AFM and SEM investigations of ion beam synthesized Mg2Si precipitates in Si substratesAngelov, Christo; Mikli, Valdek; Amov, Blagoj; Goranova, E.Journal of optoelectronics and advanced materials2005 / 1, p. 369-373

Raman scattering characterization of ion-beam synthesized Mg2Si. 1, Influence of the technological conditions on the formation of the Mg2Si in(100) Si matrixAtanassov, Alexander; Zlateva, Genoveva; Baleva, Mitra; Goranova, Ekaterina; Amov, Blagoj; Angelov, Christo; Mikli, ValdekPlasma processes and polymers2006 / 2, p. 219-223 : ill

Solid phase and ion beam epitaxial crystallization of Si implanted with Zn and Pb ionsAngelov, Christo; Georgiev, S.; Amov, Blagoj; Mikli, Valdek; Lohner, TivadorJournal of optoelectronics and advanced materials2007 / 2, p. 311-314 https://www.researchgate.net/publication/289467840_Solid_phase_and_ion_beam_epitaxial_crystallization_of_Si_implanted_with_Zn_and_Pb_ions

Structural investigations of ion beam synthesized [beeta]-FeSi2Angelov, Christo; Amov, Blagoj; Mikli, Valdek; Traksmaa, RainerJournal of optoelectronics and advanced materials2009 / 10, p. 1490-1493 https://www.researchgate.net/publication/286966891_Structural_investigations_of_ion_beam_synthesized_b-FeSi2

Study of ion implanted Fe depth distribution in Si after pulsed ion beam treatmentAngelov, Christo; Georgiev, S.; Amov, Blagoj; Goranova, E.; Mikli, Valdek; Dezsi, I.; Kotai, E.Journal of optoelectronics and advanced materials2007 / 2, p. 307-310 https://www.researchgate.net/publication/289186791_Study_of_the_ion_implanted_Fe_depth_distribution_in_Si_after_pulsed_ion_beam_treatment