Adeboye StephenDSD 2015 : 18th Euromicro Conference on Digital Systems Design : 26-28 August 2015, Funchal, Madeira, Portugal2015 / p. 700-705 : ill

DyMeP : an infrastructure to support dynamic memory binding for runtime mapping in CGRAsTajammul, Muhammad Adeel; Jafri, Syed Mohammad Asad Hassan; Ellervee, Peeter; Hemani, Ahmed; Tenhunen, Hannu; Plosila, JuhaDoctoral School in Information and Communication Technology : proceedings of doctoral session of BEC 2014 : October 6-8 2014, Laulasmaa2014 / lk. 19-22 : ill

DyMeP : an infrastructure to support dynamic memory binding for runtime mapping in CGRAsTajammul, Muhammad Adeel; Jafri, Syed Mohammad Asad Hassan; Ellervee, Peeter; Hemani, Ahmed; Tenhunen, Hannu; Plosila, Juha28th International Conference on VLSI Design : held concurrently with 14th International Conference on Embedded Systems : 3-7 January 2015, Bangalore, India : proceedings2015 / p. 547-552 : ill http://dx.doi.org/10.1109/VLSID.2015.98

Dynamic quadrant partitioning adaptive routing algorithm for irregular reduced vertical link density topology 3-dimensional network-on-chipsYing, Haoyuan; Hofmann, Klaus; Hollstein, ThomasProceedings of the 2014 International Conference on High Performance Computing & Simulation (HPCS 2014) : July 21-25, 2014, Bologna, Italy2014 / p. 516-522 : ill

EE : Eesti (Estonia)Ubar, Raimund-Johannes; Rüstern, Ennu; Kruus, MargusTowards the harmonisation of Electrical and Information Engineering Education in Europe : 2003-20042003 / p. 67-74 : ill http://www.ester.ee/record=b2300874*est

Eestilt Euroopale : [Euroopa nanotehnika foorumil osales Eestist Raamprogrammi FP7 projekt DIAMOND, mida juhib TTÜ arvutitehnika instituudi professor Jaan Raik]Ubar, Raimund-JohannesMente et Manu2012 / lk. 8 : fot https://www.ester.ee/record=b1242496*est

Effective scalable IEEE 1687 instrumentation network for fault managementJutman, Artur; Shibin, Konstantin; Devadze, SergeiIEEE design & test2013 / p. 26-35 : ill

E-learning tools for teaching self-test of digital electronicsJutman, Artur; Gramatova, Elena; Pikula, T.; Ubar, Raimund-Johannes15 EAEEIE International Conference on Innovation in Education for Electrical and Information Engineering : Sofia, Bulgaria, May 27-29, 20042004 / p. 267-272 : ill

Elektroonika kui Eesti innovatsioonisüsteemi infrastruktuurMin, Mart; Rang, Toomas; Ubar, Raimund-JohannesEesti teadlaste kongress, 11.-15. augustini 1996. a. Tallinnas : ettekannete kokkuvõtted1996 / lk. 265 https://www.ester.ee/record=b1052731*est

Elmet Orasson tabab laskesportiOrasson, ElmetMente et Manu2014 / lk. 18-19 : fot https://www.ester.ee/record=b1242496*est

Embedded software solutions for development of marine navigation light system = Sardtarkvara lahendused valgusnavigatsiooni süsteemide arenduselMoorits, Erkki2016 http://digi.lib.ttu.ee/i/?6383

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Evaluation of basic project management activities : study in software industryLepmets, Marion2007 https://www.ester.ee/record=b2302044*est

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Extended checkers for control part of routers in network-on-chipsHariharan, Ranganathan; Niazmand, Behrad; Hollstein, Thomas; Raik, Jaan; Jervan, GertMEDIAN 2015 : the 4th Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale : March 13, 2015, Grenoble, France2015 / p. 36-39 : ill

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Extensible open-source framework for translating RTL VHDL IP cores to SystemCSaif Abrar, Syed; Jenihhin, Maksim; Raik, JaanProceedings of the 2013 IEEE 16th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) : April 8-10, 2013, Karlovy Vary, Czech Republic2013 / p. 112-115

Fast and optimized task allocation method for low vertical link density 3-Dimensional Networks-on-Chip based many core systemsYing, Haoyuan; Hollstein, Thomas; Hofmann, KlausProceedings : Design, Automation & Test in Europe : Grenoble, France, March 18-22, 20132013 / p. 1777-1782 : ill

Fast data sort based on searching networks with ring pipelineSklyarov, Valery; Skliarova, Iouliia; Sudnitsõn, AleksanderElektronika ir elektrotechnika = Electronics and electrical engineering2016 / p. 58-62 : ill http://dx.doi.org/10.5755/j01.eie.22.4.15920

Fast extended test access via JTAG and FPGAsDevadze, Sergei; Jutman, Artur; Aleksejev, Igor; Ubar, Raimund-JohannesInternational Test Conference 2009 : November 1 - November 6, 2009, Austin Convention Center, Austin, Texas USA : proceedings2009 / p. 1-7 : ill http://dx.doi.org/10.1109/TEST.2009.5355668

Fast matrix covering in all programmable systems-on-chipSklyarov, Valery; Skliarova, Iouliia; Rjabov, Artjom; Sudnitsõn, AleksanderElektronika ir elektrotechnika = Electronics and electrical engineering2014 / p. 150-153 : ill

Fast static compaction of tests composed of independent sequences : basic properties and comparison of methodsRaik, Jaan; Jutman, Artur; Ubar, Raimund-JohannesThe 9th IEEE International Conference on Electronics, Circuits and Systems : ICECS 2002 : September 15-18, 2002, Dubrovnik, Croatia. Volume II2002 / p. 445-448 : ill http://dx.doi.org/10.1109/ICECS.2002.1046190 https://ieeexplore.ieee.org/document/1046190

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Fault diagnosis in integrated circuits with BISTUbar, Raimund-Johannes; Kostin, Sergei; Raik, Jaan; Evartson, Teet; Lensen, Harri10th Euromicro Conference on Digital System Design Architectures, Methods and Tools, DSD 2007 : 29-31 August 2007, Lübeck, Germany : proceedings2007 / p. 604-610 : ill http://dx.doi.org/10.1109/DSD.2007.4341530

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Fault management instrumentation network based on IEEE P1687 IJTAGShibin, Konstantin; Jutman, Artur; Devadze, SergeiEuropean Test Symposium (ETS), 2013, Avignon, France2013

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Fault simulation with parallel critical path tracing for combinational circuits using structurally synthesized BDDsDevadze, Sergei; Raik, Jaan; Jutman, Artur; Ubar, Raimund-Johannes7th IEEE Latin American Test Workshop LATW'06 : Buenos Aires, Argentina, March 26th-29th, 2006 : proceedings2006 / p. 97-102 : ill

Fault simulation with parallel exact critical path tracing in multiple core environmentGorev, Maksim; Ubar, Raimund-Johannes; Devadze, SergeiProceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition (DATE) : 9-13 March 2015, Grenoble, France2015 / p. 1180-1185 : ill

Fault-tolerant scheduling of mixed-critical applications on multi-processor platformsBagheri, Mehrdad; Jervan, Gert2014 International Conference on Embedded and Ubiquitous Computing : EUC 2014 : 26-28 August 2014, Milano, Italy : proceedings2014 / p. 25-32 : ill

Flexible controller for educational robot kitRuberg, Priit; Guitar, Aivar; Ellervee, Peeter2015 International Conference on Microelectronic Systems Education : MSE '15 : Pittsburgh, PA, May 20-21, 20152015 / p. 17-20 : ill http://dx.doi.org/10.1109/MSE.2015.7160007

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Formal verification and error correction on high-level decision diagrams = Formaalne verifitseerimine ja vigade parandamine kõrgtasemelistel otsustusdiagrammidelKarputkin, Anton2012

FP7 DIAMOND : design error diagnosis and correction success storiesRaik, Jaan; Jenihhin, Maksim; Könighofer, RobertEuropean Test Symposium (ETS), 2013, Avignon, France2013 / p. 1-6

FPGA-based accelerators for parallel data sortSklyarov, Valery; Skliarova, Iouliia; Sudnitsõn, AleksanderApplied computer systems2014 / p. 53-63 : ill

FPGA-based embedded virtual instrumentation = FPGA-sisesed virtuaalsed test- ja mõõtevahendidAleksejev, Igor2013 http://www.ester.ee/record=b2927687*est

FPGA-based time and cost effective Hamming weight comparators for binary vectorsSklyarov, Valery; Skliarova, Iouliia; Sudnitsõn, Aleksander; Kruus, MargusProceedings : EUROCON 2015 : Salamanca, Spain, 8th-11th September2015 / p. 328-333 : ill http://dx.doi.org/10.1109/EUROCON.2015.7313700

A framework for area-efficient concurrent online checkers designSaltarelli, Pietro; Niazmand, Behrad; Hariharan, Ranganathan; Raik, Jaan; Jervan, Gert; Hollstein, ThomasMEDIAN Finale : Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale : November 10-11, 2015, Tallinn, Estonia2015 / p. 64-69 : ill

A framework for combining concurrent checking and online embedded test for low-latency fault detection in NoC routersSaltarelli, Pietro; Niazmand, Behrad; Raik, Jaan; Govind, Vineeth; Hollstein, Thomas; Jervan, Gert; Hariharan, RanganathanNOCS '15 : International Symposium on Networks-on-Chip : Vancouver, BC, Canada, September 28-30, 20152015 / [8] p. : ill http://dx.doi.org/10.1145/2786572.2788713

A framework for comprehensive automated evaluation of concurrent online checkersSaltarelli, Pietro; Niazmand, Behrad; Raik, Jaan; Hariharan, Ranganathan; Jervan, Gert; Hollstein, ThomasEuromicro Conference on Digital System Design : DSD 2015 : 26-28 August 2015, Funchal, Madeira, Portugal : proceedings2015 / p. 288-292 : ill http://dx.doi.org/10.1109/DSD.2015.15

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FSMD RTL design manipulation for clock interface abstractionAbrar, Syed Saif; Jenihhin, Maksim; Raik, Jaan2015 International Conference on Advances in Computing, Communications and Informatics (ICACCI) : 10-13 August 2015, Kerala, India2015 / p. 463-468 : ill http://dx.doi.org/10.1109/ICACCI.2015.7275652

Functional self-test of high-performance pipe-lined signal processing architecturesGorev, Maksim; Ubar, Raimund-Johannes; Ellervee, Peeter; Devadze, Sergei; Raik, Jaan; Min, MartMicroprocessors and microsystems2015 / p. 909-918 : ill http://dx.doi.org/10.1016/j.micpro.2014.11.002

GA-based test generation for sequential circuitsBrik, Marina; Raik, Jaan; Ubar, Raimund-Johannes; Ivask, EeroProceedings of East–West Design & Test Workshop (EWDTW’04) : Yalta, Alushta, Crimea, Ukraine, September 23-26, 20042004 / p. 30-34

Gate-level modelling of NBTI-induced delays under process variationsCopetti, Thiago; Cardoso Medeiros, Guilherme; Bolzani Poehls, Leticia; Vargas, Fabian; Kostin, Sergei; Jenihhin, Maksim; Raik, Jaan; Ubar, Raimund-JohannesLATS 2016 : 17th IEEE Latin-American Test Symposium, Foz do Iguacu, Brazil, 6th-9th April 20162016 / p. 75-80 : ill http://dx.doi.org/10.1109/LATW.2016.7483343

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Guest editorialEllervee, Peeter; Nurmi, JariMicroprocessors and microsystems2013 / p. 430-431

Hardware accelerators for information retrieval and data miningSklyarov, Valery; Skliarova, Iouliia; Silva, João; Sudnitsõn, Aleksander; Rjabov, Artjom2015 International Conference on Information and Communication Technology Research (ICTRC2015) : Abu Dhabi, United Arab Emirates, May 17-19, 20152015 / p. 202-205 : ill http://dx.doi.org/10.1109/ICTRC.2015.7156457

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Hardware implementation of face recognition using low precision representationDwivedi, Sai Kumar; Azad, Siavoosh Payandeh; Ellervee, Peeter; Dash, RatnakarBEC 2016 : 2016 15th Biennial Baltic Electronics Conference : proceedings of the 15th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 3-5, 2016, Tallinn, Estonia2016 / p. 63-66 : ill http://www.ester.ee/record=b2150914*est

Hardware implementation of recursive sorting algorithms using tree-like structures and HFSM models = Rekursiivsete sortimisalgoritmide riistvaraline realiseerimine kasutades puulaadseid struktuure ja HFSM mudeleidMihhailov, Dmitri2011 https://www.ester.ee/record=b2748823*est

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Hardware/software co-design for programmable systems-on-chipSklyarov, Valery; Skliarova, Iouliia; Silva, João; Rjabov, Artjom; Sudnitsõn, Aleksander; Cardoso, Cláudia2014 http://www.ester.ee/record=b3087107*est

Hardware/software co-design in extensible processing platforms for combinatorial search algorithmsSkliarova, Iouliia; Sklyarov, Valery; Rjabov, Artjom; Sudnitsõn, AleksanderMELECON 2014 : 2014 17th IEEE Mediterranean Electrotechnical Conference :  13-16 April 2014, Beirut, Lebanon2014 / p. 462-466 : ill

A hardware/software co-design reconfigurable network-on-chip FPGA emulation methodYing, Haoyuan; Hollstein, Thomas; Hofmann, Klaus2014 9th International Symposium on Reconfigurable and Communication-Centric Systems-on-Chip (ReCoSoC) : Montpellier, France, 26-28 May, 20142014 / [8] p. : ill

Hardware-based systems for partial sorting of streaming dataRjabov, ArtjomBEC 2016 : 2016 15th Biennial Baltic Electronics Conference : proceedings of the 15th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 3-5, 2016, Tallinn, Estonia2016 / p. 59-62 : ill http://www.ester.ee/record=b2150914*est

Hierarchical fault diagnosis in embedded digital systems with multi-level decision diagrams [Electronic resource]Ubar, Raimund-Johannes; Evartson, Teet; Lensen, Harri; Aarna, Margit5th International Conference on Industrial Automation = Cinquieme Conference Internationale sur l'Automatisation Industrielle : June 11-13, 2007, Montreal, Canada2007 / [6] p. [CD-ROM]

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Hierarchical identification of untestable faults in sequential circuitsRaik, Jaan; Ubar, Raimund-Johannes; Krivenko, Anna; Kruus, Margus10th Euromicro Conference on Digital System Design Architectures, Methods and Tools, DSD 2007 : 29-31 August 2007, Lübeck, Germany : proceedings2007 / p. 668-671 : ill http://dx.doi.org/10.1109/DSD.2007.4341539

Hierarchical test generation for digital circuits represented by Decision Diagrams : thesis on informatics and system engineeringRaik, Jaan2001 https://www.ester.ee/record=b1578107*est

Hierarchical test pattern generation and untestability identification techniques for synchronous sequential circuits = Hierarhilised testintegreerimise ja mittetestitavuse identifitseerimise meetodid sünkroonsetele järjestikskeemideleRannaste, Anna2010 https://www.ester.ee/record=b2637391*est

High-level decision diagram based fault models for targeting FSMsRaik, Jaan; Ubar, Raimund-Johannes; Viilukas, Taavi9th EUROMICRO Conference on Digital Systems Design : Architectures, Methods and Tools (DSD 2006) : 30 August 2006-1 September 2006, Cavtat near Dubrovnik, Croatia : proceedings2006 / p. 353-358 : ill http://dx.doi.org/10.1109/DSD.2006.60

High-level decision diagrams based coverage metrics for verification and testJenihhin, Maksim; Raik, Jaan; Tšepurov, Anton; Reinsalu, Uljana; Ubar, Raimund-JohannesLATW 2009 : 10th IEEE Latin American Test Workshop : Buzios, Rio de Janero, Brazil, March 2-5, 20092009 / [6] p. : ill http://dx.doi.org/10.1109/LATW.2009.4813792

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High-level modeling and testing of multiple control faults in digital systemsJasnetski, Artjom; Oyeniran, Adeboye Stephen; Tšertov, Anton; Schölzel, Mario; Ubar, Raimund-JohannesFormal proceedings of the 2016 IEEE 19th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) : April 20-22, 2016, Košice, Slovakia2016 / [6] p. : ill http://dx.doi.org/10.1109/DDECS.2016.7482445

High-level synthesis of control and memory intensive applications : thesis submitted to the Royal Institute of Technology in partial fulfillment of the requirements for the degree of Doctor of TechnologyEllervee, Peeter2000

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Holistic approach for Fault-Tolerant Network-on-Chip based many-core systems [Online resource]Azad, Siavoosh Payandeh; Niazmand, Behrad; Raik, Jaan; Jervan, Gert; Hollstein, ThomasarXiv.org2016 / [8] p. : ill

How to generate high quality tests for digital systemsUbar, Raimund-Johannes; Aarna, Margit; Kruus, Helena; Raik, Jaan2004 International Semiconductor Conference : 27th edition, October 4-6, 2004, Sinaia, Romania : CAS 2004 proceedings. Volume 22004 / p. 459-462 : ill http://dx.doi.org/10.1109/SMICND.2004.1403048

Hybrid BIST optimization using reseeding and test set compactionJervan, Gert; Orasson, Elmet; Kruus, Helena; Ubar, Raimund-Johannes10th Euromicro Conference on Digital System Design Architectures, Methods and Tools, DSD 2007 : 29-31 August 2007, Lübeck, Germany : proceedings2007 / p. 596-603 : ill http://dx.doi.org/10.1109/DSD.2007.4341529

Hybrid BIST scheduling for NoC-based SoCsJervan, Gert; Shchenova, Tatjana; Ubar, Raimund-JohannesProceedings [of] 24th IEEE Norchip Conference : Linköping, Sweden, 20-21 November 20062006 / p. 141-144 : ill https://ieeexplore.ieee.org/document/4126966

Hybrid built-in self-test : methods and tools for analysis and optimization of BIST = Sisseehitatud hübriidne isetestimine : meetodid ja vahendid analüüsiks ning optimeerimiseksOrasson, Elmet2007 https://www.ester.ee/record=b2305436*est

Identification and rejuvenation of NBTI-critical logic paths in nanoscale circuitsJenihhin, Maksim; Squillero, Giovanni; Tihhomirov, Valentin; Kostin, Sergei; Raik, Jaan; Ubar, Raimund-JohannesJournal of electronic testing : theory and applications (JETTA)2016 / p. 273-289 : ill http://dx.doi.org/10.1007/s10836-016-5589-x

Identification and rejuvenation of NBTI-critical paths in nanoscale logic circuitsJenihhin, Maksim1st International Workshop on Reliability and Aging in Forthcoming Electronic Systems : May 28-29, 2015, Cluj-Napoca, Romania2015 / [1] p

Identifying NBTI-critical paths in nanoscale logicUbar, Raimund-Johannes; Vargas, Fabian; Jenihhin, Maksim; Raik, Jaan; Kostin, Sergei; Bolzani Poehls, Leticia16th Euromicro Conference series on Digital System Design : DSD 2013 : proceedings : 4-6 September 2013, Santander, Spain2013 / p. 136-141 : ill

IEEE Eesti sektsioon on 10-aastaneTammemäe, Kalle; Kukk, VelloElektriala2016 / lk. 14-15 http://www.ester.ee/record=b1240496*est

IEEE Student Branch Tallinn University of TechnolgyTammemäe, KalleStudioosus2014 / lk. 12 https://www.ester.ee/record=b1558644*est

Implementation of parallel operations over streams in extensible processing platformsSklyarov, Valery; Skliarova, Iouliia; Rjabov, Artjom; Sudnitsõn, Aleksander2013 IEEE 56th International Midwest Symposium on Circuits and Systems (MWSCAS) : August 4-7, 2013, Columbus, Ohio : [proceedings]2013 / p. 852-855 : ill

Implementing quality assessment model in IT projectMarenkov, Mihhail; Valdlo, Taavi; Viies, VladimirEURAS proceedings 2014 : cooperation between standardisation organisations and the scientific and academic community2014 / p. 107-120

Improving sophisticated self-service portal user interfaces : a study on user click behaviourMarenkov, Jevgeni; Robal, Tarmo; Kalja, AhtoDatabases and Information Systems : proceedings of the 11th International Baltic Conference, Baltic DB&IS 2014 : Tallinn, Estonia, 8-11 June, 20142014 / p. 159-170 : ill

Informaatika teoreetilised alused : struktuurne aspektLorents, Peeter2001 https://www.ester.ee/record=b1056267*est

Infotehnika teaduskond : lühiteave1998 http://www.ester.ee/record=b1061288*est

In-system programming of non-volatile memories on microprocessor-centric boardsTšertov, Anton; Devadze, Sergei; Jutman, Artur; Jasnetski, ArtjomInternational journal of microelectronics and computer science2014 / p. 25-34 : ill

Integrated design and test generation under Internet based environment MOSCITOSchneider, Andre; Ivask, Eero; Ubar, Raimund-JohannesEuromicro Symposium on Digital System Design : Architectures, Methods and Tools : September 4-6, 2002, Dortmund, Germany : proceedings2002 / p. 187-194 : ill http://dx.doi.org/10.1109/DSD.2002.1115368

Integrated modelling, fault management, verification and reliable design environment for cyber-physical systemsRaik, Jaan; Rauwerda, Gerard; Zhao, Yong; Shibin, KonstantinMEDIAN Finale : Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale : November 10-11, 2015, Tallinn, Estonia2015 / p. 74

Integration of high-level synthesis to the courses on reconfigurable digital systemsSklyarov, Valery; Skliarova, Iouliia; Sudnitsõn, Aleksander; Kruus, Margus2015 38th International Convention on Information and Communication Technology, Electronics and Microelectronics (MIPRO) : May 25-29, 2015, Opatija, Croatia : proceedings2015 / p. 166-171 : ill http://dx.doi.org/10.1109/MIPRO.2015.7160258

Interactions of Zynq-7000 devices with general purpose computers through PCI-express : a case study [Electronic resource]Rjabov, Artjom; Sudnitsõn, Aleksander; Sklyarov, Valery; Skliarova, IouliiaProceedings of the 18th Mediterranean Electrotechnical Conference MELECON 2016 : 18-20 April 2016, Limassol, Cyprus2016 / [4] p. : ill. [CD-ROM] https://doi.org/10.1109/MELCON.2016.7495400

Internet-based testability-driven test generation in the virtual environment MOSCITOSchneider, Andre; Diener, Karl-Heinz; Elst, G.; Ivask, Eero; Raik, Jaan; Ubar, Raimund-JohannesInternational Federation for Information Processing IFIP : International Workshop on IP-Based SoC Design 2002 : proceedings : Grenoble, October 30-31, 20022002 / p. 357-362 : ill http://publica.fraunhofer.de/dokumente/N-287433.html

Investigation and development of test generation methods for control part of digital systemsBrik, Marina2002 http://www.ester.ee/record=b1688656*est

Involving students in teaching process — encouraging student-generated content in ICT studiesKruus, Helena; Ellervee, Peeter; Robal, Tarmo; Ruberg, Priit; Kruus, MargusProceedings of the 24th International Conference on European Association for Education in Electrical and Information Engineering : 30-31 May 2013, Chania, Greece2013 / p. 76-81 : ill

Jaak Aaviksoo tuleb rektoriks kinnitadaJervan, GertEesti Päevaleht2015 / lk. 11

Kahekiiruselise mitmemõõtmelise diskreetse objekti uurimine : [magistritöö] : õppesuund: arvuti- ja süsteemitehnikaAstrov, Igor1992 http://www.ester.ee/record=b2676838*est

Kakskümmend aastat hiljem : [vestlus arvutisüsteemide dignostika ja verifitseerimise õppetooli professori Jaan Raikiga]Raik, JaanMente et Manu2013 / lk. 10-12 : fot https://www.ester.ee/record=b1242496*est

20 aastat maailma testiteaduse tippkonkurentsisUbar, Raimund-JohannesMente et Manu2015 / lk. 12-13 : fot

Kas oleme õigel teel?Ubar, Raimund-JohannesSirp2016 / lk. 10-11

Keel ja loogikaLorents, Peeter2000 https://www.ester.ee/record=b1372695*est

Laboratory framework TEAM for investigating the dependability issues of microprocessor systemsJasnetski, Artjom; Tšertov, Anton; Ubar, Raimund-Johannes; Kruus, Helena10th European Workshop on Microelectronics Education : EWME 2014 : May 14-16, 2014, Tallinn, Estonia2014 / p. 80-83 : ill

Layout to logic defect analysis for hierarchical test generationJenihhin, Maksim; Raik, Jaan; Ubar, Raimund-Johannes; Pleskacz, Witold A.; Rakowski, MichalProceedings of the 2007 IEEE Workshop on Design and Diagnostic Circuits and Systems : April 11-13, 2007, Krakow, Poland2007 / p. 35-40 : ill http://dx.doi.org/10.1109/DDECS.2007.4295251

Logic simulation and fault collapsing with shared structurally synthesized BDDsMironov, Dmitri; Ubar, Raimund-Johannes; Raik, Jaan2014 19th IEEE European Test Symposium (ETS) : May 26th-30th, 2014, Paderborn, Germany : proceedings2014 / [2] p. : ill

Logic-based implementation of fault-tolerant routing in 3D Network-on-ChipsNiazmand, Behrad; Azad, Siavoosh Payandeh; Flich, Jose; Raik, Jaan; Jervan, Gert; Hollstein, Thomas2016 Tenth IEEE/ACM International Symposium on Networks-on-Chip (NOCS) : Nara, Japan, 31 August - 2 September 20162016 / [8] p. : ill https://doi.org/10.1109/NOCS.2016.7579317

Loodetavasti ajame ühist asjaKruus, MargusMente et Manu2016 / lk. 4-5 : fot

Low power finite state machine synthesisFomina, Jelena2005 https://www.ester.ee/record=b2097121*est

Lower bounds of the size of shared structurally synthesized BDDsUbar, Raimund-Johannes; Mironov, DmitriProceedings of the 2014 IEEE 17th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) : April 23-25, 2014, Warsaw, Poland2014 / p. 77-82 : ill

Läti keelel on teadustöös suurem roll kui eesti keelelHaav, Hele-Mai; Kalja, Ahto; Nõges, KrõõtMente et Manu2014 / lk. 16-17 : fot https://artiklid.elnet.ee/record=b2674038*est

Managing knowledge in Web portals for improved customer loyalty and satisfactionRobal, Tarmo; Kalja, AhtoProceedings of PICMET'13 : Technology Management in the IT-Driven Services : [July 28-August 1, 2013, San Jose, California, USA]2013 / p. 1207-1216 : ill

Managing software engineering competences with domain ontology for customer and team profiling and trainingRobal, Tarmo; Ojastu, Deniss; Kalja, Ahto; Jaakkola, HannuPICMET '15 Conference : Management of the Technology Age : August 2-6, 2015, Portland, Oregon, USA : conference bulletin2015 / p. 62

Managing software engineering competences with domain ontology for customer and team profiling and trainingRobal, Tarmo; Ojastu, Deniss; Kalja, Ahto; Jaakkola, HannuPICMET '15 : proceedings : Management of the Technology Age2015 / p. 1369-1376 : ill http://dx.doi.org/10.1109/PICMET.2015.7273171

Measuring and identifying aging-critical paths in FPGAsPfeifer, Petr; Raik, Jaan; Jenihhin, Maksim; Ubar, Raimund-Johannes; Pliva, ZdenekMEDIAN 2015 : the 4th Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale : March 13, 2015, Grenoble, France2015 / p. 56-61 : ill

A method for crosstalk fault detection in on-chip busesBengtsson, Tomas; Jutman, Artur; Ubar, Raimund-Johannes; Kumar, ShashiNorchip : proceedings : Oulu, Finland, 21-22 November 20052005 / p. 285-288 : ill https://doi.org/10.1109/NORCHP.2005.1597045

Methode et outil de prototypage des systemes integres sur FPGAs : [doktoriväitekiri]Krupnova, Helena1999

Microcontroller energy consumption estimation based on software analysis for embedded systemsRuberg, Priit; Lass, Keijo; Ellervee, Peeter2015 Nordic Circuits and Systems Conference (NORCAS) : NORCHIP & International Symposium on System-on-Chip (SoC) : 1st IEEE NORCAS Conference : 26-28 October 2015, Oslo, Norway2015 / [4] p. : ill http://dx.doi.org/10.1109/NORCHIP.2015.7364397

Microprocessor-based system test using debug interfaceDevadze, Sergei; Jutman, Artur; Tšertov, Anton; Instenberg, Martin; Ubar, Raimund-Johannes26th Norchip Conference : Tallinn, Estonia, 17-18 November 2008 : formal proceedings2008 / p. 98-101 : ill http://dx.doi.org/10.1109/NORCHP.2008.4738291

Mida peaks teaduspoliitikas reformima? : kui hindamisel jääb puudu kompetentsusest, on bibliomeetria see faktor, mis alati kõneleb täiel häälel ja vastuvaidlematultUbar, Raimund-JohannesSirp2014 / lk. 34-35 https://www.sirp.ee/s1-artiklid/c9-sotsiaalia/mida-peaks-teaduspoliitikas-reformima/

Mida vinget tõi lõppev aasta tehnikailma? : [2016. aasta olulisematest uuendustest tehnoloogiamaailmas : ekspertidena vastavad Gert Jervan, Argo Virkebau, ... Maarja Kruusmaa jt.]Pau, AivarPostimees2016 / lk. 24-25 : ill

Mikrokontrollerite M68HC11 ja Satt Con 05 riist- ja tarkvara : metoodiline materjalTammemäe, Kalle; Toomsalu, Arvo1995 https://www.ester.ee/record=b1069449*est

Mikroprotsessorsüsteemid : kursuseprojekti juhendmaterjalToomsalu, Arvo1998 https://www.ester.ee/record=b1061287*est

Mikroprotsessorsüsteemid : kursuseprojekti metoodiline juhendToomsalu, Arvo1996 https://www.ester.ee/record=b1619347*est

Miniaturized wireless monitor for long-term monitoring of newbornsLeier, Mairo; Jervan, GertBEC 2014 : 2014 14th Biennial Baltic Electronics Conference : proceedings of the 14th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 6-8, 2014, Tallinn, Estonia2014 / p. 193-196 : ill

Mining and modelling web user engagement : a survey on academic sites for framework establishment [Electronic resource]Robal, Tarmo; Kalja, AhtoPICMET '16 : Portland International Conference on Management of Engineering and Technology : proceedings. Technology Management for Social Innovation2016 / p. 1942-1952 : ill. [USB] https://doi.org/10.1109/PICMET.2016.7806759

Modeling sequential circuits with shared structurally synthesized BDDsUbar, Raimund-Johannes; Marenkov, Mihhail; Mironov, Dmitri; Viies, VladimirProceedings of 2014 9th International Design & Test Symposium (IDT) : Sheraton Club des Pins Hotel, Algiers, Algeria, December 16-18, 20142014 / p. 130-135 : ill

Modelling of multirate multivariable control systems : a state-space approach : thesis submitted to Tallinn Technical University in candidature for the degree of Doctor of Philosophy in EngineeringAstrov, Igor2000 http://www.ester.ee/record=b1707861*est

A modular 6LoWPAN-based wireless sensor body area network for health-monitoring applicationsLe Moullec, Yannick; Lecat, Yoann; Annus, Paul; Land, Raul; Kuusik, Alar; Reidla, Marko; Hollstein, Thomas; Reinsalu, Uljana; Tammemäe, Kalle; Ruberg, PriitAPSIPA ASC 2014 : Asia-Pacific Signal and Information Processing Association Annual Summit and Conference 2014 : December 9-12, 2014, Siem Reap, city of Angkor Wat, Cambodia2014 / [4] p. : ill

Morphable compression architecture for efficient configuration in CGRAsJafri, Syed Mohammad Asad Hassan; Tajammul, Muhammad Adeel; Ellervee, Peeter2014 17th Euromicro Conference on Digital System Design : DSD 2014 : 27-29 August 2014, Verona, Italy : proceedings2014 / p. 42-49 : ill

Motivation-driven learning processes at the example of embedded systemsHollstein, Thomas; Reinsalu, Uljana; Leier, Mairo10th European Workshop on Microelectronics Education : EWME 2014 : May 14-16, 2014, Tallinn, Estonia2014 / p. 3-6 : ill

Multiple control fault testing in digital systems with high-level decision diagramsUbar, Raimund-Johannes; Oyeniran, Adeboye Stephen2016 IEEE International Conference on Automation, Quality and Testing, Robotics (AQTR) : THETA 20th edition : 19th-21st May, Cluj-Napoca, Romania : proceedings2016 / [6] p. : ill http://dx.doi.org/10.1109/AQTR.2016.7501287

Multiple fault testing in systems-on-chip with high-level decision diagramsUbar, Raimund-Johannes; Oyeniran, Adeboye Stephen; Schölzel, Mario; Vierhaus, Heinrich TheodorProceedings of 2015 10th International Design & Test Symposium (IDT) : Dead Sea, Jordan, 14-16 December 20152015 / p. 66-71 : ill http://dx.doi.org/10.1109/IDT.2015.7396738

Mutation-based verification and error correction in high-level designs = Mutatsioonidel põhinev verifitseerimine ja vigade parandamine kõrgtaseme skeemidesHantson, Hanno2015

Muuk - esimesed triibulisedTammemäe, KalleMente et Manu2014 / lk. 7-9 : ill https://artiklid.elnet.ee/record=b2679161*est

Nanoelectronics aging mitigation using SSBDD based techniques and dedicated sensorsUbar, Raimund-Johannes; Vargas, Fabian; Jenihhin, Maksim; Raik, JaanMEDIAN Workshop on Circuit Reliability : Modeling and Monitoring, Rome, Italy, February 25, 20132013 / [1] p

New built-in self-test scheme for SoC interconnectJutman, Artur; Ubar, Raimund-Johannes; Raik, JaanThe 9th World Multi-Conference on Systemics, Cybernetics and Informatics : WMSCI 2005 : July 10-13, 2005, Orlando, Florida, USA. Vol. IV2005 / p. 19-24 : ill

New fault models and self-test generation for microprocessors using High-Level Decision DiagramsJasnetski, Artjom; Raik, Jaan; Tšertov, Anton; Ubar, Raimund-Johannes2015 IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems DDECS 2015 : 22-24 April 2015, Belgrade, Serbia : proceedings2015 / p. 251-254 : ill

New generations of Estonian eGovernment componentsKalja, Ahto; Robal, Tarmo; Vallner, UunoPICMET '15 : proceedings : Management of the Technology Age2015 / p. 625-631 : ill http://dx.doi.org/10.1109/PICMET.2015.7273002

New generations of Estonian eGovernment componentsKalja, Ahto; Robal, Tarmo; Vallner, UunoPICMET '15 Conference : Management of the Technology Age : August 2-6, 2015, Portland, Oregon, USA : conference bulletin2015 / p. 93

NOC mapping and schedulingNikiforov, DenissInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK seitsmenda aastakonverentsi artiklite kogumik : 15.-16. novembril 2013, Haapsalu2013 / p. 73-78 : ill

NoCDepend : a flexible and scalable dependability technique for 3D networks-on-chipHollstein, Thomas; Azad, Siavoosh Payandeh; Kogge, Thilo; Ying, Haoyuan; Hofmann, Klaus2015 IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems DDECS 2015 : 22-24 April 2015, Belgrade, Serbia : proceedings2015 / p. 75-78 : ill http://dx.doi.org/10.1109/DDECS.2015.30

A novel random approach to diagnostic test generationOsimiry, Emmanuel Ovie; Ubar, Raimund-Johannes; Kostin, Sergei; Raik, Jaan2nd IEEE NORCAS Conference : 1-2 November 2016, Copenhagen, Denmark2016 / [4] p. : ill https://doi.org/10.1109/NORCHIP.2016.7792915

Off-line testing of crosstalk induced glitch faults in NoC InterconnectsBengtsson, Tomas; Kumar, Shashi; Jutman, Artur; Ubar, Raimund-JohannesProceedings [of] 24th IEEE Norchip Conference : Linköping, Sweden, 20-21 November 20062006 / p. 221-225 : ill http://dx.doi.org/10.1109/NORCHP.2006.329215

Off-line testing of delay faults in NoC interconnectsBengtsson, Tomas; Jutman, Artur; Kumar, Shashi; Peng, Zebo; Ubar, Raimund-Johannes9th EUROMICRO Conference on Digital Systems Design : Architectures, Methods and Tools (DSD 2006) : 30 August 2006-1 September 2006, Cavtat near Dubrovnik, Croatia : proceedings2006 / p. 677-680 : ill http://dx.doi.org/10.1109/DSD.2006.72

On automatic software-based self-test program generation based on high-Level decision diagramsJasnetski, Artjom; Ubar, Raimund-Johannes; Tšertov, AntonLATS 2016 : 17th IEEE Latin-American Test Symposium, Foz do Iguacu, Brazil, 6th-9th April 20162016 / p. 177 http://dx.doi.org/10.1109/LATW.2016.7483357

On coverage of timing related faults at board levelJutman, Artur; Aleksejev, Igor; Devadze, Sergei2016 21st IEEE European Test Symposium (ETS) : May 23rd-26th 2016, Amsterdam, The Netherlands : proceedings2016 / [2] p. : ill https://doi.org/10.1109/ETS.2016.7519295

On in-system programming of non-volatile memoriesTšertov, Anton; Devadze, Sergei; Jutman, Artur; Jasnetski, ArtjomInternational journal of microelectronics and computer science2013 / p. 72-78 : ill

On in-system programming of non-volatile memoriesTšertov, Anton; Devadze, Sergei; Jutman, Artur; Jasnetski, ArtjomProceedings of the 20th International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2013, Gdynia, Poland, June 20-22, 20132013 / p. 408-413 : ill

On integration of object-oriented applications with relational databasesAstrova, Irina2003 http://www.ester.ee/record=b1833107*est

On proving the concept of an ontology aided software refactoring toolPõld, Janari; Robal, Tarmo; Kalja, AhtoDatabases and information systems VII : selected papers from the tenth International Baltic Conference, DB&IS 20122013 / p. 84-94

On-line fault classification and handling in IEEE1687 based fault management system for complex SoCsShibin, Konstantin; Devadze, Sergei; Jutman, ArturLATS 2016 : 17th IEEE Latin-American Test Symposium, Foz do Iguacu, Brazil, 6th-9th April 20162016 / p. 69-74 : ill https://doi.org/10.1109/LATW.2016.7483342

Ontology-based customization of a scheduling system for discrete manufacturingSanko, Jelena; Haav, Hele-Mai; Kotkas, VahurDatabases and information systems IX : selected papers from the twelfth International Baltic Conference, DB&IS 20162016 / p. 57-70 : ill http://dx.doi.org/10.3233/978-1-61499-714-6-57

Optimization methodologies for Cycle-Accurate SystemC models converted from RTL VHDLSaif Abrar, Syed; Jenihhin, Maksim; Raik, JaanIP-SoC 2013 : IP embbeded system conference and exhibition : Grenoble, France, November 6-7, 20132013

Optimization of address-based data sorting unit with external memory supportMihhailov, Dmitri; Rjabov, Artjom; Sklyarov, Valery; Skliarova, Iouliia; Sudnitsõn, AleksanderCompSysTech'13 : proceedings of the 14th International Conference on Computer Systems and Technologies2013 / p. 83-90 : ill

Optimization of boundary scan tests using FPGA-based efficient scan architecturesAleksejev, Igor; Devadze, Sergei; Jutman, Artur; Shibin, KonstantinJournal of electronic testing : theory and applications (JETTA)2016 / p. 245-255 : ill http://dx.doi.org/10.1007/s10836-016-5588-y

Optimization of built-in self-test in digital systems = Sisseehitatud enesetestimise optimeerimine digitaalsüsteemidesKruus, Helena2011

Optimization of multisine excitation for a bioimpedance measurement deviceOjarand, Jaan; Annus, Paul; Min, Mart; Gorev, Maksim; Ellervee, PeeterI2MTC 2014 IEEE International Instrumentation and Measurement Technology Conference : Instrumentation and Measurement for Sustainable Development : Radisson Montevideo Victoria Plaza Hotel & Conference Center, May 12-15, 2014, Montevideo, Uruguay : proceedings2014 / p. 829-832 : ill

Otstarbeka, õiglase ja tõhusa Eesti suunasUbar, Raimund-JohannesInsenerikultuur Eestis. 21995 / lk. 179-185 https://www.ester.ee/record=b1063622*est

Overview about low-level and high-level decision diagrams for diagnostic modeling of digital systemsUbar, Raimund-JohannesFacta Universitatis [Niš]. Series electronics and energetics2011 / p. 303-324 : ill http://dx.doi.org/10.2298/FUEE1103303U

Perceptions of software development practitioners on client learningOjastu, Deniss; Robal, Tarmo; Kalja, AhtoDatabases and Information Systems : proceedings of the 11th International Baltic Conference, Baltic DB&IS 2014 : Tallinn, Estonia, 8-11 June, 20142014 / p. 397-406

Performance analysis of cosimulating processor core in VHDL and SystemCSaif Abrar, Syed; Shyam Kiran A.; Jenihhin, Maksim; Raik, Jaan; Babu, C.Proceedings of the 2013 International Conference on Advances in Computing, Communications and Informatics (ICACCI) : 22–25 August 2013, Mysore, India2013 / p. 563-568 : ill

Pildikesi poolest sajandist : arvutitehnika instituudi luguUbar, Raimund-Johannes2016 http://www.ester.ee/record=b4639382*est

Pipelined execution of data-parallel algorithmsGorev, Maksim; Ubar, Raimund-JohannesBEC 2014 : 2014 14th Biennial Baltic Electronics Conference : proceedings of the 14th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 6-8, 2014, Tallinn, Estonia2014 / p. 109-112 : ill

Polymorphic configuration architecture for CGRAsJafri, Syed Mohammad Asad Hassan; Tajammul, Muhammad Adeel; Hermani, Ahmed; Paul, Kolin; Plosila, Juha; Ellervee, Peeter; Tenhunen, HannuIEEE transactions on Very Large Scale Integration (VLSI) Systems2016 / p. 403-407 : ill http://dx.doi.org/10.1109/TVLSI.2015.2402392

Practical works for on-line teaching design and test of digital circuitsJutman, Artur; Ubar, Raimund-Johannes; Hahanov, V.; Skvortsova, O.The 9th IEEE International Conference on Electronics, Circuits and Systems : ICECS 2002 : September 15-18, 2002, Dubrovnik, Croatia. Volume III2002 / p. 1223-1226 : ill http://dx.doi.org/10.1109/ICECS.2002.1046474

Practicing start-up culture in teaching embedded systemsReinsalu, Uljana; Azad, Siavoosh Payandeh; Leier, Mairo; Tammemäe, Kalle; Hollstein, ThomasEWME 2016 : 11th European Workshop on Microelectronics Education : May 11-13, 2016, Southampton, UK2016 / [6] p. : ill https://doi.org/10.1109/EWME.2016.7496463

PrefaceUbar, Raimund-Johannes; Raik, Jaan; Vierhaus, Heinrich TheodorDesign and test technology for dependable systems-on-chip2011 / p. xxii-xxviii

PrefaceHaav, Hele-Mai; Kalja, Ahto; Robal, TarmoDatabases and information systems VIII : selected papers from the Eleventh International Baltic Conference, DB&IS 20142014 / p. v

Proceedings of the 2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) : April 18-20, 2012 Tallinn, Estonia2012 http://www.ester.ee/record=b2777270*est

Processing N-ary trees in reconfigurable hardwareSklyarov, Valery; Skliarova, Iouliia; Sudnitsõn, Aleksander2013 25th International Conference on Microelectronics (ICM) : 15–18 December 2013, Beirut-Lebanon2013 / p. 13-16 : ill

Processing sorted subsets in a multi-level reconfigurable computing systemRjabov, Artjom; Sklyarov, Valery; Skliarova, Iouliia; Sudnitsõn, AleksanderElektronika ir elektrotechnika = Electronics and electrical engineering2015 / p. 30-33 : ill http://dx.doi.org/10.5755/j01.eee.21.2.11509

Professor Andres Keevallik juhib Eesti parima arengudünaamikaga kõrgkooliKeevallik, Andres; Ehavere, LiisRapla inimesed2016 / lk. 146-148 : ill

Professor Raimund Ubari ettekanne [audoktorite promotsioonil TTÜ Nõukogu pidulikul istungil 1. sept. 1993]Ubar, Raimund-Johannes75 aastat Tallinna Tehnikaülikooli1994 / lk. 106-109 https://www.ester.ee/record=b1066846*est

Programmeerimisvõistlus IEEEXtreme 9.0 24hTammemäe, KalleMente et Manu2015 / lk. 8-9 : fot

Pulse wave registration from radial artery using photoplethysmographic methodPilt, Kristjan; Leier, Mairo; Silluta, Sandra; Kööts, Kristina; Meigas, Kalju; Viigimaa, MargusConference proceedings : 37th Annual International Conference of the IEEE Engineering in Medicine and Biology Society : Milan, Italy, August 25-29 20152015 / p. 6425-6428 : ill http://dx.doi.org/10.1109/EMBC.2015.7319863

Rahvusvahelise inseneriorganisatsiooni IEEE Eesti sektsioon sai 10-aastaseksTammemäe, KalleMente et Manu2016 / lk. 40-41 : fot http://www.ttu.ee/public/u/ulikool/Tutvustus/ajaleht-mente-et-manu/MM_2016_05/index.html

Raimund Ubari lühisõnavõtt : riigi teadus-, kultuuri- ja spordipreemiate ning F.J.Wiedemanni keeleauhinna kätteandmisel 24. veebruaril 2016. aastalUbar, Raimund-JohannesRaimund-Johannes Ubar. Bibliograafia2016 / lk. 45-46

Refactoring - key to success for constantly developed projects [Electronic resource]Põld, Janari; Kalja, Ahto; Robal, TarmoProceedings of the 26th International Conference on Information Modelling and Knowledge Bases - EJC 2016 : June 6-10, 2016, Tampere, Finland2016 / p. 15-24. [USB]

Rejuvenation of nanoscale logic at NBTI-critical paths using evolutionary TPGPalermo, N.; Tihhomirov, Valentin; Copetti, Thiago; Jenihhin, Maksim; Raik, Jaan; Kostin, Sergei2015 16th Latin American Test Symposium (LATS 2015) : Puerto Vallarta, Mexico, 25-27 March 20152015 / [6] p. : ill http://dx.doi.org/10.1109/LATW.2015.7102405

Rejuvenation of NBTI-impacted processors using evolutionary generation of assembler programsPellerey, Francesco; Jenihhin, Maksim; Squillero, Giovanni; Raik, Jaan; Sonza Reorda, Matteo; Tihhomirov, Valentin; Ubar, Raimund-Johannes2016 IEEE 25th Asian Test Symposium : 21-24 November 2016, Hiroshima, Japan2016 / p. 304-309 : ill https://doi.org/10.1109/ATS.2016.57

Reliability continuum and academic EDAJenihhin, Maksim2nd International Training School on Manufacturable and Dependable Multicore Architectures at Nanoscale (MEDIAN ISTS 2015) : Prague, Czech Republic, July 13-15, 20152015 / [1] p

Reliable health monitoring and fault management infrastructure based on embedded instrumentation and IEEE 1687Jutman, Artur; Shibin, Konstantin; Devadze, SergeiIEEE AUTOTESTCON 2016 : Anaheim, California, USA, September 12-15, 2016 : proceedings2016 / p. 240-249 : ill https://doi.org/10.1109/AUTEST.2016.7589605

Remote and virtual laboratories in problem-based learning scenariosWuttke, Heinz-Dietrich; Ubar, Raimund-Johannes; Henke, Karsten2010 IEEE International Symposium on Multimedia ISM 2010 : 13-15 December 2010,
Taichung, Taiwan : proceedings2010 / p. 377-382 : ill http://dx.doi.org/10.1109/ISM.2010.63

Research and training environment for digital design and testUbar, Raimund-Johannes; Wuttke, Heinz-Dietrich34th ASEE/IEEE Frontiers in Education Conference : October 20-23, 2004, Savannah, GA2004 / p. S3F-18-S3F-23 : ill http://dx.doi.org/10.1109/FIE.2004.1408779

Research in digital design and test at Tallinn University of TechnologyUbar, Raimund-Johannes; Jervan, Gert; Jutman, Artur; Raik, Jaan; Ellervee, Peeter; Kruus, MargusRadioelectronics & informatics2008 / p. 4-12 : ill http://www.ewdtest.com/ri/%E2%84%96-1-40-january-march-2008/

Reseeding using compaction of pre-generated LFSR sub-sequencesJutman, Artur; Aleksejev, Igor; Raik, Jaan; Ubar, Raimund-JohannesICECS 2008 : The 15th IEEE International Conference on Electronics, Circuits and Systems : Malta2008 / p. 1290-1295 : ill http://dx.doi.org/10.1109/ICECS.2008.4675096

Respiration signal extraction from photoplethysmogram using pulse wave amplitude variationLeier, Mairo; Jervan, Gert; Stork, Wilhelm2014 IEEE International Conference on Communications (ICC) : Sydney, Australia, June 10-14, 2014


2014 / p. 3535-3540 : ill

Riistvara kirjeldamiskeel - VHDL : metoodiline materjalTammemäe, Kalle2003 http://www.ester.ee/record=b1605950*est

Riistvara kirjeldamiskeel VHDL : metoodiline materjalTammemäe, Kalle2002 http://www.ester.ee/record=b1605950*est

Runtime contention and bandwidth-aware adaptive routing selection strategies for networks-on-chipSamman, Faizal; Hollstein, Thomas; Glesner, ManfredIEEE transactions on parallel and distributed systems2013 / p. 1411-1421 : ill

Run-time reconfigurable instruments for advanced board-level testingAleksejev, Igor; Jutman, Artur; Devadze, SergeiIEEE AUTOTESTCON 2016 : Anaheim, California, USA, September 12-15, 2016 : proceedings2016 / p. 385-392 : ill https://doi.org/10.1109/AUTEST.2016.7589627

Scalable algorithm for structural fault collapsing in digital circuitsUbar, Raimund-Johannes; Jürimägi, Lembit; Orasson, Elmet; Raik, Jaan2015 IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC) : October 5-7, 2015, Daejeon, Korea2015 / p. 171-176 : ill

Scalable open platform for reliable medical sensorics = Laiendatav avatud platvorm usaldusväärsete meditsiiniliste sensorite jaoksLeier, Mairo2016

Second IEEE East-West Design and Test WorkshopHahanov, Vladimir; Ubar, Raimund-JohannesIEEE journal of design & test of computers2004 / p. 594

Selected issues of modeling, verification and testing of digital systemsJutman, Artur2004 https://www.ester.ee/record=b1989760*est

Self-diagnosis in digital systems = Isediagnoosivad digitaalsüsteemidKostin, Sergei2012 https://www.ester.ee/record=b2757857*est

Self-learning tool for digital testUbar, Raimund-Johannes; Orasson, Elmet; Evartson, TeetProceedings of 2nd International Conference "Distance Learning - Educational Sphere of the XXI Century"2002 / p. 36-38 : ill

Self-testing of pipe-lined signal processing architectures at-speedGorev, Maksim; Ubar, Raimund-Johannes; Ellervee, PeeterInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK seitsmenda aastakonverentsi artiklite kogumik : 15.-16. novembril 2013, Haapsalu2013 / p. 25-28 : ill

Service quality meter design for self-aware systemsTammemäe, Kalle; Leier, MairoAmiES-2015 : Ambient Intelligence and Embedded Systems : International Symposium, 24-26 September, 2015, Oostende, Belgium2015 / [4] p. : ill

7-valued algebra for transition delay fault analysisKõusaar, Jaak; Ubar, Raimund-JohannesBEC 2014 : 2014 14th Biennial Baltic Electronics Conference : proceedings of the 14th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 6-8, 2014, Tallinn, Estonia2014 / p. 89-92 : ill

Shared Structurally Synthesized BDDs for speeding-up parallel pattern simulation in digital circuitsUbar, Raimund-Johannes; Jürimägi, Lembit; Raik, Jaan2015 Nordic Circuits and Systems Conference (NORCAS) : NORCHIP & International Symposium on System-on-Chip (SoC) : 1st IEEE NORCAS Conference : 26-28 October 2015, Oslo, Norway2015 / [4] p. : ill http://dx.doi.org/10.1109/NORCHIP.2015.7364406

Simulation-based hardware verification with high-level decision diagrams = Simuleerimisel põhinev riistvara verifitseerimine kõrgtaseme otsustusdiagrammidelJenihhin, Maksim2008 https://www.ester.ee/record=b2431332*est

Simulation-based verification with APRICOT framework using high-level decision diagramsJenihhin, Maksim; Raik, Jaan; Tšepurov, Anton; Ubar, Raimund-JohannesEast-West Design & Test Symposium : Moscow, September 18-21, 20092009 / p. 13-16 : ill

Sissejuhatus füüsikasseLorents, Peeter1998 http://www.ester.ee/record=b1207605*est

Sleep apnea pre-screening on neonates and children with shoe integrated sensors [Electronic resource]Leier, Mairo; Jervan, Gert31st Norchip Conference : Vilnius, Lithuania, 11-12 November 2013 : conference program and papers2013 / [4] p. : ill [USB]

A small-size sleep apnea pre-screening prototype for neonates and childrenLeier, Mairo; Jervan, GertInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK seitsmenda aastakonverentsi artiklite kogumik : 15.-16. novembril 2013, Haapsalu2013 / p. 49-52 : ill

Smart photoplethysmographic sensor for pulse wave registration at different vascular depthsLeier, Mairo; Jervan, Gert; Pilt, KristjanProceedings of the 8th Annual Conference of the Estonian National Doctoral School in Information and Communication Technologies : December 5-6, 2014, Rakvere2014 / p. 67-70 : ill

Smart photoplethysmographic sensor for pulse wave registration at different vascular depthsLeier, Mairo; Pilt, Kristjan; Karai, Deniss; Jervan, GertConference proceedings : 37th Annual International Conference of the IEEE Engineering in Medicine and Biology Society : Milan, Italy, August 25-29 20152015 / p. 1849-1852 : ill http://dx.doi.org/10.1109/EMBC.2015.7318741

Smart, wireless modular communication platformRuberg, Priit; Hollstein, Thomas; Reinsalu, Uljana; Tammemäe, Kalle; Le Moullec, Yannick; Kuusik, Alar; Reidla, Marko; Annus, PaulProceedings of the 8th Annual Conference of the Estonian National Doctoral School in Information and Communication Technologies : December 5-6, 2014, Rakvere2014 / p. 111-112 : ill

SoCDep2 : a framework for dependable task deployment on many-core systems under mixed-criticality constraintsAzad, Siavoosh Payandeh; Niazmand, Behrad; Ellervee, Peeter; Raik, Jaan; Jervan, Gert; Hollstein, Thomas2016 11th International Symposium on Reconfigurable Communication‐centric Systems‐on‐Chip (ReCoSoC) : June 27‐29, 2016, Tallinn, Estonia2016 / [6] p. : ill https://doi.org/10.1109/ReCoSoC.2016.7533903

Software-based self-test generation for microprocessors with high-level decision diagramsUbar, Raimund-Johannes; Tšertov, Anton; Jasnetski, Artjom; Brik, MarinaLATW2014 : 15th IEEE Latin-American Test Workshop : Fortaleza, Brazil, March 12th-15th, 20142014 / [6] p. : ill

Software-based self-test generation for microprocessors with high-level decision diagramsJasnetski, Artjom; Ubar, Raimund-Johannes; Tšertov, Anton; Brik, MarinaProceedings of the Estonian Academy of Sciences2014 / p. 48-61 : ill https://artiklid.elnet.ee/record=b2665215*est

Solving computationally intensive problems in reconfigurable hardware : a case studySkliarova, Iouliia; Vallejo, Tiago; Sklyarov, Valery; Sudnitsõn, Aleksander; Kruus, MargusJournal of convergence information technology (JCIT) : an international journal2013 / p. 601-609 : ill

SPICE-inspired fast gate-level computation of NBTI-induced delays in nanoscale logicKostin, Sergei; Raik, Jaan; Ubar, Raimund-Johannes; Jenihhin, Maksim2015 IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems DDECS 2015 : 22-24 April 2015, Belgrade, Serbia : proceedings2015 / p. 223-228 : ill

SSBDDs : advantageous model and efficient algorithms for digital circuit modeling, simulation & testJutman, Artur; Raik, Jaan; Ubar, Raimund-Johannes5th International Workshop on Boolean Problems : September 19-20, 2002,
Freiberg (Sachsen) : proceedings2002 / p. 157-166 : ill

Structurally synthesized multiple input BDDs for simulation of digital circuitsUbar, Raimund-Johannes; Mironov, Dmitri; Raik, Jaan; Jutman, Artur16th IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2009 : Yasmine Hammamet, Tunesia, 13-19 December, 20092009 / p. 451-454 : ill http://dx.doi.org/10.1109/ICECS.2009.5410895

A study on effective knowledge reuse in multi-platform web applications user interfacesMarenkov, Jevgeni; Robal, Tarmo; Kalja, AhtoPICMET '15 : proceedings : Management of the Technology Age2015 / p. 1351-1361 : ill https://doi.org/10.1109/PICMET.2015.7273083

A study on immediate automatic usability evaluation of web application user interfacesMarenkov, Jevgeni; Robal, Tarmo; Kalja, AhtoDatabases and Information Systems : 12th International Baltic Conference, DB&IS 2016, Riga, Latvia, July 4-6, 2016 : proceedings2016 / p. 257-271 : ill https://doi.org/10.1007/978-3-319-40180-5_18

Studying the incorrect user behaviour in sophisticated self-service portal user interfacesMarenkov, Jevgeni; Robal, Tarmo; Kalja, AhtoProceedings of the 8th Annual Conference of the Estonian National Doctoral School in Information and Communication Technologies : December 5-6, 2014, Rakvere2014 / p. 71-74 : ill

A suite of IEEE 1687 benchmark networksTšertov, Anton; Jutman, Artur; Devadze, Sergei2016 IEEE International Test Conference (ITC) : proceedings2016 / art. 6.1, p. 1-10 : ill https://doi.org/10.1109/TEST.2016.7805840

Süsteemse käsitluse alused : [loengukonspekt]Lorents, Peeter2004 http://www.ester.ee/record=b2871388*est

Süsteemse käsitluse alused : riigikaitse ja julgeoleku põhiküsimusedLorents, Peeter1998 https://www.ester.ee/record=b1054840*est

Synchronization, calibration and triggering of IEEE 1687 embedded instrumentsJutman, Artur; Devadze, Sergei; Shibin, KonstantinThe Seventeenth Workshop on RTL and High Level Testing (WRTLT'16) : November 24-25, 2016, Aki Grand Hotel, Hiroshima, Japan2016 / [6] p

Synthesis of high-level decision diagrams for functional test pattern generationUbar, Raimund-Johannes; Raik, Jaan; Karputkin, Anton; Tombak, MatiProceedings of the 16th International Conference Mixed Design of Integrated Circuits and Systems MIXDES 2009 : Lodz, Poland, 25-27 June, 20092009 / p. 519-524 : ill

Synthesis of multiple fault oriented test groups from single fault test sets [Electronic resource]Ubar, Raimund-Johannes; Kostin, Sergei; Raik, Jaan2013 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) : 26-28 March 2013, Abu Dhabi, UAE2013 / p. 36-41 : ill [CD-ROM]

SysML in systems engineering courseKruus, Helena; Robal, Tarmo; Jervan, Gert10th European Workshop on Microelectronics Education : EWME 2014 : May 14-16, 2014, Tallinn, Estonia2014 / p. 177-181 : ill

System modeling for processor-centric test automation = Süsteemide modelleerimine protsessorikesksete testprogrammide sünteesi automatiseerimiseksTšertov, Anton2012 https://www.ester.ee/record=b2751131*est

SystemC-based loose models : RTL abstraction for design understandingAbrar, Syed Saif; Jenihhin, Maksim; Raik, JaanWorkshop on Design Automation for Understanding Hardware Designs DUHDe 2015 : Grenoble, March 13, 20152015 / p. 1-6

SystemC-based loose models for simulation speed-up by abstraction of RTL IP coresAbrar, Syed Saif; Jenihhin, Maksim; Raik, Jaan2015 IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems DDECS 2015 : 22-24 April 2015, Belgrade, Serbia : proceedings2015 / p. 71-74 : ill http://dx.doi.org/10.1109/DDECS.2015.39

System-level design of timing-sensitive network-on-chip based dependable systems = Kiipvõrkudel põhinevate ajakriitiliste ja töökindlate süsteemide kõrgtaseme disainTagel, Mihkel2012 https://www.ester.ee/record=b2778263*est

Systems engineering course as a backbone of the computer engineering curriculaJervan, GertProceedings of the 24th International Conference on European Association for Education in Electrical and Information Engineering : 30-31 May 2013, Chania, Greece2013 / p. 163-166 : ill

zamiaCAD : shall we dance?Jenihhin, MaksimOpen Source Tools for Verification : DVClub 14 January 20132013 / 1 p

zamiaCAD : understand, develop and debug hardware designsJenihhin, Maksim; Tihhomirov, Valentin; Saif Abrar, Syed; Raik, Jaan; Bartsch, GünterDUHDe : 1st Workshop on Design Automation for Understanding Hardware Designs : March 28, 2014 : Friday Workshop at DATE 2014, Dresden, Germany2014 / p. 1-6

Zynq-based system for extracting sorted subsets from large data setsSklyarov, Valery; Skliarova, Iouliia; Rjabov, Artjom; Sudnitsõn, AleksanderJournal of microelectronics, electronic components and materials2015 / p. 142-152 : ill

A task-oriented design of a biologically inspired underwater robotListak, Madis2007 http://www.ester.ee/record=b2298234*est

Teaching advanced test issues in digital electronicsUbar, Raimund-Johannes; Orasson, Elmet; Raik, Jaan; Wuttke, Heinz-DietrichProceedings of the 6th IEEE International Conference on Information Technology Based Higher Education and Training : ITHET : July 7-9, 2005, Juan Dolio, Dominican Republic2005 / p. S2B-1 - S2B-6 : ill http://dx.doi.org/10.1109/ITHET.2005.1560318

Teaching diagnostic modeling of digital systems with decision diagrams [Electronic resource]Ubar, Raimund-Johannes; Raik, Jaan; Mironov, Dmitri; Evartson, Teet; Orasson, Elmet; Aarna, Margit; Wuttke, Heinz-DietrichProceedings of 12th IASTED International Conference on Computers and Advanced Technology in Education - CATE 2009 : St.Thomas, US, November 22-24, 20092009 / p. 1-6. [CD-ROM]

Teaching digital RT-level self-test using a Java appletDevadze, Sergei; Jutman, Artur; Sudnitsõn, Aleksander; Ubar, Raimund-Johannes; Wuttke, Heinz-Dietrich20th IEEE NORCHIP Conference : Copenhagen, Denmark, November 11-12, 20022002 / p. 322-328 : ill

Teaching digital test with BIST analyzerJutman, Artur; Tšertov, Anton; Tšepurov, Anton; Aleksejev, Igor; Ubar, Raimund-Johannes; Wuttke, Heinz-Dietrich19th EAEEIE Annual Conference : June 29-July 2, 2008, Tallinn, Estonia : formal proceedings2008 / p. 123-128 : ill http://dx.doi.org/10.1109/EAEEIE.2008.4610171

Teaching FPGA-based systemsSkliarova, Iouliia; Sklyarov, Valery; Sudnitsõn, Aleksander; Kruus, Margus2014 IEEE Global Engineering Education Conference (EDUCON) : Istanbul, Turkey, April 2-5, 20142014 / p. 460-469 : ill

Teaching modeling in SysML/UML and problems encounteredKruus, Helena; Robal, Tarmo; Jervan, GertProceedings of the 25th International Conference on European Association for Education in Electrical and Information Engineering : 30 May-June 2014, Cesme, Türkiye2014 / p. 33-36 : ill

Teaduspreemia laureaadi sõnavõtt : [teaduspreemiate üleandmisel]Ubar, Raimund-JohannesEesti Vabariigi preemiad 2016 : teadus. F. J. Wiedemanni keeleauhind. Kultuur. Sport2016 / lk. 20-21

Teaduspreemia pikaajalise tulemusliku teadus- ja arendustöö eest : Raimund UbarUbar, Raimund-JohannesEesti Vabariigi preemiad 2016 : teadus. F. J. Wiedemanni keeleauhind. Kultuur. Sport2016 / lk. 34-61 : fot., portr

Tenniseharrastus Tallinna tehnikaülikoolis. Tennis on au sees : [kommenteerivad Tauno Otto ja Viveeth Govind]Sulling, Andres; Otto, Tauno; Govind, VineethMente et Manu2013 / lk. 26-27 : fot

10th IEEE European Test SymposiumUbar, Raimund-Johannes; Prinetto, Paolo; Raik, JaanIEEE journal of design & test of computers2005 / p. 480-481 : phot http://dx.doi.org/10.1109/MDT.2005.106

Test configurations for diagnosing faulty links in NoC switchesRaik, Jaan; Ubar, Raimund-Johannes; Govind, Vineeth12th IEEE European Test Symposium ETS 2007 : 20-24 May 2007, Freiburg, Germany : proceedings2007 / p. 29-34 : ill http://dx.doi.org/10.1109/ETS.2007.41

The benefits of self-awareness and attention in fog and mist computingPreden, Jürgo-Sören; Tammemäe, Kalle; Jantsch, Axel; Leier, Mairo; Riid, Andri; Calis, EmineComputer2015 / p. 37-45 : ill

The most prominent software development concepts cited in IT professionals' blogsOjastu, Deniss; Robal, Tarmo; Kalja, AhtoPerspectives in business informatics research : 14th International Conference, BIR 2015, Tartu, Estonia, August 26-28, 2015 : proceedings2015 / p. 197-212 http://dx.doi.org/10.1007/978-3-319-21915-8_13

The synthesis level in Bloom's taxonomy - a nightmare for an LMSWuttke, Heinz-Dietrich; Ubar, Raimund-Johannes; Henke, Karsten; Jutman, Artur19th EAEEIE Annual Conference : June 29-July 2, 2008, Tallinn, Estonia : formal proceedings2008 / p. 199-204 : ill http://dx.doi.org/10.1109/EAEEIE.2008.4610186

3D parallel fault simulationGorev, Maksim; Ubar, Raimund-JohannesProceedings of the 8th Annual Conference of the Estonian National Doctoral School in Information and Communication Technologies : December 5-6, 2014, Rakvere2014 / p. 39-42 : ill

3D routing model in WSN networkMosidze, VakhtangDoctoral School in Information and Communication Technology : proceedings of doctoral session of BEC 2014 : October 6-8 2014, Laulasmaa2014 / p. 11-14 : ill

Tippteadus ja ülikoolUbar, Raimund-JohannesMente et Manu2014 / lk. 11-15 : fot https://artiklid.elnet.ee/record=b2705056*est

Tippteadus ja ülikoolUbar, Raimund-JohannesTeadusmõte Eestis (VIII). Teaduskultuur : [artiklikogumik]2013 / lk. 46-53 : portr

Tools and Techniques for event log analysisVaarandi, Risto2005 https://www.ester.ee/record=b2045293*est

Towards adaptive web - analysing and recommending web users' behaviour = Veebikasutajate käitumise analüüs ja soovitused adaptiivse veebi loomiseksRobal, Tarmo2012 https://www.ester.ee/record=b2862251*est

TPI-s kasutatavatest programmidest õppeinfo tõõtlemiselAit, OlevIII vabariiklik teaduslik-metoodiline konverents "Õppetöö teaduslik organiseerimine", Kääriku, 24.-25. oktoober 1973. : materjalid1973 / lk. 128-132 https://www.ester.ee/record=b1324071*est

Transition delay fault simulation with parallel critical path back-tracing and 7-valued algebraKõusaar, Jaak; Ubar, Raimund-Johannes; Devadze, Sergei; Raik, JaanMicroprocessors and microsystems2015 / p. 1130-1138 : ill http://dx.doi.org/10.1016/j.micpro.2015.05.003

TransMem : a memory architecture to support dynamic remapping and parallelism in low power high performance CGRAsTajammul, Muhammad Adeel; Jafri, Syed Mohammad Asad Hassan; Hemani, Ahmed; Ellervee, Peeter2016 26th International Workshop on Power and Timing Modeling, Optimization and Simulation : PATMOS 2016 : September, 21st to 23th 2016, Bremen, Germany : proceedings2016 / p. 92-99 : ill https://doi.org/10.1109/PATMOS.2016.7833431

TTÜ doktorant Mairo Leier: "Ma motiveerin iseennast, tehes seda, mis mulle meeldib."Leier, MairoStudioosus2015 / lk. 8-9 https://www.ester.ee/record=b1558644*est

Ultra fast parallel fault analysis on structurally synthesized BDDsUbar, Raimund-Johannes; Devadze, Sergei; Raik, Jaan; Jutman, Artur12th IEEE European Test Symposium ETS 2007 : 20-24 May 2007, Freiburg, Germany : proceedings2007 / p. 131-136 : ill http://dx.doi.org/10.1109/ETS.2007.43

Untestable fault identification in sequential circuits using model-checkingRaik, Jaan; Fujiwara, Hideo; Ubar, Raimund-Johannes; Krivenko, AnnaProceedings of the 17th Asian Test Symposium ATS 2008 : November 24-27, 2008, Sapporo, Japan2008 / p. 21-26 : ill http://dx.doi.org/10.1109/ATS.2008.22

Using mobile technology to enhance teaching reconfigurable systemsSkliarova, Iouliia; Sklyarov, Valery; Sudnitsõn, Aleksander; Kruus, MargusProceedings of 2013 IEEE International Conference on Teaching, Assessment and Learning for Engineering (TALE)2013 / p. 478-483 : ill

Using simulation statistics for bug localization in RTL designsTihhomirov, Valentin; Jenihhin, Maksim; Raik, JaanInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK seitsmenda aastakonverentsi artiklite kogumik : 15.-16. novembril 2013, Haapsalu2013 / p. 107-110 : ill

Uurimistoetuse juhend ja vormidUbar, Raimund-Johannes1995 https://www.ester.ee/record=b1067614*est

Web-based applet for teaching boundary scan standard IEEE 1149.1Jutman, Artur; Sudnitsõn, Aleksander; Ubar, Raimund-JohannesProceedings of the 10th International Conference : Mixed Design of Integrated Circuits and Systems : MIXDES 2003 : Lodz, Poland, 26-28 June 20032003 / p. 584-589 : ill

Web-based framework for distributed remote laboratory in the field of digital system testIvask, Eero; Jutman, Artur; Raik, Jaan; Ubar, Raimund-Johannes19th EAEEIE Annual Conference : June 29-July 2, 2008, Tallinn, Estonia : formal proceedings2008 / p. 182-187 : ill http://dx.doi.org/10.1109/EAEEIE.2008.4610183

Web-based software package for e-learning and research training in digital system designJutman, Artur; Kruus, Margus; Sudnitsõn, Aleksander; Ubar, Raimund-Johannes; Wuttke, Heinz-DietrichИнформационные технологии в науке, образовании, телекоммуникации и бизнесе : Материалы XXXII  Международной конференции IT+SE'2005 : Украина, Крым, Ялта-Гурзуф, 19-28 мая 2005 г2005 / [2] p

Verification and error correction on High-Level Decision DiagramsKarputkin, Anton2013

Verification formelle des resultats de la synthese de Haut Niveau : [doktoriväitekiri]Dušina, Julia1999

VHDL design debug framework based on zamiaCADTihhomirov, Valentin; Tšepurov, Anton; Saif Abrar, Syed; Jenihhin, Maksim; Raik, JaanDATE 2013 : Design Automation and Test in Europe, March 18-22, 2013, Grenoble, France2013 / [1] p. : ill

Virtual reconfigurable scan-chains on FPGAs for optimized board testAleksejev, Igor; Jutman, Artur; Devadze, Sergei; Shibin, Konstantin2015 16th Latin American Test Symposium (LATS 2015) : Puerto Vallarta, Mexico, 25-27 March 20152015 / [6] p. : ill http://dx.doi.org/10.1109/LATW.2015.7102411

Ülikooli ülimaks sihiks on teenida oma rahvast : [kõne rektoriks nimetamisel]Keevallik, AndresTehnikaülikool2000 / 20. märts, lk. 6-7 : portr https://www.ester.ee/record=b5309277*est

Декомпозиционный синтез управляющих автоматов на программируемых матрицах и микропроцессорах : диссертация на соискание ученой степени кандидата кандидата технических наукSudnitsõn, Aleksander1983 https://www.ester.ee/record=b4634419*est

Построение тестов для неисправностей комбинационных схем на основе анализа ортогональных дизъюнктивных нормальных форм, представляемых альтернативными графамиMatrosova, A.Yu.; Pleshkov, A.G.; Ubar, Raimund-JohannesАвтоматика и телемеханика2005 / с. 158-174 : ил http://mi.mathnet.ru/at1333

Применение ЭВМ ЕС-1020 при выполнении лабораторных работ по курсу "Физика горных пород. Горное давление"Kripsaar, Ervin; Zelimhanova, LarissaОпыт применения технических средств в учебном процессе : тезисы докладов VI зональной научно-методической конференции преподавателей вузов республик Прибалтики, БССР и Калининградской области РСФСР1986 / с. 178-179 https://www.ester.ee/record=b2856606*est

Раймунд Убар: ученые делают свое дело, политики - свое : [интервью с Р. Убаром]Ubar, Raimund-JohannesБосс : бизнес, организаця, стратегия, системы2012 / с. 57-58 : ил