Approaches to extra-functional verification of security and reliability aspects in hardware designs = Riistvaraprojektide turva- ja töökindlusaspektide ekstrafunktsionaalse verifitseerimise lähenemisviisidLai, Xinhui2022 https://doi.org/10.23658/taltech.29/2022 https://digikogu.taltech.ee/et/Item/cff1aeb9-b0b2-49ce-b81a-bfb9dc25fd56 https://www.ester.ee/record=b5502807*est

Early RTL analysis for SCA vulnerability in fuzzy extractors of memory-based PUF enabled devicesLai, Xinhui; Jenihhin, Maksim; Selims, GeorgiosarXiv.org2020 / 6 p. : ill https://doi.org/10.48550/arXiv.2008.08409 https://arxiv.org/abs/2008.08409

On antagonism between side-channel security and soft-error reliability in BNN inference enginesLai, Xinhui; Lange, Thomas; Balakrishnan, Aneesh; Alexandrescu, Dan; Jenihhin, MaksimIFIP/IEEE 29th International Conference on Very Large Scale Integration (VLSI-SoC)2021 / p. 1-6 https://doi.org/10.1109/VLSI-SoC53125.2021.9606981

PASCAL : timing SCA resistant design and verification flowLai, Xinhui; Jenihhin, Maksim; Raik, Jaan; Paul, Kolin2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS 2019) : 1-3 July 2019, Greece2019 / p. 239-242 : ill https://doi.org/10.1109/IOLTS.2019.8854458

RESCUE EDA Toolset for interdependent aspects of reliability, security and quality in nanoelectronic systems designGürsoy, Cemil Cem; Cardoso Medeiros, Guilherme; Chen, Juanho; Balakrishnan, Aneesh; Lai, Xinhui; Bagbaba, Ahmet Cagri; Raik, Jaan; Jenihhin, MaksimDATE 20192019 / 1 p. : ill https://doi.org/10.5281/zenodo.3362529 https://past.date-conference.com/

Towards multidimensional verification : where functional meets non-functionalJenihhin, Maksim; Lai, Xinhui; Ghasempouri, Tara; Raik, Jaan2018 IEEE Nordic Circuits and Systems Conference (NORCAS) : NORCHIP and International Symposium of System-on-Chip (SoC) : 30-31 October 2018, Tallinn, Estonia : proceedings in IEEE Xplore2018 / 7 p. : ill https://doi.org/10.1109/NORCHIP.2018.8573495

Understanding multidimensional verification : where functional meets non-functionalLai, Xinhui; Balakrishnan, Aneesh; Lange, Thomas; Jenihhin, Maksim; Ghasempouri, Tara; Raik, Jaan; Alexandrescu, DanMicroprocessors and microsystems2019 / art. 102867, 13 p. : ill https://doi.org/10.1016/j.micpro.2019.102867 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS