Failure prediction of power devices under reverse surge current conditionsFreidin, Boris; Velmre, Enn; Udal, AndresISPSD’92 : Proceedings of the 4th International Symposium on Power Semiconductor Devices & Ics, Waseda University, Tokyo, Japan, 19-21 May 19921992 / p. 118-123: fig https://doi.org//10.1109/ISPSD.1992.991247

Simulations of wide bandgap SiC N-N heterostructure diodePatankar, Udayan Sunil; Koel, Ants; Pardy, Tamas2020 IEEE International Conference on Consumer Electronics (ICCE), Las Vegas, NV, USA, January 4-6, 20202020 / 4 p https://doi.org/10.1109/ICCE46568.2020.9043130