Bidirectional solid-state DC circuit breaker for the protection of cesidential and Commercial DC buildingsAditya, P.; Yagna, V.; Banoth, T.; Chub, Andrii; Banavath, Satish Naik2023 IEEE 8th Southern Power Electronics Conference and 17th Brazilian Power Electronics Conference (SPEC/COBEP)2023 / 6 p https://doi.org/10.1109/SPEC56436.2023.10407460 Comparison of (N+1) redundancy and fault tolerance approaches in single-stage series-connected isolated MVAC to LVDC convertersBakeer, Abualkasim Ahmed Ali; Chub, Andrii; Blinov, Andrei; Bayhan, Sertac; Vinnikov, Dmitri2023 International Conference on Clean Electrical Power (ICCEP)2023 / p. 469-474 : ill https://doi.org/10.1109/ICCEP57914.2023.10247478 Optimization and experimentation of fault-tolerant Field Excited Linear Flux Switching Machine with concentrated and toroidal windings for rail transportation systemHussain, Shahid; Khan, Faisal; Ullah, Wasiq; Ullah, Basharat; Khan, BakhtiarIEEE transactions on industry applications2023 / p. 1361−1371 https://doi.org/10.1109/TIA.2022.3223341 Representing gate-level SET faults by multiple SEU faults on RT-levelBagbaba, Ahmet Cagri; Jenihhin, Maksim; Ubar, Raimund-Johannes; Sauer, Christian2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS), 13-15 July 2020 : proceedings2020 / art. 19889351, 6 p. : ill https://doi.org/10.1109/IOLTS50870.2020.9159715 RESCUE: interdependent challenges of reliability, security and quality in nanoelectronic systemsJenihhin, Maksim; Raik, Jaan2020 Design, Automation & Test in Europe Conference & Exhibition (DATE), 9-13 March 2020, Grenoble, France : proceedings2020 / art. 19690741 , 6 p https://doi.org/10.23919/DATE48585.2020.9116558 Short-circuit fault detection and remedial in full-bridge rectifier of series resonant DC-DC converter based on inductor voltage signatureBakeer, Abualkasim Ahmed Ali; Chub, Andrii; Vinnikov, Dmitri2020 IEEE 61st International Scientific Conference on Power and Electrical Engineering of Riga Technical University (RTUCON), Riga, Latvia, Nov. 5-7, 2020 : conference proceedings2020 / 6 p. : ill https://doi.org/10.1109/RTUCON51174.2020.9316482 Tehissüsteemide veakindlusest : [TTÜ arvutitehnika instituudi teadustöödest]Ubar, Raimund-JohannesHorisont2006 / 2, lk. 64-69 : ill Usaldusväärsus ja veakindlus infohankesüsteemidesMüürsepp, IvoA & A2011 / 2, lk. 28-46 : ill