On BTI aging rejuvenation in memory address decodersGürsoy, Cemil Cem; Kraak, Daniel; Ahmed, Foisal; Taouil, Mottaqiallah; Jenihhin, Maksim; Hamdioui, Said2022 IEEE 23rd Latin American Test Symposium, LATS 20222022 / Code 184360 https://doi.org/10.1109/LATS57337.2022.9936940

Software-based mitigation for memory address decoder agingKraak, D. H. P.; Gürsoy, Cemil Cem; Jenihhin, Maksim; Raik, JaanLATS 2019 : 20th IEEE Latin American Test Symposium : Santiago, Chile, March 11th - 13th 20192019 / 6 p. : ill https://doi.org/10.1109/LATW.2019.8704595