Design space exploration of SABER in 65nm ASICImran, Malik; Almeida, Felipe; Raik, Jaan; Basso, Andrea; Roy, Sujoy Sinha; Pagliarini, Samuel NascimentoASHES '21 : proceedings of the 5th Workshop on Attacks and Solutions in Hardware Security2021 / p. 85-90 https://doi.org/10.1145/3474376.3487278

High-level intellectual property obfuscation via decoy constantsAksoy, Levent; Nguyen, Quang-Linh; Almeida, Felipe; Raik, Jaan; Flottes, Marie-Lise; Dupuis, Sophie; Pagliarini, Samuel Nascimento2021 IEEE 27th International Symposium on On-Line Testing and Robust System Design (IOLTS) : Torino, Italy, 28-30 June 20212021 / p. 1-7 https://doi.org/10.1109/IOLTS52814.2021.9486714

High-speed SABER key encapsulation mechanism in 65nm CMOSImran, Malik; Almeida, Felipe; Basso, Andrea; Roy, Sujoy Sinha; Pagliarini, Samuel NascimentoJournal of cryptographic engineering2023 / p. 461-471 : ill https://doi.org/10.1007/s13389-023-00316-2

Hybrid protection of digital FIR filtersAksoy, Levent; Nguyen, Quang-Linh; Almeida, Felipe; Raik, Jaan; Flottes, Marie-Lise; Dupuis, Sophie; Pagliarini, Samuel NascimentoIEEE transactions on Very Large Scale Integration (VLSI) Systems2023 / p. 812-825 : ill https://doi.org/10.1109/TVLSI.2023.3253641 Journal metrics at Scopus

Ransomware attack as Hardware Trojan : a feasibility and demonstration studyAlmeida, Felipe; Imran, Malik; Raik, Jaan; Pagliarini, Samuel NascimentoIEEE Access2022 / p. 44827-44839 https://doi.org/10.1109/ACCESS.2022.3168991 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

Resynthesis-based attacks against logic lockingAlmeida, Felipe; Aksoy, Levent; Nguyen, Quang-Linh; Dupuis, Sophie; Flottes, Marie-Lise; Pagliarini, Samuel Nascimento2023 24th International Symposium on Quality Electronic Design (ISQED) : San Francisco, 5-7 April 20232023 / 8 p. : ill https://doi.org/10.1109/ISQED57927.2023.10129403 Article at Scopus Article at WOS

Side-channel attacks on triple modular redundancy schemesAlmeida, Felipe; Aksoy, Levent; Raik, Jaan; Pagliarini, Samuel Nascimento2021 IEEE 30th Asian Test Symposium ATS 2021 : proceedings2021 / p. 79-84 : ill https://doi.org/10.1109/ATS52891.2021.00026 Conference Proceedings at Scopus Article at Scopus Article at WOS