A CAD system for teaching digital testUbar, Raimund-Johannes; Ivask, Eero; Paomets, Priidu; Raik, JaanBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 369-372: ill

Collaborative distributed computing in the field of digital electronics testingIvask, Eero; Devadze, Sergei; Ubar, Raimund-JohannesBalanced Automation Systems for Future Manufacturing Networks : 9th IFIP WG 5.5 International Conference : BASYS 2010 : Valencia, Spain, July 21-23, 2010 : proceedings2010 / p. 145-152

Collaborative distributed fault simulation for digital electronic circuitsIvask, Eero; Devadze, Sergei; Ubar, Raimund-JohannesIntelligent Distributed Computing IV : proceedings of the 4th International Symposium on Intelligent Distributed Computing - IDC 2010 : Tangier, Morocco, September 20102010 / p. 67-76

Comparison of genetic and random techniques for test pattern generationIvask, Eero; Raik, Jaan; Ubar, Raimund-JohannesBEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings1998 / p. 163-166: ill

Defect-oriented mixed-level fault simulation in digital systemsUbar, Raimund-Johannes; Raik, Jaan; Ivask, Eero; Brik, MarinaFacta Universitatis [Niš]. Series electronics and energetics2002 / 1, April, p. 123-136 : ill

Defect-oriented test generation and fault simulation in the environment of MOSCITOSchneider, Andre; Diener, Karl-Heinz; Gramatova, Elena; Fisherova, Maria; Ivask, Eero; Ubar, Raimund-Johannes; Pleskacz, Witold A.; Kuzmicz, W.BEC 2002 : proceedings of the 8th Biennial Baltic Electronics Conference : October 6-9, 2002, Tallinn, Estonia2002 / p. 303-306 : ill

Digital design flow with test activitiesDiener, Karl-Heinz; Elst, G.; Ivask, Eero; Jervan, Gert; Peng, Z.; Raik, Jaan; Ubar, Raimund-JohannesVILAB User Forum2000 / [11] p

Digital test in WEB-based environmentIvask, Eero2006 https://www.ester.ee/record=b2158119*est

Distributed approach for genetic test generation in the field of digital electronicsIvask, Eero; Raik, Jaan; Ubar, Raimund-JohannesIntelligent Distributed Computing, Systems and Applications : proceedings of the 2nd International Symposium on Intelligent Distributed Computing : IDC 2008 : Catania, Italy, 20082008 / p. 127-136

Distributed approach for parallel exact critical path tracing fault simulationIvask, Eero; Devadze, Sergei; Ubar, Raimund-JohannesMIXDES 2010 : 17th International Conference "Mixed Design of Integrated Circuits and Systems" : June 24-26, 2010, Wroclaw, Poland2010 / p. 471-476 : ill

Distributed approach for parallel exact critical path tracing fault simulationIvask, Eero; Devadze, Sergei; Ubar, Raimund-JohannesInternational journal of microelectronics and computer science2010 / p. 165-174 : ill

Distributed fault simulation with collaborative load balancing for VLSI circuitsIvask, Eero; Devadze, Sergei; Ubar, Raimund-JohannesScalable computing : practice and experience2011 / p. 153-163 : ill

Fault oriented test pattern generation for sequential circuits using Genetic AlgorithmsIvask, Eero; Raik, Jaan; Ubar, Raimund-JohannesThe 7th Biennial Conference on Electronics and Microsystem Technology "Baltic Electronics Conference" : BEC 2000 : October 8 - 11, 2000, Tallinn, Estonia : conference proceedings2000 / p. 129-132 : ill

Fault oriented test pattern generation for sequential circuits using genetic algorithmsIvask, Eero; Raik, Jaan; Ubar, Raimund-JohannesIEEE European Test Workshop2000 / p. 319-320

FPGA design flow with automated test generationElst, G.; Diener, Karl-Heinz; Ivask, Eero; Raik, Jaan; Ubar, Raimund-JohannesProc. of German 11th Workshop on Test Technology and Reliability of Circuits and Systems : Potsdam, 19991999 / p. 120-123

GA-based test generation for sequential circuitsBrik, Marina; Raik, Jaan; Ubar, Raimund-Johannes; Ivask, EeroProceedings of East–West Design & Test Workshop (EWDTW’04) : Yalta, Alushta, Crimea, Ukraine, September 23-26, 20042004 / p. 30-34

Geneetilised algoritmidIvask, EeroA & A1999 / 1, lk. 33-39: ill

Hierarchical fault simulation in digital systemsUbar, Raimund-Johannes; Raik, Jaan; Ivask, Eero; Brik, MarinaInternational Symposium on Signals, Circuits and Systems : SCS 2001 : July 10-11, 2001, Iasi, Romania : proceedings2001 / p. 181-184 : ill

Improved VHDL input for high-level synthesis tool xTractorEllervee, Peeter; Ivask, Eero; Kruus, MargusBEC 2006 : 2006 International Baltic Electronics Conference : Tallinn University of Technology, October 2-4, 2006, Tallinn, Estonia : proceedings of the 10th Biennial Baltic Electronics Conference2006 / p. 87-90 : ill

Integrated design and test generation under Internet based environment MOSCITOSchneider, Andre; Ivask, Eero; Ubar, Raimund-JohannesEuromicro Symposium on Digital System Design : Architectures, Methods and Tools : September 4-6, 2002, Dortmund, Germany : proceedings2002 / p. 187-194 : ill http://dx.doi.org/10.1109/DSD.2002.1115368

Integration of digital test tools to the internet-based environment MOSCITOSchneider, Andre; Diener, Karl-Heinz; Elst, Günter; Ivask, Eero; Raik, Jaan; Ubar, Raimund-JohannesSCI 2003 : the 7th World Multiconference on Systemics, Cybernetics and Informatics : July 27-30, 2003, Orlando, Florida, USA : proceedings. Volume VIII, Applications of Informatics and Cybernetics in Science and Engineering2003 / p. 136-141 : ill

Internet based test generation and fault simulationIvask, Eero; Ubar, Raimund-Johannes; Raik, Jaan; Schneider, AndreIEEE Design and Diagnostics of Electronic Circuits and Systems - IEEE DDECS 2001 : Fourth International Workshop on IEEE Design and Diagnostics of Electronic Circuits and Systems : Györ, Hungary, April 18-20, 20012001 / p. 57-60 : ill

Internet-based collaborative test generation with MOSCITO [Electronic resource]Schneider, Andre; Ivask, Eero; Miklos, P.; Raik, Jaan; Diener, Karl-Heinz; Ubar, Raimund-Johannes; Cibakova, Tatiana; Gramatova, ElenaSIGDA publications on CD-ROM : DATE'02 : Design, Automation and Test in Europe, Paris, France, March 4-8, 20022002 / [6] p. [CD-ROM]

Internet-based testability-driven test generation in the virtual environment MOSCITOSchneider, Andre; Diener, Karl-Heinz; Elst, G.; Ivask, Eero; Raik, Jaan; Ubar, Raimund-JohannesInternational Federation for Information Processing IFIP : International Workshop on IP-Based SoC Design 2002 : proceedings : Grenoble, October 30-31, 20022002 / p. 357-362 : ill http://publica.fraunhofer.de/dokumente/N-287433.html

Internet-basierter Systementwurf mit MOSCITOSchneider, Andre; Schneider, Peter; Gramatova, Elena; Ivask, EeroEntwurf Integrierter Schaltungen : 10. E.I.S.-Workshop : Präsentationen der ITG-Fachtagung : vom 3. bis 5. April 2001 in Dresden2001 / S. 295-296 : Ill

Low-cost CAD system for teaching digital testUbar, Raimund-Johannes; Raik, Jaan; Paomets, Priidu; Ivask, Eero; Jervan, Gert; Markus, AnttiMicroelectronics education : proceedings of the European Workshop, Grenoble, France, 5-6 Feb 19961996 / p. 185-188

Mapping of VHDL structures for generic EDA database format IRSYDIvask, Eero; Ellervee, PeeterThe 7th Biennial Conference on Electronics and Microsystem Technology "Baltic Electronics Conference" : BEC 2000 : October 8 - 11, 2000, Tallinn, Estonia : conference proceedings2000 / p. 317-320 : ill

Mixed-level defect simulation in data-paths of digital systemsUbar, Raimund-Johannes; Raik, Jaan; Ivask, Eero; Brik, Marina23rd International Conference on Microelectronics : MIEL 2002, Niš, Yugoslavia, 12-15 May 2002 : proceedings. Volume 22002 / p. 617-620 : ill

Multi-level fault simulation of digital systems on decision diagramsUbar, Raimund-Johannes; Raik, Jaan; Ivask, Eero; Brik, MarinaThe First IEEE International Workshop on Electronic Design, Test and Applications : DELTA 2002, 29-31 January 2002, Christchurch, New Zealand : proceedings2002 / p. 86-91 : ill

Nädal Hannoveri rahvusvahelisel tööstusmessilIvask, Eero; Põldre, JüriTehnikaülikool1998 / 25. mai, lk. 8-9: ill

On using genetic algorithm for test generationBrik, Marina; Raik, Jaan; Ubar, Raimund-Johannes; Ivask, EeroBEC 2004 : proceedings of the 9th Biennial Baltic Electronics Conference : October 3-6, 2004, Tallinn, Estonia2004 / p. 233-236 : ill

Research environment for teaching digital testIvask, Eero; Jutman, Artur; Orasson, Elmet; Raik, Jaan; Ubar, Raimund-Johannes; Wuttke, Heinz-DietrichSynergies between Information and Automation : 49. Internationales Wissenschaftliches Kolloquium, 27.-30.9.2004, Technische Universität Ilmenau, Germany. Volume 22004 / p. 468-473 : ill

Test cover calculation in digital systems with word-level decision diagramsUbar, Raimund-Johannes; Raik, Jaan; Ivask, Eero; Brik, MarinaВестник Томского государственного университета2002 / с. 315-319 : ил

Turbo tester - diagnostic package for research and trainingAarna, Margit; Ivask, Eero; Jutman, Artur; Orasson, Elmet; Raik, Jaan; Ubar, Raimund-Johannes; Vislogubov, Vladislav; Wuttke, Heinz-DietrichRadioelectronics and informatics2003 / p. 69-73 : ill

Web-based environment for digital electronics test toolsIvask, Eero; Raik, Jaan; Ubar, Raimund-Johannes; Schneider, AndreVirtual Enterprises and collaborative networks : IFIP 18th World Computer Congress [and] TC5/WG5.5 - 5th Working Conference on Virtual Enterprises : 22-27 August 2004, Toulouse, France2004 / p. 435-442 : ill

Web-based framework for distributed remote laboratory in the field of digital system testIvask, Eero; Jutman, Artur; Raik, Jaan; Ubar, Raimund-Johannes19th EAEEIE Annual Conference : June 29-July 2, 2008, Tallinn, Estonia : formal proceedings2008 / p. 182-187 : ill http://dx.doi.org/10.1109/EAEEIE.2008.4610183

Web-based framework for parallel distributed test [Electronic resource]Ivask, Eero; Raik, Jaan; Ubar, Raimund-Johannes2008 IEEE Design and Diagnostics of Electronic Circuits and Systems : Bratislava, Slovakia, April 16-18, 20082008 / p. 271-274 : ill. [CD-ROM]

VHDL front-end for high-level synthesis tool xTractorIvask, Eero; Ellervee, PeeterBEC 2004 : proceedings of the 9th Biennial Baltic Electronics Conference : October 3-6, 2004, Tallinn, Estonia2004 / p. 111-114 : ill

VILAB test generation tools running under the MOSCITO systemSchneider, Andre; Ivask, Eero; Raik, Jaan; Ubar, Raimund-JohannesVILAB User Forum : Györ, Hungary, 20012001 / [12] p