Evaluating architectural, redundancy, and implementation strategies for radiation hardening of FinFET integrated circuitsPagliarini, Samuel Nascimento; Benites, Luis; Martins, Mayler; Rech, Paolo; Kastensmidt, FernandaIEEE transactions on nuclear science2021 / p. 1045-1053 https://doi.org/10.1109/TNS.2021.3070643 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

High temperature properties of CdTe crystals, doped by SbFochuk, P.; Grill, R.; Nykonyuk, Y.; Krustok, Jüri; Armani, N.; Zakharuk, Z.; Grossberg, Maarja; Panchuk, O.IEEE transactions on nuclear science2007 / 4, p. 763-768