APPRAISER : DNN fault resilience analysis employing approximation errorsTaheri, Mahdi; Ahmadilivani, Mohammad Hasan; Jenihhin, Maksim; Raik, Jaan; Daneshtalab, Masoud26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, May 3-5, 2023, Tallinn2023 / p. [?] https://ddecs2023.taltech.ee/

DeepAxe : a framework for exploration of approximation and reliability trade-offs in DNN acceleratorsTaheri, Mahdi; Riazati, Mohamad; Ahmadilivani, Mohammad Hasan; Jenihhin, Maksim; Daneshtalab, Masoud; Raik, Jaan; Sjödin, Mikael; Lisper, BjörnarXiv.org2023 / 8 p. : ill https://doi.org/10.48550/arXiv.2303.0822

A fault-resistant architecture for AES S-box architectureTaheri, Mahdi; Sheikhpour, Saeideh; Ansari, Mohammad Saeed; Mahani, AliJournal of Applied Research in Electrical Engineering2021 / p. 86-92 https://doi.org/10.22055/jaree.2021.36230.1020

A high-performance MEMRISTOR-based Smith-Waterman DNA sequence alignment using FPNI structureTaheri, Mahdi; Zandevakili, Hamed; Mahani, AliJournal of Applied Research in Electrical Engineering2021 / p. 59-68 https://doi.org/10.22055/jaree.2021.36117.1016

A novel fault-tolerant logic style with self-checking capabilityTaheri, Mahdi; Sheikhpour, Saeideh; Mahani, Ali; Jenihhin, MaksimProceedings - 2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design, IOLTS 20222022 / art. 183305 : ill https://doi.org/10.1109/IOLTS56730.2022.9897818