Factors affecting SVI in small scale WWTPsKõrgmaa, Vallo; Kriipsalu, Mait; Tenno, Taavo; Lember, Erki; Kuusik, Argo; Lemmiksoo, Vallo; Pachel, Karin; Iital, ArvoWater science & technology Water science and technology2019 / p. 1766–1776 https://doi.org/10.2166/wst.2019.177 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS GIS-based quantification of future nutrient loads into Lake Peipsi/Chudskoe using qualitative regional development scenariosMouard, D.S.J.; Van der Perk, M.; Gooch, G.D.; Loigu, Enn; Piirimäe, Kristjan; Stalnacke, PerWater science & technology Water science and technology2005 / 3/4, p. 355-363 : ill Is the destabilisation of Lake Peipsi ecosystem caused by increased phosphorus loading or decreased nitrogen loading?Nõges, Tiina; Laugaste, Reet; Loigu, Enn; Nedogarko, I.; Skakalski, Boris; Nõges, PeeterWater science & technology Water science and technology2005 / 3/4, p. 267-274 : ill Monitoring and control of smart urban drainage systems using NB-IoT cellular sensor networksRoosipuu, Priit; Annus, Ivar; Kuusik, Alar; Kändler, Nils; Alam, Muhammad MahtabWater science & technology Water science and technology2023 / p. 339-354 https://doi.org/10.2166/wst.2023.222 Pulsed corona discharge : the role of ozone and hydroxyl radical in aqueous pollutants oxidationPreis, Sergei; Panorel, I.; Kornev, I.; Hatakka, Henry; Kallas, JuhaWater science & technology Water science and technology2013 / p. 1536–1542 https://doi.org/10.2166/wst.2013.399 Removal of hazardous substances in municipal wastewater treatment plantsKõrgmaa, Vallo; Laht, Mailis; Rebane, Riin; Lember, Erki; Pachel, Karin; Kriipsalu, Mait; Tenno, Taavo; Iital, ArvoWater Science & Technology Water science and technology2020 / p. 2011−2022 https://doi.org/10.2166/wst.2020.264 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS Statistical modelling of riverine nutrient sources and retention in the Lake Peipsi drainage basinVassiljev, Anatoli; Stalnacke, PerWater science & technology Water science and technology2005 / 3/4, p. 309-317 : ill