Automatic distribution of local testers for testing distributed systemsVain, Jüri; Halling, Evelin; Kanter, Gert; Anier, Aivo; Pal, DeepakDatabases and information systems IX : selected papers from the twelfth International Baltic Conference, DB&IS 20162016 / p. 297-310 : ill https://doi.org/10.3233/978-1-61499-714-6-297 Conference Proceedings at Scopus Article at Scopus Article at WOS