Dedicated to the memory of Prof. M. Sheinkman effect of ultrasonic treatment on the defect structure of the Si-SiO2 systemKropman, Daniel; Dolgov, Sergei; Onufrijevs, Pavels; Dauksta, EdvinsGettering and Defect Engineering in Semiconductor Technology XV2014 / p. 352-357 : ill https://doi.org/10.4028/www.scientific.net/SSP.205-206.352 Conference proceedings at Scopus Article at Scopus Conference proceedings at WOS Article at WOS

Effect of ultrasonic treatment on the defect structure of the Si-SiO2 systemKropman, Daniel; Seeman, Viktor; Dolgov, Sergei; Medvids, ArtursPhysica Status Solidi (C) Current Topics in Solid State Physics2016 / p. 793 - 797 https://doi.org/10.1002/pssc.201600052 Journal metrics at Scopus Article at Scopus Article at WOS