A DFT scheme to improve coverage of hard-to-detect faults in FinFET SRAMsCardoso Medeiros, Guilherme; Gürsoy, Cemil Cem; Fieback, Moritz; Wu, Lizhou; Jenihhin, Maksim; Taouil, Mottaqiallah; Hamdioui, Said2020 Design, Automation & Test in Europe Conference & Exhibition (DATE), 9-13 March 2020, Grenoble, France : proceedings2020 / p. 792-797 https://doi.org/10.23919/DATE48585.2020.9116278

ETS 2025 ForewordJutman, Artur; Raik, Jan; SonzaReorda, Matteo; Virazel, Arnaud; Voyiatzis, Ioannis; Soudris, Dimitrios; Taouil, Mottaqiallah; Lentaris, Georgios; Jenihhin, Maksim2025 IEEE European Test Symposium (ETS) : ETS 2025 : May 26-30, 2025, Tallinn, Estonia : proceedings2025 / 2 p. https://doi.org/10.1109/ETS63895.2025.11049597 https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11049597 Conference proceedings at Scopus Article at Scopus

LiD-CAT: A lightweight detector for cache ATtacksReinbrecht, Cezar; Hamdioui, Said; Taouil, Mottaqiallah; Niazmand, Behrad; Ghasempouri, Tara; Raik, Jaan; Sepulveda, Johanna2020 IEEE European Test Symposium (ETS) : ETS 2020, May 25-29, 2020
Tallinn, Estonia : proceedings2020 / 6 p. : ill https://doi.org/10.1109/ETS48528.2020.9131603

On BTI aging rejuvenation in memory address decodersGürsoy, Cemil Cem; Kraak, Daniel; Ahmed, Foisal; Taouil, Mottaqiallah; Jenihhin, Maksim; Hamdioui, Said2022 IEEE 23rd Latin American Test Symposium, LATS 20222022 / Code 184360 https://doi.org/10.1109/LATS57337.2022.9936940

Verifying cache architecture vulnerabilities using a formal security verification flowGhasempouri, Tara; Raik, Jaan; Paul, Kolin; Reinbrecht, Cezar; Hamdioui, Said; Taouil, MottaqiallahMicroelectronics reliability2021 / art. 114085 https://doi.org/10.1016/j.microrel.2021.114085 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS