JÄNES : a NAS framework for ML-based EDA applicationsSelg, Hardi; Jenihhin, Maksim; Ellervee, PeeterIEEE International Symposium on Defect and Fault Tolerance in VLSI Systems2021 https://doi.org/10.1109/DFT52944.2021.9568321

Keynote: cost-efficient reliability for Edge-AI chipsJenihhin, Maksim; Taheri, Mahdi; Cherezova, Natalia; Ahmadilivani, Mohammad Hasan; Selg, Hardi; Jutman, Artur; Shibin, Konstantin; Tsertov, Anton; Devadze, Sergei; Kodamanchili, Rama Mounika; Rafiq, Ahsan; Raik, Jaan; Daneshtalab, Masoud2024 IEEE 25th Latin American Test Symposium (LATS)2024 https://doi.org/10.1109/LATS62223.2024.10534610 Article at Scopus

Special session: in-field ML-assisted intermittent fault localization and management in RISC-V SoCsSelg, Hardi; Shibin, Konstantin; Tsertov, Anton; Jenihhin, Maksim; Ellervee, Peeter; Raik, Jaan2024 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)2024 https://doi.org/10.1109/DFT63277.2024.10753541 Article at Scopus

Wafer-level die re-test success prediction using machine learningSelg, Hardi; Jenihhin, Maksim; Ellervee, Peeter21st IEEE Latin-American Test Symposium (LATS) 2020 : proceedings2020 / 5 p https://doi.org/10.1109/LATS49555.2020.9093672