Combining functional and structural approaches in test generation for digital systemsUbar, Raimund-JohannesMicroelectronics reliability1998 / 3, p. 317-329 : ill

Design error diagnosis in digital circuits with stuck-at fault modelJutman, Artur; Ubar, Raimund-JohannesMicroelectronics reliability2000 / 2, p. 307-320 : ill

Fast identification of true critical paths in sequential circuitsUbar, Raimund-Johannes; Kostin, Sergei; Jenihhin, Maksim; Raik, Jaan; Jürimägi, LembitMicroelectronics reliability2018 / p. 252-261 : ill https://doi.org/10.1016/j.microrel.2017.11.027 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

Hierarchical test generation for combinational circuits with real defects coverageCibakova, Tatiana; Fischerova, Maria; Gramatova, Elena; Kuzmicz, W.; Pleskacz, Witold A.; Raik, Jaan; Ubar, Raimund-JohannesMicroelectronics reliability2002 / p. 1141-1149 : ill

Mission profile resolution impacts on the thermal stress and reliability of power devices in PV invertersSangwongwanich, Ariya; Zhou, D.; Liivik, Elizaveta; Blaabjerg, FredeMicroelectronics reliability2018 / p. 1003-1007 https://doi.org/10.1016/j.microrel.2018.06.094

Probabilistic analysis of CMOS physical defects in VLSI circuits for test coverage improvementBlyzniuk, M.; Kazymyra, I.; Kuzmicz, W.; Pleskacz, Witold A.; Raik, Jaan; Ubar, Raimund-JohannesMicroelectronics reliability2001 / p. 2023-2040 : ill

Verifying cache architecture vulnerabilities using a formal security verification flowGhasempouri, Tara; Raik, Jaan; Paul, Kolin; Reinbrecht, Cezar; Hamdioui, Said; Taouil, MottaqiallahMicroelectronics reliability2021 / art. 114085 https://doi.org/10.1016/j.microrel.2021.114085 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS