High-Level Implementation-Independent Functional Software-Based Self-Test for RISC ProcessorsOyeniran, Adeboye Stephen; Ubar, Raimund-Johannes; Jenihhin, Maksim; Raik, JaanJournal of electronic testing : theory and applications2020 / p. 87-103 https://doi.org/10.1007/s10836-020-05856-7

Mixed-level identification of fault redundancy in microprocessorsOyeniran, Adeboye Stephen; Ubar, Raimund-Johannes; Jenihhin, Maksim; Gürsoy, Cemil Cem; Raik, JaanLATS 2019 : 20th IEEE Latin American Test Symposium : Santiago, Chile,
March 11th - 13th 20192019 / 6 p. : ill https://doi.org/10.1109/LATW.2019.8704591