Post-silicon validation of IEEE 1687 reconfigurable scan networksDamljanovic, Aleksa; Jutman, Artur; Squillero, Giovanni; Tšertov, Anton2019 IEEE European Test Symposium (ETS) : proceedings2019 / 6 p. : ill https://doi.org/10.1109/ETS.2019.8791546

Simulation-based equivalence checking between IEEE 1687 ICL and RTLDamljanovic, Aleksa; Jutman, Artur; Portolan, Michele; Tšertov, Anton2019 IEEE International Test Conference (ITC)2019 / paper. 7.3, 8 p. : ill https://doi.org/10.1109/ITC44170.2019.9000181