Holistic IJTAG-based external and internal fault monitoring in UAVsAhmed, Foisal; Jenihhin, MaksimarXiv.org2023 / 6 p. : ill https://doi.org/10.48550/arXiv.2303.01816

On BTI aging rejuvenation in memory address decodersGürsoy, Cemil Cem; Kraak, Daniel; Ahmed, Foisal; Taouil, Mottaqiallah; Jenihhin, Maksim; Hamdioui, Said2022 IEEE 23rd Latin American Test Symposium, LATS 20222022 / Code 184360 https://doi.org/10.1109/LATS57337.2022.9936940

A survey on UAV computing platforms : a hardware reliability perspectiveAhmed, Foisal; Jenihhin, MaksimSensors2022 / art. 6286 https://doi.org/10.3390/s22166286 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

Systematic unsupervised recycled field-programmable gate array detectionIsaka, Yuya; Shintani, Michihiro; Ahmed, Foisal; Inoue, MichikoIEEE transactions on device and materials reliability2022 / 10 p. : ill https://doi.org/10.1109/TDMR.2022.3164788 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

Unsupervised recycled FPGA detection using symmetry analysisTarique, Tanvir Ahmad; Ahmed, Foisal; Jenihhin, Maksim; Ali, Liakot12th International Conference on Electrical and Computer Engineering : ICECE 20222022 / p. 437-440 https://doi.org/10.1109/ICECE57408.2022.10088856