Design obfuscation versus testFarahmandi, Farimah; Sinanoglu, Ozgur; Blanton, Ronald; Pagliarini, Samuel Nascimento2020 IEEE European Test Symposium (ETS) : ETS 2020, May 25 - 29, 2020, Tallinn, Estonia2020 / 10 p https://doi.org/10.1109/ETS48528.2020.9131590

An overview of FPGA-inspired obfuscation techniquesAbideen, Zain Ul; Gokulanathan, Sumathi; Aljafar, Muayad J.; Pagliarini, Samuel NascimentoarXiv.org2023 / 30 p. : ill https://doi.org/10.48550/arXiv.2305.15999