MLC: a machine learning based checker for soft error detection in embedded processorsNosrati, Nooshin; Jenihhin, Maksim; Navabi, ZainalabedinProceedings - 2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design, IOLTS 20222022 / Code 183305 https://doi.org/10.1109/IOLTS56730.2022.9897309 Article at Scopus Article at WOS

A novel fault-tolerant logic style with self-checking capabilityTaheri, Mahdi; Sheikhpour, Saeideh; Mahani, Ali; Jenihhin, MaksimProceedings - 2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design, IOLTS 20222022 / art. 183305 : ill https://doi.org/10.1109/IOLTS56730.2022.9897818