Implementation-independent test generation for a large class of faults in RISC processor modulesJenihhin, Maksim; Oyeniran, Adeboye Stephen; Raik, Jaan; Ubar, Raimund-Johannes24th Euromicro Conference on Digital System Design (DSD)2021 https://doi.org/10.1109/DSD53832.2021.00090

Network-on-ReRAM for scalable processing-in-memory architecture designDabiri, Bita; Modarressi, Mehdi; Daneshtalab, Masoud24th Euromicro Conference on Digital System Design (DSD)2021 https://doi.org/10.1109/DSD53832.2021.00031