Conductivity conversion in CdTe layersValdna, Vello; Buschmann, Felix; Mellikov, EnnJournal of crystal growth1996 / p. 164-167: ill

Influence of point defects on physical qualities of semiconductorsAltosaar, Mare; Buschmann, Felix; Erm, Ants; Krustok, Jüri; Kukk, Peeter-Enn; Lõo, A.; Mädasson, Jaan; Tomson, A.Journal of materials and product. technology1991

Photometric detectors for chemical control equipmentBuschmann, Felix; Mädasson, JaanChair of Semiconductor Materials Technology : activity report, 1988-19931994 / p. 27