Automated identification of application-dependent safe faults in automotive systems-on-a-chipsBagbaba, Ahmet Cagri; Augusto da Silva, Felipe; Sonza Reorda, Matteo; Hamdioui, Said; Jenihhin, Maksim; Sauer, ChristianElectronics2022 / art. 319 https://doi.org/10.3390/electronics11030319 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

Combining fault analysis technologies for ISO26262 functional safety verificationAugusto da Silva, Felipe; Bagbaba, Ahmet Cagri; Hamdioui, Said; Sauer, Christian2019 IEEE 28th Asian Test Symposium (ATS) : 10–13 December 2019, Kolkata, India : proceedings2019 / p. 129–134 : ill https://doi.org/10.1109/ATS47505.2019.00024

Design of Cyber Bio-analytical Physical Systems : formal methods, architectures, and multi-system interaction strategiesAshraf, Kanwal; Le Moullec, Yannick; Pardy, Tamas; Rang, ToomasMicroprocessors and microsystems2023 / art. 104780, 14 p. : ill https://doi.org/10.1016/j.micpro.2023.104780

Determined-safe faults identification : a step towards ISO26262 hardware compliant designsAugusto da Silva, Felipe; Bagbaba, Ahmet Cagri; Sartoni, Sandro; Cantoro, Riccardo; Sonza Reorda, Matteo; Hamdioui, Said; Sauer, Christian2020 25th IEEE European Test Symposium (ETS)2020 / 6 p. : ill https://doi.org/10.1109/ETS48528.2020.9131568

Efficient methodology for ISO26262 functional safety verificationAugusto da Silva, Felipe; Bagbaba, Ahmet Cagri; Hamdioui, Said; Sauer, Christian2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS), 1-3 July 2019, Rhodes, Greece2019 / p. 255-256 https://doi.org/10.1109/IOLTS.2019.8854449

Model checking in planning resource-sharing based manufacturingOtto, Tauno; Vain, JüriInformation Control Problems in Manufacturing 2006 : a proceedings volume from the 12th IFAC International Symposium : St.Etienne, France. 22006 / p. 523-528 https://www.sciencedirect.com/science/article/pii/S1474667015359991

Model checking in planning resource-sharing based manufacturingOtto, Tauno; Vain, Jüri12th IFAC Symposium on Information Control Problems in Manufacturing : preprints. Vol. II, Industrial Engineering2006 / p. 535-540 https://www.sciencedirect.com/science/article/pii/S1474667015359991

Reflection, rewinding, and coin-toss in EasyCryptFirsov, Denis; Unruh, DominiqueCPP 2022 - Proceedings of the 11th ACM SIGPLAN International Conference on Certified Programs and Proofs, co-located with POPL 20222022 / p. 166-179 https://doi.org/10.1145/3497775.3503693