Asynchronous fault detection in IEEE P1687 instrument networkShibin, Konstantin; Devadze, Sergei; Jutman, ArturIEEE 23rd North Atlantic Test Workshop : 14-16 May 2014, Binghampton, New York : proceedings2014 / p. 73-78 : ill

At-speed testing of inter-die connections of 3D-SICs in the presence of shore logicShibin, Konstantin; Chickermane, Vivek; Keller, Brion; Papameletis, Christos; Marinissen, Erik Jan2015 Asian Test Symposium : ATS 2015 : 22-25 November 2015, Mumbai, Maharashtra, India : proceedings2015 / p. 79-84 : ill http://dx.doi.org/10.1109/ATS.2015.21

CMS drift tubes sector collector relocation phase 1 upgrade [Electronic resource]Bedoya, C. F.; Jutman, Artur; Shibin, Konstantin; Devadze, Sergei2015 http://cms.cern.ch/iCMS/jsp/openfile.jsp?type=DN&year=2015&files=DN2015_011.pdf

Designing reliable cyber-physical systemsAleksandrowicz, Gadi; Arbel, Eli; Bloem, Roderick; Devadze, Sergei; Jenihhin, Maksim; Jutman, Artur; Raik, Jaan; Shibin, KonstantinLanguages, design methods, and tools for electronic system design : selected contributions from FDL 20162018 / p. 15-38 : ill https://doi.org/10.1007/978-3-319-62920-9_2 Conference Proceedings at Scopus Article at Scopus

Designing reliable cyber-physical systems : overview associated to the special session at FDL'16Aleksandrowicz, Gadi; Arbel, Eli; Bloem, Roderick; Devadze, Sergei; Jenihhin, Maksim; Jutman, Artur; Raik, Jaan; Shibin, KonstantinThe 2016 Forum on Specification & Design Languages : proceedings : Bremen, Germany, September 14-16, 20162016 / [8] p. : ill https://doi.org/10.1109/FDL.2016.7880382

Effective scalable IEEE 1687 instrumentation network for fault managementJutman, Artur; Shibin, Konstantin; Devadze, SergeiIEEE design & test2013 / p. 26-35 : ill https://doi.org/10.1109/MDAT.2013.2278535 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

Fault management instrumentation network based on IEEE P1687 IJTAGShibin, Konstantin; Jutman, Artur; Devadze, SergeiEuropean Test Symposium (ETS), 2013, Avignon, France2013

Health management for self-aware SoCs based on IEEE 1687 infrastructureShibin, Konstantin; Devadze, Sergei; Jutman, Artur; Grabmann, Martin; Pricken, RobinIEEE Design & Test2017 / p. 27-35 : ill https://doi.org/10.1109/MDAT.2017.2750902 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

IEEE 1687 compliant ecosystem for embedded instrumentation access and in-field health monitoringTšertov, Anton; Jutman, Artur; Shibin, Konstantin; Devadze, SergeiIEEE AUTOTESTCON 2018 : National Harbor, September 17-20, 2018 : proceedings2018 / 9 p.: ill https://doi.org/10.1109/AUTEST.2018.8532559

IEEE P1687 IJTAG demonstrator on FPGAShibin, Konstantin; Aleksejev, Igor; Jutman, Artur; Devadze, SergeiDATE 2012 University Booth : Design Automation and Test in Europe : Dresden, Germany, March 12-16, 20122012 / 1 p. : ill

Integrated modelling, fault management, verification and reliable design environment for cyber-physical systemsRaik, Jaan; Rauwerda, Gerard; Zhao, Yong; Shibin, KonstantinMEDIAN Finale : Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale : November 10-11, 2015, Tallinn, Estonia2015 / p. 74

Keynote: cost-efficient reliability for Edge-AI chipsJenihhin, Maksim; Taheri, Mahdi; Cherezova, Natalia; Ahmadilivani, Mohammad Hasan; Selg, Hardi; Jutman, Artur; Shibin, Konstantin; Tsertov, Anton; Devadze, Sergei; Kodamanchili, Rama Mounika; Rafiq, Ahsan; Raik, Jaan; Daneshtalab, Masoud2024 IEEE 25th Latin American Test Symposium (LATS)2024 https://doi.org/10.1109/LATS62223.2024.10534610 Article at Scopus

On-chip sensors data collection and analysis for SoC health managementShibin, Konstantin; Jenihhin, Maksim; Jutman, Artur; Devadze, Sergei; Tsertov, Anton2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)2023 / 6 p https://doi.org/10.1109/DFT59622.2023.10313562

On-line fault classification and handling in IEEE1687 based fault management system for complex SoCsShibin, Konstantin; Devadze, Sergei; Jutman, ArturLATS 2016 : 17th IEEE Latin-American Test Symposium, Foz do Iguacu, Brazil, 6th-9th April 20162016 / p. 69-74 : ill https://doi.org/10.1109/LATW.2016.7483342

Open-source JTAG simulator bundle for labsShibin, Konstantin; Devadze, Sergei; Rosin, Vjatšeslav; Jutman, Artur; Ubar, Raimund-JohannesInternational journal of electronics and telecommunications2012 / p. 233-239 : ill https://journals.pan.pl/Content/87192/PDF/32.pdf

Optimization of boundary scan tests using FPGA-based efficient scan architecturesAleksejev, Igor; Devadze, Sergei; Jutman, Artur; Shibin, KonstantinJournal of electronic testing : theory and applications (JETTA)2016 / p. 245-255 : ill https://doi.org/10.1007/s10836-016-5588-y Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

Reliable health monitoring and fault management infrastructure based on embedded instrumentation and IEEE 1687Jutman, Artur; Shibin, Konstantin; Devadze, SergeiIEEE AUTOTESTCON 2016 : Anaheim, California, USA, September 12-15, 2016 : proceedings2016 / p. 240-249 : ill https://doi.org/10.1109/AUTEST.2016.7589605

Special session: in-field ML-assisted intermittent fault localization and management in RISC-V SoCsSelg, Hardi; Shibin, Konstantin; Tsertov, Anton; Jenihhin, Maksim; Ellervee, Peeter; Raik, Jaan2024 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)2024 https://doi.org/10.1109/DFT63277.2024.10753541 Article at Scopus

Synchronization, calibration and triggering of IEEE 1687 embedded instrumentsJutman, Artur; Devadze, Sergei; Shibin, KonstantinThe Seventeenth Workshop on RTL and High Level Testing (WRTLT'16) : November 24-25, 2016, Aki Grand Hotel, Hiroshima, Japan2016 / [6] p

System-wide fault management based on IEEE P1687 IJTAGShibin, Konstantin; Jutman, Artur; Devadze, SergeiInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK kuuenda aastakonverentsi artiklite kogumik : 3.-5. oktoobril 2012, Laulasmaa2012 / p. 81-84 : ill

The CMS fast beam condition monitor for HL-LHCAuzinger, G.; Bakhshiansohi, H.; Dabrowski, A.; Delannoy, A.G.; Dierlamm, A.; Dragicevic, M.; Gholami, A.; Gomez, G.; Jenihhin, Maksim; Shibin, KonstantinJournal of instrumentation2024 / art. C03048, 10 p. : ill https://doi.org/10.1088/1748-0221/19/03/C03048 Conference proceedings at Scopus Article at Scopus Conference proceedings at WOS Article at WOS

The optimization, design and performance of the FBCM23 ASIC for the upgraded CMS beam monitoring systemKaplon, Jan; Wegrzyn, Grzegorz; Shibin, Konstantin; Barendregt, MarnixJournal of instrumentation2024 / art. C02026, 6 p. : ill https://doi.org/10.1088/1748-0221/19/02/C02026 Conference proceedings at Scopus Article at Scopus Conference proceedings at WOS Article at WOS

Trainer 1149 : a boundary scan simulation bundle with hardware support for labsShibin, Konstantin; Jutman, ArturInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK viienda aastakonverentsi artiklite kogumik : 25.-26. novembril 2011, Nelijärve2011 / p. 135-138 : ill

Trainer 1149: a boundary scan simulation bundle for labsJutman, Artur; Ubar, Raimund-Johannes; Devadze, Sergei; Shibin, Konstantin; Rosin, VjatšeslavMIXDES 2011 : 18th International Conference "Mixed Design of Integrated Circuits and Systems" : June 16-18, 2011, Gliwice, Poland2011 / p. 520-525

Understanding boundary scan test with Trainer 1149Jutman, Artur; Devadze, Sergei; Shibin, Konstantin; Rosin, Vjatšeslav; Ubar, Raimund-Johannes22nd EAEEIE annual conference : June, 13-15, 2011, Maribor, Slovenija : conference book2011 / p. 21-22 https://ieeexplore.ieee.org/document/6165727

Understanding fault-tolerance vulnerabilities in advanced SoC FPGAs for critical applicationsCherezova, Natalia; Shibin, Konstantin; Jenihhin, Maksim; Jutman, ArturMicroelectronics reliability2023 / art. 115010, 10 p. : ill https://doi.org/10.1016/j.microrel.2023.115010 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

Virtual reconfigurable scan-chains on FPGAs for optimized board testAleksejev, Igor; Jutman, Artur; Devadze, Sergei; Shibin, Konstantin2015 16th Latin American Test Symposium (LATS 2015) : Puerto Vallarta, Mexico, 25-27 March 20152015 / [6] p. : ill http://dx.doi.org/10.1109/LATW.2015.7102411