A generic synthesizable NoC switch with a scalable testbenchGovind, Vineeth; Raik, Jaan; Ubar, Raimund-JohannesBEC 2006 : 2006 International Baltic Electronics Conference : Tallinn University of Technology, October 2-4, 2006, Tallinn, Estonia : proceedings of the 10th Biennial Baltic Electronics Conference2006 / p. 91-94 : ill

A knowledge-based approach to the specification-based program testingTepandi, JaakComputers and artificial intelligence = Вычислительные машины и искуственный интеллект = Pocitace a umela inteligencia1988 / p. 39-48 https://www.ester.ee/record=b1482459*est

A new measure for calculating multiple fault coverage of microprocessor self-testOyeniran, Adeboye Stephen; Odozi, Uzochukwu Eddie; Ubar, Raimund-JohannesBEC 2016 : 2016 15th Biennial Baltic Electronics Conference : proceedings of the 15th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 3-5, 2016, Tallinn, Estonia2016 / p. 75-78 : ill http://www.ester.ee/record=b2150914*est

A new testability calculation method to guide RTL test generationRaik, Jaan; Nõmmeots, Tanel; Ubar, Raimund-JohannesJournal of electronic testing : theory and applications2005 / 1, p. 71-82 : ill https://link.springer.com/article/10.1007/s10836-005-5288-5

A novel artificial neural networks based automatic adaptive fault detection technique for analog circuitsPetlenkov, Eduard; Jutman, Artur; Nõmm, Sven; Ubar, Raimund-JohannesBEC 2008 : 2008 International Biennial Baltic Electronics Conference : proceedings of the 11th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 6-8, 2008, Tallinn, Estonia2008 / p. 167-170 : ill

A scalable technique to identify true critical paths in sequential circuitsUbar, Raimund-Johannes; Kostin, Sergei; Jenihhin, Maksim; Raik, JaanProceedings 2017 IEEE 20th International Symposium on Design and Diagnotics of Electronic Circuit & Systems(DDECS) : April 19-21, 2017, Dresden, Germany2017 / p. 152-157 : ill https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=7934553

A study of the toxicity of the ozonation products of phenols and chlorophenols by daphnia magna testTrapido, Marina; Veressinina, Jelena23rd Estonian Chemistry Days : abstracts of scientific conference1997 / p. 152

A synthesis-agnostic behavioral fault model for high gate-level fault coverageKarputkin, Anton; Raik, JaanProceedings of the 2016 Design, Automation & Test in Europe Conference & Exhibition (DATE) : 14-18 March 2016, ICC, Dresden, Germany2016 / p. 1124-1127 : ill https://ieeexplore.ieee.org/document/7459477/figures#figures

A tool for random test generation targeting high diagnostic resolutionOsimiry, Emmanuel Ovie; Kostin, Sergei; Raik, Jaan; Ubar, Raimund-JohannesBEC 2016 : 2016 15th Biennial Baltic Electronics Conference : proceedings of the 15th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 3-5, 2016, Tallinn, Estonia2016 / p. 79-82 : ill http://www.ester.ee/record=b2150914*est

A tool set for teaching design-for-testability of digital circuitsKostin, Sergei; Orasson, Elmet; Ubar, Raimund-JohannesEWME 2016 : 11th European Workshop on Microelectronics Education : May 11-13, 2016, Southampton, UK2016 / [6] p. : ill http://dx.doi.org/10.1109/EWME.2016.7496466

Abrasivity study of materials used at abrasive testsKulu, Priit; Veinthal, Renno; Käerdi, Helmo; Tarbe, RihoTribology 2008 : proceedings of the 9th International Tribology Conference : University of Pretoria, South Africa, 2-4 April 20082008 / p. 3.4(1)-3.4(10)

Adaptive Extended Kalman Filter position estimation based on Ultra-Wideband Active-Passive Ranging ProtocolLaadung, Taavi; Ulp, Sander; Fjodorov, Aleksei; Alam, Muhammad Mahtab; Le Moullec, YannickIEEE Access2023 / p. 92575-92588 https://doi.org/10.1109/ACCESS.2023.3308696

Advances in moving speaker acoustic localization for operation in distributed systemsAstapov, Sergei; Berdnikova, Julia; Preden, Jürgo-SörenInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK seitsmenda aastakonverentsi artiklite kogumik : 15.-16. novembril 2013, Haapsalu2013 / p. 9-12 : ill

Air change efficiency of room ventilation unitsMikola, Alo; Rehand, Juhan; Kurnitski, JarekE3S Web of Conferences : CLIMA 2019 Congress, Bucharest, Romania, May 26-29, 20192019 / art. 01017, 8 p https://doi.org/10.1051/e3sconf/201911101017 Conference proceedings at Scopus Article at Scopus

Algorithms of functional level testability analysis for digital circuitsUbar, Raimund-Johannes; Kuchcinski, KtzysztofPeriodica polytechnica. Electrical engineering1992 / 3/4, p. 295-308

An approach for PSL assertion coverage analysis with high-level decision diagramsJenihhin, Maksim; Raik, Jaan; Ubar, Raimund-Johannes; Shchenova, TatjanaProceedings of IEEE East-West Design & Test Symposium (EWDTS'10) : St. Petersburg, Russia, September 17-20, 20102010 / p. 13-16 : ill https://ieeexplore.ieee.org/document/5742048

An approach for verification assertions reuse 2 in RTL test pattern generationJenihhin, Maksim; Raik, Jaan; Ubar, Raimund-Johannes; Viilukas, Taavi; Fujiwara, HideoJournal of Shanghai Normal University : Natural Sciences2010 / p. 441-447 : ill https://www.researchgate.net/publication/240613999_An_Approach_for_Verification_Assertions_Reuse_in_RTL_Test_Pattern_Generation

An approach for verification assertions reuse in RTL test pattern generationJenihhin, Maksim; Raik, Jaan; Fujiwara, Hideo; Ubar, Raimund-Johannes; Viilukas, TaaviDigest of papers : IEEE 11th Workshop on RTL and High Level Testing : WRTLT'10 : December 5-6, 2010, Shanghai, China2010 / p. 107-110 : ill

An aspect-oriented technique to model-based test designSarna, KülliInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK kuuenda aastakonverentsi artiklite kogumik : 3.-5. oktoobril 2012, Laulasmaa2012 / p. 77-80

An external test approach for network-on-a-chip switchesRaik, Jaan; Govind, Vineeth; Ubar, Raimund-Johannes2002-2011 : 20th Anniversary compendium of papers from Asian Test Symposium2011 / p. 185-190 : ill

An external test approach for network-on-a-chip switchesRaik, Jaan; Govind, Vineeth; Ubar, Raimund-JohannesATS '06 : Proceedings of the 15th Asian Test Symposium : November 20-23, 2006, Fukuoka, Japan2006 / p. 437-442 : ill http://dx.doi.org/10.1109/ATS.2006.23

An overview of expert system testing with remarks on distributed architectureParmakson, Priit; Tepandi, JaakProc. of the 11th Int. Scientific School on Distributed Information Systems Architecture, Wroclaw, 28.Jan.-1.Feb., 19901990

Analysis of a test method for delay faults in NoC interconnectsBengtsson, Tomas; Jutman, Artur; Kumar, Shashi; Ubar, Raimund-Johannes; Peng, ZeboProceedings of the IEEE East-West Design & Test Workshop (EWDTW'06) : Sochi, Russia, September 15-19, 20062006 / p. 42-46 : ill

Analysis of a three-phase induction motor using the dynamic state space modelAsad, Bilal; Vaimann, Toomas; Belahcen, Anouar17th International Symposium “Topical Problems in the Field of Electrical and Power Engineering”. Doctoral school of energy and geotechnology. III : Kuressaare, Estonia, January 15-20, 20182018 / p. 65-69 : ill http://ise.elnet.ee/record=b2950017~S2*est

Applicability of the energetic erosion theory to hardened steelsKleis, Ilmar; Remi, ToomasOST-03 Symposium on Machine Design2003 / p. 245-252 : ill

Application of nanoindentation for constituent phases testing in ceramic–metal compositesHussainova, Irina; Jasiuk, Iwona; Hussainov, MedhatTechnical proceedings of the 2010 NSTI Nanotechnology Conference & Expo - Nanotech 2010. Vol. 1, Nanotechnology 2010 : Advanced materials, CNTs, Particles, Films and Composites2010 / p. 152-155 : ill

Application of sequential test set compaction to LFSR reseedingAleksejev, Igor; Jutman, Artur; Raik, Jaan; Ubar, Raimund-Johannes26th Norchip Conference : Tallinn, Estonia, 17-18 November 2008 : formal proceedings2008 / p. 102-107 : ill http://dx.doi.org/10.1109/NORCHP.2008.4738292

Approaches to improve hierarchical ATPG for synchronous sequential circuitsViilukas, TaaviInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK kuuenda aastakonverentsi artiklite kogumik : 3.-5. oktoobril 2012, Laulasmaa2012 / p. 105-108 : ill

Arterial pulse wave analysis during cold pressor test in patients with borderline hypertension [Electronic resource]Hlimonenko, Irina; Meigas, Kalju; Vahisalu, ReinIFMBE proceedings2005 / [5] p. [CD-ROM]

Aspect-oriented model-based testing = Aspekt-orienteeritud mudeli-põhine testimineSarna, Külli2018 https://digi.lib.ttu.ee/i/?11065

Aspect-oriented Model-based testing with UPPAAL timed automataVain, Jüri; Tsiopoulos, Leonidas; Kanter, GertModel and Data Engineering : 10th International Conference, MEDI 2021, Tallinn, Estonia, June 21–23, 2021 : proceedings2021 / p. 117-124 https://doi.org/10.1007/978-3-030-78428-7_10 Conference Proceedings at Scopus Article at Scopus

Aspect-oriented testing of a rehabilitation systemSarna, Külli; Vain, JüriVALID 2014 : the Sixth International Conference on Advances in System Testing and Validation Lifecycle : October 12-16, 2014, Nice, France2014 / p. 73-78 : ill

Assembling low-level tests to high-level symbolic test framesJervan, Gert; Markus, Antti; Raik, Jaan; Ubar, Raimund-JohannesProceedings [of the] 15th NORCHIP Conference, Tallinn, 10-11 November 19971997 / p. 275-280: ill

Assessment of diagnostic test for automated bug localizationTihhomirov, Valentin; Tšepurov, Anton; Jenihhin, Maksim; Raik, Jaan; Ubar, Raimund-JohannesLATW2013 : 14th IEEE Latin-American Test Workshop, Cordoba, Argentina, April 3-5, 2013 : [proceedings]2013 / [6] p. : ill

Assessment of durability of environmentally friendly wood-based panelsKallavus, Urve; Järv, Hele; Kalamees, Targo; Kurik, LembitEnergy procedia2017 / p. 207–212 : ill https://doi.org/10.1016/j.egypro.2017.09.756

Assessment of the potential of lubricated contact condition laboratory testing and surface analysis for improving the performance of machine elements. Comparison of model and real component test methodsAntonov, Maksim; Michalczewski, Remigiusz; Pasaribu, Richard; Piekoszewski, Witold18th International Baltic Conference : Engineering Materials & Tribology : BALTMATTRIB-2009 : October 22-23, 2009, Tallinn, Estonia : abstracts2009 / p. 55

At-speed functional built-in self-test methodology for processors [Electronic resource]Ubar, Raimund-Johannes; Indus, Viljar; Kalmend, OliverProceedings of the IASTED International Conference on Engineering and Applied Science : December 27-29, 2012, Columbo, Sri Lanka2012 / p. 168-172 : ill [CD-ROM]

At-speed self-testing of high-performance pipe-lined processing architectures [Electronic resource]Gorev, Maksim; Ubar, Raimund-Johannes; Ellervee, Peeter; Devadze, Sergei; Raik, Jaan; Min, Mart31st Norchip Conference : Vilnius, Lithuania, 11-12 November 2013 : conference program and papers2013 / p. 1-6 : ill [USB]

At-speed testing and test quality evaluation for high-performance pipelined systems Töökiirusel testimine ja testi kvaliteedi hindamine kõrgjõudlus-konveierarhitektuuriga süsteemideleGorev, Maksim2015 https://digi.lib.ttu.ee/i/?3953

At-speed testing of inter-die connections of 3D-SICs in the presence of shore logicShibin, Konstantin; Chickermane, Vivek; Keller, Brion; Papameletis, Christos; Marinissen, Erik Jan2015 Asian Test Symposium : ATS 2015 : 22-25 November 2015, Mumbai, Maharashtra, India : proceedings2015 / p. 79-84 : ill http://dx.doi.org/10.1109/ATS.2015.21

Automated correction of design errors by edge redirection on high-level decision diagramsKarputkin, Anton; Ubar, Raimund-Johannes; Tombak, Mati; Raik, Jaan13th International Symposium on Quality Electronic Design (ISQED), 20122012 / p. 686-693 : ill https://ieeexplore.ieee.org/document/6113980

Automated software-based in-field self-test program synthesisJasnetski, Artjom; Ubar, Raimund-Johannes; Tšertov, AntonInternational journal of microelectronics and computer science2017 / p. 57-64 : ill

Automated test pattern generator with constraint solverViilukas, Taavi; Raik, JaanInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK neljanda aastakonverentsi artiklite kogumik : 26.-27. novembril 2010, Essu mõis2010 / lk. 33-36

Automated XML-based test modelling for mixed-signal circuitsMellik, AndresBEC 2006 : 2006 International Baltic Electronics Conference : Tallinn University of Technology, October 2-4, 2006, Tallinn, Estonia : proceedings of the 10th Biennial Baltic Electronics Conference2006 / p. 203-204 : ill

Automatic distribution of local testers for testing distributed systemsVain, Jüri; Halling, Evelin; Kanter, Gert; Anier, Aivo; Pal, DeepakDatabases and information systems IX : selected papers from the twelfth International Baltic Conference, DB&IS 20162016 / p. 297-310 : ill http://dx.doi.org/10.3233/978-1-61499-714-6-297

Automatic SoC level test path synthesis based on partial functional modelsTšertov, Anton; Ubar, Raimund-Johannes; Jutman, Artur; Devadze, Sergei2011 Asian Test Symposium (ATS) : New Delhi, India2011 / p. 532-538 https://ieeexplore.ieee.org/document/6114730

Automatic test generation system for VLSIJervan, Gert; Markus, Antti; Raik, Jaan; Ubar, Raimund-JohannesProceedings of the First Electronic Circuits and Systems Conference : Bratislava, Slovakia, September 4-5, 19971997 / p. 255-258

Automation of testing beyond the SoCsTšertov, Anton; Jutman, Artur; Devadze, SergeiInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK neljanda aastakonverentsi artiklite kogumik : 26.-27. novembril 2010, Essu mõis2010 / lk. 29-32 : ill

Automation of the 3-phase induction motor type test place for industrial useKuusk, Leho; Laugis, JuhanBaltic electrical engineering review1998 / 1, p. 10-12

Bbuzz : a Bit-aware fuzzing framework for network protocol systematic reverse engineering and analysisBlumbergs, Bernhards; Vaarandi, RistoMILCOM 2017 - 2017 IEEE Military Communications Conference : Baltimore, Maryland, USA, 23-25 October 20172017 / p. 707-712 https://doi.org/10.1109/MILCOM.2017.8170785

A benchmark suite for evaluating the efficiency of test toolsKruus, Helena; Ubar, Raimund-Johannes; Ellervee, Peeter; Gorev, Maksim; Pesonen, Vadim; Devadze, Sergei; Orasson, Elmet; Brik, Marina; Min, Mart; Annus, Paul; Kruus, Margus; Meigas, KaljuBEC 2012 : 2012 13th Biennial Baltic Electronics Conference : proceedings of the 13th Biennial Baltic Electronics Conference : October 3-5, 2012, Tallinn, Estonia2012 / p. 85-88 : ill

BIST analyzer : a training platform for SoC testing [Electronic resource]Jutman, Artur; Tšertov, Anton; Tšepurov, Anton; Aleksejev, Igor; Ubar, Raimund-Johannes; Wuttke, Heinz-Dietrich37th Annual Frontiers in Education Conference : Global Engineering : Knowledge Without Borders, Opportunities Without Passports : Milwaukee, Wisconsin, October 10-13, 20072007 / p. S3H-8-S3H-13 : ill. [CD-ROM] http://dx.doi.org/10.1109/FIE.2007.4418125

Calculation of probabilistic testability measures for digital circuits with Structurally Synthesized BDDsJürimägi, Lembit; Ubar, Raimund-Johannes; Jenihhin, Maksim; Raik, JaanMicroprocessors and microsystems2020 / art. 103117, 12 p https://doi.org/10.1016/j.micpro.2020.103117 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

Case study in testing digital systemsUbar, Raimund-JohannesBaltic electronics1995 / 1, p. 24-27

Case study-based performance evaluation of reactive planning testerKull, Andres; Raiend, Kullo; Vain, Jüri; Kääramees, MarkoModel-based Testing in Practice : 2nd Workshop on Model-based Testing in Practice(MoTiP 2009) : Enschede, The Netherlands, June 23, 2009 : proceedings2009 / p. 87-96 : ill https://www.etis.ee/Portal/Publications/Display/c507fc75-771f-419a-bf67-571af65fdb66

Circular production, designing, and mechanical testing of polypropylene-based reinforced composite materials : statistical analysis for potential automotive and nuclear applicationsHussain, Abrar; Podgurski, Vitali; Goljandin, Dmitri; Antonov, Maksim; Sergejev, Fjodor; Krasnou, IlliaPolymers2023 / art. 3410, 30 p. : ill https://doi.org/10.3390/polym15163410

Code coverage analysis for concurrent programming languages using high-level decision diagramsJenihhin, Maksim; Raik, Jaan; Tšepurov, Anton; Reinsalu, Uljana; Ubar, Raimund-JohannesProceedings of the 12th European Workshop on Dependable Computing : EWDC 2009 : Toulouse, France, May 14-15, 20092009 / [4] p. : ill https://hal.archives-ouvertes.fr/hal-00381559

Cognitive disorders in patients with chronic kidney disease : specificities of clinical assessmentPepin, Marion; Ferreira, Ana Carina; Arici, Mustafa; Bachmann, Maie; Barbieri, Michelangela; Bumblyte, Inga AruneNephrology Dialysis Transplantation2022 / p. ii23-ii32 https://doi.org/10.1093/ndt/gfab262 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

Combined pseudo-exhaustive and deterministic testing of array multipliersOyeniran, Adeboye Stephen; Azad, Siavoosh Payandeh; Ubar, Raimund-Johannes2018 IEEE International Conference on Automation, Quality and Testing, Robotics (AQTR) : THETA 21st edition, 24th-26th May, Cluj-Napoca, Romania : proceedings2018 / 6 p. : ill https://doi.org/10.1109/AQTR.2018.8402708

Combining functional and structural approaches in test generation for digital systemsUbar, Raimund-JohannesMicroelectronics reliability1998 / 3, p. 317-329 : ill

Comparative analysis of sequential circuit test generation approachesRaik, Jaan; Krivenko, Anna; Ubar, Raimund-JohannesBEC 2004 : proceedings of the 9th Biennial Baltic Electronics Conference : October 3-6, 2004, Tallinn, Estonia2004 / p. 225-228 : ill

Comparative mixed-signal test method and toolsetMellik, AndresInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK teise aastakonverentsi artiklite kogumik : 11.-12. mai 2007, Viinistu kunstimuuseum2007 / lk. 153-154 : ill

Comparison of different soil compaction test methods [Electronic resource]Aavik, Andrus26th International Baltic Road Conference : Kuressaare, 28-30 August, 20062006

Compliance testing concept of grid-connected inverter-based resources using simulated inputDvoracek, Jiri; Drapela, Jiri; Moravek, Jan; Vojtek, Martin; Toman, Petr; Rassõlkin, Anton; Vaimann, Toomas2023 23rd International Scientific Conference on Electric Power Engineering (EPE)2023 https://doi.org/10.1109/EPE58302.2023.10149232

A comprehensive methodology for stress procedures evaluation and comparison for Burn-In of automotive SoCAppello, D.; Bernardi, P.; Giacopelli, G.; Ruberg, PriitProceedings of the 2017 Design, Automation & Test in Europe (DATE) : 27-31 March 2017, Swisstech, Lausanne, Switzerland2017 / p. 646-649 : ill https://doi.org/10.23919/DATE.2017.7927068

Concept drift and cross-device behavior : challenges and implications for effective android malware detectionGuerra Manzanares, Alejandro; Luckner, Marcin; Bahsi, HayretdinComputers & Security2022 / art. 102757, 20 p. : ill https://doi.org/10.1016/j.cose.2022.102757 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

Conceptual test bench for small class unmanned autonomous vehicle performance estimationPütsep, Kristjan; Rassõlkin, Anton; Vaimann, Toomas2021 IEEE 19th International Power Electronics and Motion Control Conference, The Silesian University of Technology Gliwice, Poland, 25 - 29 April, 2021 (PEMC) : proceedings2021 / p. 695-698 : ill https://doi.org/10.1109/PEMC48073.2021.9432509

Condition assessment of power plant components operating under creep by testing of miniature specimensKlevtsov, Ivan; Dedov, AndreiCreep and Fracture in High Temperature Components : April 21-23, 2009, Zurich, Swizerland2009 / p. 1126-1137

Conditional fault collapsing in digital circuits with shared structurally synthesized BDDs [Online resource]Jürimägi, Lembit; Ubar, Raimund-JohannesBEC 2018 : 2018 16th Biennial Baltic Electronics Conference (BEC) : proceedings of the 16th Biennial Baltic Electronics Conference, October 8-10, 20182018 / 4 p. : ill https://doi.org/10.1109/BEC.2018.8600967

Constraint-based hierarchical untestability identification for synchronous sequential circuitsRaik, Jaan; Rannaste, Anna; Jenihhin, Maksim; Viilukas, Taavi; Ubar, Raimund-Johannes; Fujiwara, HideoSixteenth IEEE European Test Symposium : 23-27 May 2011, Trondheim2011 / p. 147-152

Constraint-based hierarchical untestability identification for syncronous sequential circuitsViilukas, Taavi; Raik, Jaan; Ubar, Raimund-Johannes; Rannaste, Anna; Jenihhin, Maksim; Fujiwara, HideoInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK viienda aastakonverentsi artiklite kogumik : 25.-26. novembril 2011, Nelijärve2011 / p. 139-142 : ill

Constraint-based test pattern generation at the register-transfer levelViilukas, Taavi; Raik, Jaan; Jenihhin, Maksim; Ubar, Raimund-Johannes; Krivenko, AnnaProceedings of the 13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems : April 14-16, 2010, Vienna, Austria2010 / p. 352-357 : ill http://dx.doi.org/10.1109/DDECS.2010.5491752

Constraint-based test scenario description languageVain, Jüri; Halling, EvelinBEC 2012 : 2012 13th Biennial Baltic Electronics Conference : proceedings of the 13th Biennial Baltic Electronics Conference : October 3-5, 2012, Tallinn, Estonia2012 / p. 89-92 : ill

Constraints solving based hierarchical test generation for synchronous sequential circuits = Kitsenduste lahendamisel baseeruv hierarhiline testigenereerimine sünkroonsetele järjestikskeemideleViilukas, Taavi2012 https://www.ester.ee/record=b2888278*est

Construction of aspect models for model-based testingSarna, Külli; Vain, JüriInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK viienda aastakonverentsi artiklite kogumik : 25.-26. novembril 2011, Nelijärve2011 / p. 67-70 : ill

Construction of the tests of combinational circuit failures by analyzing the orthogonal disjunctive normal forms represented by the alternative graphsMatrosova, A.Yu.; Pleshkov, A.G.; Ubar, Raimund-JohannesAutomation and remote control2005 / p. 313-327 : ill http://dx.doi.org/10.1007/s10513-005-0054-9

Contributions to ventilation system demand response: a case study of an educational buildingMaask, Vahur; Mikola, Alo; Korõtko, Tarmo; Rosin, Argo; Thalfeldt, MartinE3S Web Conference: Cold Climate HVAC and Energy 20212021 / art. 11001, 6 p https://doi.org/10.1051/e3sconf/202124611001 Conference Proceedings at Scopus Article at Scopus Article at WOS

Correlation between COVID-19 cases and gold price fluctuationGautam, Roshan; Kim, Yoochan; Topal, Erkan; Hitch, Michael WilliamInternational journal of mining, reclamation and environment2022 / p. 574-586 https://doi.org/10.1080/17480930.2022.2077542

Corrosion of cement and concrete - methods of testing and evaluationRaado, Lembi-Merike; Hain, TiinaManagement of Durability in the Building Process : International Workshop : Milan, 25-26 June 2003 : proceedings2003 / [7] p. : ill

Cybersecurity test range for autonomous vehicle shuttlesRoberts, Andrew; Snetkov, Nikita; Maennel, Olaf Manuel2021 IEEE European Symposium on Security and Privacy Workshops EuroS&PW 2021 : Virtual Conference, 6-10 September 2021 : proceedings2021 / p. 239-249 : ill https://doi.org/10.1109/EuroSPW54576.2021.00031

DACA : automated attack scenarios and dataset generationKorving, Frank; Vaarandi, RistoProceedings of the 18th International Conference on Cyber Warfare and Security, ICCWS 2023, a conference hosted by Towson University, Baltimore County, Maryland, USA, 9-10 March 20232023 / p. 550-559 : ill https://papers.academic-conferences.org/index.php/iccws/article/download/962/938 https://doi.org/10.34190/iccws.18.1.962

Decision diagrams - from a mathematical notion to engineering applicationsStankovic, Radomir S.; Ubar, Raimund-Johannes; Astola, JaakkoFacta Universitatis [Niš]. Series electronics and energetics2011 / p. 281-301 : ill http://dx.doi.org/10.2298/FUEE1103281S

Decision diagrams and digital testUbar, Raimund-Johannes41th International Conference on Microelectronics, Devices and Materials : MIDEM 2005 : Ribno at Bled, Slovenia : invited plenary paper2005 / p. 15-26

DeepAxe : a framework for exploration of approximation and reliability trade-offs in DNN acceleratorsTaheri, Mahdi; Riazati, Mohamad; Ahmadilivani, Mohammad Hasan; Jenihhin, Maksim; Daneshtalab, Masoud; Raik, Jaan; Sjödin, Mikael; Lisper, BjörnarXiv.org2023 / 8 p. : ill https://doi.org/10.48550/arXiv.2303.0822

Defect-oriented BIST quality analysisKruus, Helena; Ubar, Raimund-Johannes; Raik, JaanBEC 2010 : 2010 12th Biennial Baltic Electronics Conference : proceedings of the 12th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 4-6, 2010, Tallinn, Estonia2010 / p. 153-156 : ill

Defects, faults and fault modelsGramatova, Elena; Fisherova, Maria; Ubar, Raimund-Johannes; Pleskacz, Witold A.Handbook of testing electronic systems2005 / p. 26-96 : ill

DefSim: measurement environment for CMOS defectsBorejko, Tomasz; Jutman, Artur; Pleskacz, Witold A.; Ubar, Raimund-Johannes2006 25th International Conference on Microelectronics : Belgrade, Serbia and Montenegro, 14-17 May 2006 : proceedings. Volume 22006 / p. 679-682 https://ieeexplore.ieee.org/document/1651048

Design and analysis of a DC solid-state circuit breaker for energy router applicationRahimpour, Saeed21st International Symposium "Topical problems in the field of electrical and power engineering. Doctoral school of energy and geotechnology. III" : Pärnu, Estonia, June 15-18, 20222022 / p. 63-64 : ill https://www.ester.ee/record=b5504019*est

Design and test technology for dependable systems-on-chip2011 https://www.ester.ee/record=b4467408*est

Design and testing of new composite from recycled GFRPKers, Jaan; Majak, Jüri; Goljandin, Dmitri; Saarna, Mart; Gregor, Andre; Siinmaa, A.; Tall, Kaspar14th European Conference on Composite Materials : 7-10 June 2010, Budapest, Hungary2010 / [10] p

Design for accelerated testing of DC-link capacitors in photovoltaic inverters based on mission profilesSangwongwanich, Ariya; Shen, Yanfeng; Chub, Andrii; Liivik, Elizaveta; Vinnikov, Dmitri; Wang, Huai; Blaabjerg, FredeIEEE transactions on industry applications2021 / p. 741−753 https://doi.org/10.1109/TIA.2020.3030568 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

Design obfuscation versus testFarahmandi, Farimah; Sinanoglu, Ozgur; Blanton, Ronald; Pagliarini, Samuel Nascimento2020 IEEE European Test Symposium (ETS) : ETS 2020, May 25 - 29, 2020, Tallinn, Estonia2020 / 10 p https://doi.org/10.1109/ETS48528.2020.9131590

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Deterministic and probabilistic analyses of the bearing capacity of screw cast in situ displacement piles in silty soils as measured by CPT and SDTLeetsaar, Lehar; Korkiala-Tanttu, LeenaThe Baltic journal of road and bridge engineering2023 / p. 99-127 https://doi.org/10.7250/bjrbe.2023-18.600

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Development of testing method for smart substations with prosumersKorõtko, Tarmo; Merisalu, Ülo; Mägi, Marek; Peterson, Kristjan; Pettai, ElmoJournal of microelectronics, electronic components and materials2014 / p. 185-200 : ill

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Digital realization of retuning fractional-order controllers for an existing closed-loop control systemTepljakov, Aleksei; Petlenkov, Eduard; Gonzalez, Emmanuel A.; Belikov, JuriJournal of circuits, systems, and computers2017 / art. 1750165, p. 1-26 https://doi.org/10.1142/S0218126617501651

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Digitally controlled reference impedance device for test and calibration of the bio-impedance measurement system (BIMS) in a networked environmentBirjukov, Andrei; Krivošei, Andrei; Parve, Toomas13th International Conference on Electrical Bioimpedance and 8th Conference on Electrical Impedance Tomography 2007 : ICEBI2007 : August 29th - September 2nd 2007, Graz, Austria2007 / p. 276-279 https://link.springer.com/chapter/10.1007/978-3-540-73841-1_73

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Distributed fault simulation with collaborative load balancing for VLSI circuitsIvask, Eero; Devadze, Sergei; Ubar, Raimund-JohannesScalable computing : practice and experience2011 / p. 153-163 : ill

A DSP-based EBI, ECG and PPG measurement platformAbdullayev, Anar; Rist, Marek; Märtens, Olev; Metshein, Margus; Larras, Benoit; Frappe, Antoine; Gautier, Antoine; Min, Mart; John, Deepu; Cardiff, Barry; Krivosei, Andrei; Annus, PaulIEEE transactions on instrumentation and measurement2023 / art. 2007808, 8 p https://doi.org/10.1109/TIM.2023.3320771

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Eesti laste kõne põhitooni ja vokaaliruumi arengMeister, Lya; Meister, EinarEesti-uuringute Tippkeskuse aastakonverents ja Kreutzwaldi päevade 60. konverents "Suuline ja kirjalik kultuuris: põimumised ja põrkumised" : 12. ja 13. detsembril 2016 Eesti Kirjandusmuuseumis : ajakava ja ettekannete kokkuvõtted2016 / lk. 27-28 http://www.digar.ee/viewer/et/nlib-digar:297946/265944/page/23

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Eesti tudengid testisid esimesena maailmas arvutihiire täpsust : [TTÜ tootearenduse tudengid Birthe Matsi ja Triin Toon]Postimees2005 / lk. 9

Eesti-Saksa ettevõte arendas laboritäpsusega koroona kiirtestiEesti Elu : [Kanada ajaleht]2020 / lk. 3 https://eestielu.com/et/eesti-elu/paberleht/11209-eesti-elu-nr-48-4-detsember-2020-digileht

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Effect of N2 and CO2 on shale oil from pyrolysis of Estonian oil shaleMozaffari, Sepehr; Järvik, Oliver; Baird, Zachariah StevenInternational journal of coal preparation and utilization2022 / p. 2908-2922 https://doi.org/10.1080/19392699.2021.1914025 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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Ein universeller Weg zur Automatisierung des Testentwurfs für digitale ObjecteUbar, Raimund-Johannes; Lohuaru, TõnuFehler in Automaten1989 / S. 16-30 : Ill

Electrical conductivity and mechanical properties of Cu-0.7wt% Cr and Cu-1.0wt% Cr alloys processed by severe plastic deformationKommel, Lembit; Pokatilov, AndreiIOP conference series : materials science and engineering2014 / p. 1-7 : ill

Energy efficiency profiles for unmanned ground vehiclesVäljaots, Eero; Sell, RaivoProceedings of the Estonian Academy of Sciences2019 / p. 55–65 : ill https://doi.org/10.3176/proc.2019.1.04 http://www.kirj.ee/public/proceedings_pdf/2019/issue_1/proc-2019-1-55-65.pdf Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

Energy-efficient multi-fragment Markov model guided online model-based testing for MPSoCVain, Jüri; Tsiopoulos, Leonidas; Kharchenko, Vyacheslav; Apneet Kaur; Jenihhin, Maksim; Raik, Jaan; Nõmm, SvenGreen IT Engineering: Social, Business and Industrial Applications2019 / p. 273-297 https://doi.org/10.1007/978-3-030-00253-4_12 Article collection at Scopus Article at Scopus

Environment for the analysis of functional self-test quality in digital systemsUbar, Raimund-Johannes; Kostin, Sergei; Kruus, Helena; Aarna, Margit; Devadze, SergeiProceedings of the Estonian Academy of Sciences2014 / p. 151-162 : ill https://artiklid.elnet.ee/record=b2673964*est

Erosion testing of refractory cermets at high temperature [Electronic resource]Maksim, Antonov; Hussainova, IrinaProceedings of 12th Nordic Symposium in Tribology : NORDTRIB 2006 : Helsingor, Denmark, 7-9 June 20062006 / [10] p. [CD-ROM]

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Ettevõtted saavad tooteid ja teenuseid testida TalTechi asjade interneti ja 5G platvormilMente et Manu2020 / lk. 11 https://dea.digar.ee/cgi-bin/dea?a=is&oid=AKmenteetmanu202011&type=staticpdf

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Evaluating cybersecurity-related competences through serious gamesMäses, Sten19th Koli Calling Conference on Computing Education Research Koli Calling 2019 : November 21-24, 2019, Koli, Finland : proceedings2019 / 2 p https://doi.org/10.1145/3364510.3366163 Conference proceedings at Scopus Article at Scopus Article at WOS

Evaluation of some mechanical and physical properties of ‘Oriented Strand Board (OSB/3)’ following cyclic accelerated aging testsLille, Harri; Kiviste, Mihkel; Telling, Renar; Leppik, Taimo; Virro, Indrek; Kask, ReginoEuropean Journal of Wood and Wood Products2022 / p. 731–740 https://doi.org/10.1007/s00107-022-01803-9

Evolutionary approach to the functional test generation for digital circuitsSkobtsov, Y.A.; Ivanov, D.E.; Skobtsov, V.Y.; Ubar, Raimund-JohannesBEC 2004 : proceedings of the 9th Biennial Baltic Electronics Conference : October 3-6, 2004, Tallinn, Estonia2004 / p. 229-232 : ill

Executable black-box tester model synthesis from a non-deterministic EFSM of the systemKull, Andres; Raiend, Kullo; Vain, JüriInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK teise aastakonverentsi artiklite kogumik : 11.-12. mai 2007, Viinistu kunstimuuseum2007 / lk. 105-108

Experiences of lexicographers and computer scientists in validating Estonian Wordnet with test patternsLohk, Ahti; Orav, Heili; Vare, Kadri; Võhandu, LeoProceedings of the Eighth Global WordNet Conference : Bucharest, Romania, January 27-30, 20162016 / p. 184-191 : ill http://gwc2016.racai.ro/

Experiences with steady-state PMU compliance testing using standard relay testing equipmentAlmas, Muhammad Shoaib; Kilter, Jako; Vanfretti, LuigiPQ2014 : the 9th International 2014 Electric Power Quality and Supply Reliability Conference (PQ) : June 11-13, 2014, Rakvere, Estonia : proceedings2014 / p. 103-110 : ill

Experimental determination of equivalent circuit parameters for a synchronous generatorNaseer, Muhammad Usman; Asad, Bilal; Ghahfarokhi, Payam Shams; Kallaste, Ants; Vaimann, Toomas; Rassõlkin, Anton2021 IEEE Open Conference of Electrical, Electronic and Information Sciences (eStream): proceedings of the conference, April 22, 2021, Vilnius, Lithuania2021 / 7 p. : ill https://doi.org/10.1109/eStream53087.2021.9431442

Experimental determination of sound transmission in turbo-compressors : SAE Tech. paper no.2009-01-2045Rämmal, Hans; Abom, MatsSAE Technical Papers2009 / [7] p https://www.diva-portal.org/smash/record.jsf?pid=diva2%3A750030&dswid=-9882

Experimental testing of exterior wall mounted mechanical ventilation exhaust air outlet devicesPalmiste, Ülar; Meier, Tauno; Kurnitski, Jarek; Voll, HendrikE3S Web Conference: Cold Climate HVAC and Energy 20212021 / art. 02001, 8 p. : ill https://doi.org/10.1051/e3sconf/202124602001 Conference Proceedings at Scopus Article at Scopus Article at WOS

An external diagnosis method for network-on-a-chipRaik, Jaan; Govind, Vineeth; Ubar, Raimund-JohannesIEEE/ACM Design Automation and Test in Europe, Workshop on Diagnostic Services in Networks-on-Chips - Test, Debug and On-line Monitoring : April 16-20, 2007, Nice, France2007 / [2] p. : ill

Fast extended test access via JTAG and FPGAsDevadze, Sergei; Jutman, Artur; Aleksejev, Igor; Ubar, Raimund-JohannesInternational Test Conference 2009 : November 1 - November 6, 2009, Austin Convention Center, Austin, Texas USA : proceedings2009 / p. 1-7 : ill http://dx.doi.org/10.1109/TEST.2009.5355668

Fast fault emulation for synchronous sequential circuitsRaik, Jaan; Ellervee, Peeter; Tihhomirov, Valentin; Ubar, Raimund-JohannesProceedings of East–West Design & Test Workshop (EWDTW’04) : Yalta, Alushta, Crimea, Ukraine, September 23-26, 20042004 / p. 35-40 https://citeseerx.ist.psu.edu/document?repid=rep1&type=pdf&doi=a6eb712498a5f23db3f95ad66bada257c21e96f0

Fast identification of true critical paths in sequential circuitsUbar, Raimund-Johannes; Kostin, Sergei; Jenihhin, Maksim; Raik, Jaan; Jürimägi, LembitMicroelectronics reliability2018 / p. 252-261 : ill https://doi.org/10.1016/j.microrel.2017.11.027 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

Fast static compaction of tests composed of independent sequences : basic properties and comparison of methodsRaik, Jaan; Jutman, Artur; Ubar, Raimund-JohannesThe 9th IEEE International Conference on Electronics, Circuits and Systems : ICECS 2002 : September 15-18, 2002, Dubrovnik, Croatia. Volume II2002 / p. 445-448 : ill http://dx.doi.org/10.1109/ICECS.2002.1046190 https://ieeexplore.ieee.org/document/1046190

Fast test pattern generation for sequential circuits using decision diagram representationsRaik, Jaan; Ubar, Raimund-JohannesJournal of electronic testing : theory and applications (JETTA)2000 / 3, p. 213-226 : ill https://link.springer.com/article/10.1023/A:1008335130158

Fault effect reasoning in digital systems by topological view on low- and high-level decision diagramsUbar, Raimund-JohannesВестник Томского государственного университета. Управление, вычислительная техника и информатика2014 / p. 99-113 : ill http://journals.tsu.ru/informatics/&journal_page=archive&id=923&article_id=12107

Fault oriented test pattern generation for sequential circuits using genetic algorithmsIvask, Eero; Raik, Jaan; Ubar, Raimund-JohannesIEEE European Test Workshop2000 / p. 319-320

Fault simulation and code coverage analysis of RTL designs using high-level decision diagrams = Rikete simuleerimine ja koodikatte analüüs register-siirde tasemel kasutades kõrgtaseme otsustusdiagrammeReinsalu, Uljana2013 https://www.ester.ee/record=b2963595*est

Fault simulation of digital systems = Digitaalsüsteemide rikete simuleerimineDevadze, Sergei2009 https://digi.lib.ttu.ee/i/?445 https://www.ester.ee/record=b2508727*est

Fenoolide ning klorofenoolide osoonimise produktide toksilisuse uurimine Daphnia magna testigaTrapido, Marina; Veressinina, JelenaXXIII Eesti keemiapäevad : teaduskonverentsi ettekannete referaadid1997 / lk. 140

Field work in the role of teaching and research of rock propertiesKaru, Veiko; Kolats, Margit; Väizene, Vivika; Anepaio, Ain; Valgma, Ingo5th International Symposium "Topical Problems in the Field of Electrical and Power Engineering". Doctoral School of Energy and Geotechnology : Kuressaare, January 14-19, 20082008 / p. 66-70 : ill

Fire tests on glued-laminated timber beams with specific local material propertiesFahrni, Reto; Klippel, Michael; Just, Alar; Ollinoc, A.; Frangi, AndreaFire safety journal2019 / p. 161-169 : ill https://doi.org/10.1016/j.firesaf.2017.11.003 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

Fire-separating assembliesWerther, Norman; Dagenais, Christian; Just, Alar; Wade, ColleenFire safe use of wood in buildings : global design guide2022 / p. 193-226 : ill https://doi.org/10.1201/9781003190318-6

First results from a benchmarking of quality control frameworksKedar, A.; Sein, SanderLife cycle analysis and assessment in civil engineering: towards an integrated vision : proceedings of the Sixth International Symposium on Life-Cycle Civil Engineering (IALCCE 2018), 28-31 October 2018, Ghent, Belgium2019 / p. 1799−1804 : ill https://www.taylorfrancis.com/books/9781351857574

FOPID controllers and their industrial applications: a survey of recent resultsTepljakov, Aleksei; Alagoz, Baris Baykant; Petlenkov, EduardIFAC-PapersOnLine2018 / p. 25-30 https://doi.org/10.1016/j.ifacol.2018.06.014 Conference proceedings at Scopus Article at Scopus Article at WOS

Formal Techniques for Networked and Distributed Systems - FORTE 2007 : 27th IFIP WG 6.1 International Conference : Tallinn, Estonia, June 27-29, 2007 : proceedingsDerrick, John; Vain, Jüri2007 https://www.ester.ee/record=b2286028*est

FPGA-based embedded virtual instrumentation = FPGA-sisesed virtuaalsed test- ja mõõtevahendidAleksejev, Igor2013 http://www.ester.ee/record=b2927687*est

FPGA-based fault emulation of synchronous sequential circuitsEllervee, Peeter; Raik, Jaan; Tammemäe, Kalle; Ubar, Raimund-JohannesIET computers and digital techniques2007 / 2, p. 70-76 : ill https://ieeexplore.ieee.org/abstract/document/1423822

Fracture micromechanism of Cu-Cr-Zr system by "in-situ tensile test in SEM"Besterci, Michal; Ivan, Jozef; Kulu, Priit; Arensburger, Daniil; Velgosova, OksanaActa metallurgica Slovaca2000 / p. 20-24

A framework for improving web application user interfaces through immediate evaluationMarenkov, Jevgeni; Robal, Tarmo; Kalja, AhtoDatabases and information systems IX : selected papers from the twelfth International Baltic Conference, DB&IS 20162016 / p. 283-296 : ill https://doi.org/10.3233/978-1-61499-714-6-283

Fully synchronized acoustomechanical testing of skin : biomechanical measurements of nonclassical nonlinear parametersLints, Martin; Dos Santos, Serge; Kozena, Colette; Kus, Vaclav; Salupere, Andrus24th International Congress on Sound and Vibration 2017 (ICSV 24) : London, United Kingdom, 23-27 July 2017. Vol. 32017 / p. 1970-1977 : ill https://www.iiav.org/archives_icsv_last/2017_icsv24/content/papers/papers/full_paper_867_20170403135841549.pdf

Functional self-test of high-performance pipe-lined signal processing architecturesGorev, Maksim; Ubar, Raimund-Johannes; Ellervee, Peeter; Devadze, Sergei; Raik, Jaan; Min, MartMicroprocessors and microsystems2015 / p. 909-918 : ill http://dx.doi.org/10.1016/j.micpro.2014.11.002

Functional test generation for finite state machinesUbar, Raimund-Johannes; Brik, Marina; Jutman, Artur; Raik, Jaan; Bengtsson, Tomas; Kumar, ShashiBEC 2006 : 2006 International Baltic Electronics Conference : Tallinn University of Technology, October 2-4, 2006, Tallinn, Estonia : proceedings of the 10th Biennial Baltic Electronics Conference2006 / p. 205-208 : ill

Generating optimal test cases for real-time systems using DIVINE model checkerPal, Deepak; Vain, JüriBEC 2016 : 2016 15th Biennial Baltic Electronics Conference : proceedings of the 15th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 3-5, 2016, Tallinn, Estonia2016 / p. 99-102 : ill http://www.ester.ee/record=b2150914*est

A global survey of standardization and industry practices of automotive cybersecurity validation and verification testing processes and toolsRoberts, Andrew; Marksteiner, Stefan; Soyturk, Mujdat; Yaman, Berkay; Yang, YiSAE international journal of connected and automated vehicles2024 / art. 12-07-02-0013 https://doi.org/10.4271/12-07-02-0013

Guardbands in random testingKemnitz, GünterProceedings of the Estonian Academy of Sciences. Engineering1997 / 4, p. 260-270: ill

Handbook of testing electronic systemsNovak, Ondrej; Gramatova, Elena; Ubar, Raimund-Johannes; Jutman, Artur; Raik, Jaan2005 https://www.ester.ee/record=b2102523*est

Hierarchical identification of untestable faults in sequential circuitsRaik, Jaan; Ubar, Raimund-Johannes; Krivenko, Anna; Kruus, Margus10th Euromicro Conference on Digital System Design Architectures, Methods and Tools, DSD 2007 : 29-31 August 2007, Lübeck, Germany : proceedings2007 / p. 668-671 : ill http://dx.doi.org/10.1109/DSD.2007.4341539

Hierarchical test generation based on alternative graph modelUbar, Raimund-JohannesProceedings of the Second Workshop on Hierarchical Test Generation : Microelectronics Technology Park, Duisburg, Germany, September 25-26, 19951995 / p. 18

Hierarchical test generation for complex digital systems with control and data processing partsUbar, Raimund-Johannes; Raik, Jaan"Test, Assembly and Packaging" : SEMICON Technical Symposium : Singapur, May 3-6, 19991999 / p. 43-52

Hierarchical test generation. SEMI show slidesUbar, Raimund-Johannes; Raik, Jaan"Test, Assembly and Packaging" : SEMICON Technical Symposium : Singapur, May 3-6, 19991999 / p. 53-64

Hierarchical test pattern generation and untestability identification techniques for synchronous sequential circuits = Hierarhilised testintegreerimise ja mittetestitavuse identifitseerimise meetodid sünkroonsetele järjestikskeemideleRannaste, Anna2010 https://www.ester.ee/record=b2637391*est

Hierarchical test synthesis for digital systems using alternative graph modelUbar, Raimund-JohannesQuantitative aspects of designing and validating dependable computing systems1995

Hierarhilisest testigenereerimisest ja mittetestitavuse analüüsistRannaste, AnnaA & A2010 / 4, lk. 38-39 https://artiklid.elnet.ee/record=b2286481*est

High quality test generation for digital systemsUbar, Raimund-Johannes; Aarna, Margit; Kruus, Helena; Raik, JaanRomanian journal of information science and technology2005 / 1, p. 73-84 : ill

High-level combined deterministic and pseudo-exhuastive test generation for RISC processorsOyeniran, Adeboye Stephen; Ubar, Raimund-Johannes; Jenihhin, Maksim; Gürsoy, Cemil Cem; Raik, Jaan2019 IEEE European Test Symposium (ETS) : proceedings2019 / 6 p. : ill https://doi.org/10.1109/ETS.2019.8791526

High-level decision diagrams based coverage metrics for verification and testJenihhin, Maksim; Raik, Jaan; Tšepurov, Anton; Reinsalu, Uljana; Ubar, Raimund-JohannesLATW 2009 : 10th IEEE Latin American Test Workshop : Buzios, Rio de Janero, Brazil, March 2-5, 20092009 / [6] p. : ill http://dx.doi.org/10.1109/LATW.2009.4813792

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Model synthesis from VHDL for the functional test generation systemKrupnova, Helena1993 https://www.ester.ee/record=b2090509*est

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Multi-level test generation and fault diagnosis for finite state machinesUbar, Raimund-Johannes; Brik, MarinaDependable computing : proceedings / EDCC-2, Second European Dependable Computing Conference, Taormina, Italy, October 2-4, 19961996 / p. 264-281: ill

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Multiple fault analyses in logic circuitsUbar, Raimund-JohannesIFAC-Symposium Discrete Systems : Dresden, 14.-19. 3. 771977 / p. [?]

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New foreign language text-books as objects of testingRapoport, I.; Petrova, N.V Regional Seminar East-West Meeting of Language Testing, Tallinn, September 2-4, 1991 : summaries1991 / p. 77

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On using genetic algorithm for test generationBrik, Marina; Raik, Jaan; Ubar, Raimund-Johannes; Ivask, EeroBEC 2004 : proceedings of the 9th Biennial Baltic Electronics Conference : October 3-6, 2004, Tallinn, Estonia2004 / p. 233-236 : ill

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Optimierte Steuerung der Fehlersuche auf digitalen LeiterplattenThomä, E.; Ubar, Raimund-JohannesProceedings of the 27th International Conference, Technical University of Ilmenau, October, 19821982 / p. 65-68

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Overview about low-level and high-level decision diagrams for diagnostic modeling of digital systemsUbar, Raimund-JohannesFacta Universitatis [Niš]. Series electronics and energetics2011 / p. 303-324 : ill http://dx.doi.org/10.2298/FUEE1103303U

Overview about low-lewel and high-level decision diagrams for diagnostic modeling of digital systemsUbar, Raimund-JohannesProceedings of the Reed-Muller 2011 Workshop : May 25-26, 2011, Tuusula, Finland2011 / p. 1-10 : ill

Overview of e-learning environment for web-based study of testing and diagnostics of digital systemsJutman, Artur; Ubar, Raimund-Johannes; Wuttke, Heinz-DietrichMicroelectronics education : proceedings of the 5th European Workshop on Microelectronics Education, held in Lausanne, Switzerland, April 15-16, 20042004 / p. 253-258 : ill https://link.springer.com/chapter/10.1007/978-1-4020-2651-5_41

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Parallel pseudo-exhaustive testing of array multipliers with data-controlled segmentationOyeniran, Adeboye Stephen; Azad, Siavoosh Payandeh; Ubar, Raimund-Johannes2018 IEEE International Symposium on Circuits and Systems (ISCAS) : 27-30 May 2018, Florence, Italy : proceedings2018 / 5 p.: ill https://doi.org/10.1109/ISCAS.2018.8350936 Conference proceedings at Scopus Article at Scopus Article at WOS

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Rail and rail weld testingSaarna, Mart; Laansoo, AndresProceedings of the 4th International Conference Industrial Engineering - New Challenges to SME : 29-30 April 2004, Tallinn, Estonia2004 / p. 223-225 : ill

Raytraced images for testing the reconstruction of fibre orientation distributionsEik, Marika; Herrmann, HeikoProceedings of the Estonian Academy of Sciences2012 / p. 128-136 : ill

Recognition and analysis of the contours drawn during the Poppelreuter's testNõmm, Sven; Bardõš, Konstantin; Mašarov, Ilja; Kozhenkina, Julia; Toomela, Aaro; Toomsoo, Toomas2016 15th IEEE International Conference on Machine Learning and Applications : 18-20 December 2016, Anaheim, California : proceedings2016 / p. 170-175 : ill http://doi.org//10.1109/ICMLA.2016.0036

Reflection segments based robust PID controller solution for benchmark problemAvanessov, Sergei; Nurges, Ülo2014 22nd Mediterranean Conference on Control and Automation (MED) : University of Palermo, June 16-19, 2014, Palermo, Italy2014 / p. 1406-1411 : ill

Regular bridge inspection data improvement using non-destructive testingKušar, M.; Galvao, N.; Sein, SanderLife cycle analysis and assessment in civil engineering: towards an integrated vision : proceedings of the Sixth International Symposium on Life-Cycle Civil Engineering (IALCCE 2018), 28-31 October 2018, Ghent, Belgium2019 / p. 1793-1797 https://www.taylorfrancis.com/books/9781351857574

Replication-based deterministic testing of 2-dimensional arrays with highly interrelated cellsAzad, Siavoosh Payandeh; Oyeniran, Adeboye Stephen; Ubar, Raimund-Johannes21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems : DDECS 2018 : Budapest, Hungary 25-27 April, 2018 : proceedings2018 / p. 21-26 : ill https://doi.org/10.1109/DDECS.2018.00011

Requirements-driven model-based testing of the IP Multimedia SubsystemErnits, Juhan-Peep; Kääramees, Marko; Raiend, Kullo; Kull, AndresBEC 2008 : 2008 International Biennial Baltic Electronics Conference : proceedings of the 11th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 6-8, 2008, Tallinn, Estonia2008 / p. 203-206

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Reseeding using compaction of pre-generated LFSR sequencesJutman, Artur; Aleksejev, Igor; Raik, Jaan; Ubar, Raimund-JohannesICECS 2008 : The 15th IEEE International Conference on Electronics, Circuits and Systems : 31st August to 3rd September 2008, Malta : conference guide2008 / p. 215

Reseeding using compaction of pre-generated LFSR sub-sequencesJutman, Artur; Aleksejev, Igor; Raik, Jaan; Ubar, Raimund-JohannesICECS 2008 : The 15th IEEE International Conference on Electronics, Circuits and Systems : Malta2008 / p. 1290-1295 : ill http://dx.doi.org/10.1109/ICECS.2008.4675096

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Run-time reconfigurable instruments for advanced board-level testingAleksejev, Igor; Jutman, Artur; Devadze, SergeiIEEE AUTOTESTCON 2016 : Anaheim, California, USA, September 12-15, 2016 : proceedings2016 / p. 385-392 : ill https://doi.org/10.1109/AUTEST.2016.7589627

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Second IEEE East-West Design and Test WorkshopHahanov, Vladimir; Ubar, Raimund-JohannesIEEE journal of design & test of computers2004 / p. 594

Selected issues of modeling, verification and testing of digital systemsJutman, Artur2004 https://www.ester.ee/record=b1989760*est

Self-diagnosis in digital systems = Isediagnoosivad digitaalsüsteemidKostin, Sergei2012 https://www.ester.ee/record=b2757857*est

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Self-testing of pipe-lined signal processing architectures at-speedGorev, Maksim; Ubar, Raimund-Johannes; Ellervee, PeeterInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK seitsmenda aastakonverentsi artiklite kogumik : 15.-16. novembril 2013, Haapsalu2013 / p. 25-28 : ill

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Smooth coordination and management of impact of EstLink 2 transmission testing on electricity markets, power system operations and system technical performanceRauhala, T.; Laasonen, M.; Kilter, JakoCIGRE Session 2016 : 21-26 August 2016, Paris, France2016 / p. 1-11

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Software-based self-test generation for microprocessors with high-level decision diagramsJasnetski, Artjom; Ubar, Raimund-Johannes; Tšertov, Anton; Brik, MarinaProceedings of the Estonian Academy of Sciences2014 / p. 48-61 : ill https://artiklid.elnet.ee/record=b2665215*est

Software-based self-test generation for microprocessors with high-level decision diagramsUbar, Raimund-Johannes; Tšertov, Anton; Jasnetski, Artjom; Brik, MarinaLATW2014 : 15th IEEE Latin-American Test Workshop : Fortaleza, Brazil, March 12th-15th, 20142014 / [6] p. : ill

Software-based self-test with decision diagrams for microprocessorsUbar, Raimund-Johannes; Jasnetski, Artjom; Tšertov, Anton; Oyeniran, Adeboye Stephen2018

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Some aspects of testing speaking skills in UKPutrova, M.; Gridneva, I.V Regional Seminar East-West Meeting of Language Testing, Tallinn, September 2-4, 1991 : summaries1991 / p. 74-76

Statistical strength of brittle materials : test methods and weibull modulusPreis, IrinaProceedings of the 3rd International Conference Industrial Engineering - New Challenges to SME : 25-27 April 2002, Tallinn, Estonia2002 / p. 205-208 : ill

Step-wise approximated multi-cycle sine wave for dynamic tests of AD convertersLand, RaulXVI IMEKO World Congress : IMEKO2000 : proceedings of the 5th Workshop on ADC Modelling and Testing (EWADC'2000) : Vienna, Austria, Sept. 25-28, 20002000 / p. 217-220

Studioosus testis liiklust : [marsruudil TTÜ peahoone - Viru keskus]Nassar, Bia; Käger, MaarjaStudioosus2008 / märts, lk. 10

A suite of IEEE 1687 benchmark networksTšertov, Anton; Jutman, Artur; Devadze, Sergei2016 IEEE International Test Conference (ITC) : proceedings2016 / art. 6.1, p. 1-10 : ill https://doi.org/10.1109/TEST.2016.7805840

A symbolic approach to model-based online testing = Mudelipõhine online-testimine kasutades sümbolarvutustKääramees, Marko2012 http://www.ester.ee/record=b2890159*est

Symbolic test generation for hierarchically modeled digital systemsZaugarov, Viktor1993 https://www.ester.ee/record=b2090336*est

Synthesis of high-level decision diagrams for functional test pattern generationUbar, Raimund-Johannes; Raik, Jaan; Karputkin, Anton; Tombak, MatiProceedings of the 16th International Conference Mixed Design of Integrated Circuits and Systems MIXDES 2009 : Lodz, Poland, 25-27 June, 20092009 / p. 519-524 : ill

Synthesis of multiple fault oriented test groups from single fault test sets [Electronic resource]Ubar, Raimund-Johannes; Kostin, Sergei; Raik, Jaan2013 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) : 26-28 March 2013, Abu Dhabi, UAE2013 / p. 36-41 : ill [CD-ROM]

Synthesis of test purpose directed reactive planning tester for nondeterministic systemsVain, Jüri; Raiend, Kullo; Kull, Andres; Ernits, Juhan-Peep22nd IEEE/ACM International Conference on Automated Software Engineering (ASE 2007) : November 5-9, 2007, Atlanta, Georgia, USA2007 / p. 363-372 https://www.researchgate.net/publication/220883693_Synthesis_of_test_purpose_directed_reactive_planning_tester_for_nondeterministic_systems

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System modeling for processor-centric test automation = Süsteemide modelleerimine protsessorikesksete testprogrammide sünteesi automatiseerimiseksTšertov, Anton2012 https://www.ester.ee/record=b2751131*est

A system of test patterns to check and validate the semantic hierarchies of wordnet-type dictionaries = Testmustrite süsteem wordnet-tüüpi sõnastike semantiliste hierarhiate kontrollimiseks ja valideerimiseksLohk, Ahti2015 http://www.ester.ee/record=b4495412*est

A systematic approach on modeling refinement and regression testing of real-time distributed systemsPal, Deepak; Vain, JüriIFAC-PapersOnLine2019 / p. 1091-1096 https://doi.org/10.1016/j.ifacol.2019.11.341 Conference proceedings at Scopus Article at Scopus Article at WOS

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Teaching advanced test issues in digital electronicsUbar, Raimund-Johannes; Orasson, Elmet; Raik, Jaan; Wuttke, Heinz-DietrichProceedings of the 6th IEEE International Conference on Information Technology Based Higher Education and Training : ITHET : July 7-9, 2005, Juan Dolio, Dominican Republic2005 / p. S2B-1 - S2B-6 : ill http://dx.doi.org/10.1109/ITHET.2005.1560318

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10th IEEE European Test SymposiumUbar, Raimund-Johannes; Prinetto, Paolo; Raik, JaanIEEE journal of design & test of computers2005 / p. 480-481 : phot http://dx.doi.org/10.1109/MDT.2005.106

"Tervis ruudus", ehk, Tippkeskuse CEBE luguUbar, Raimund-JohannesTeadusmõte Eestis (X). Tehnikateadused. 3 : [artiklikogumik]2019 / lk. 200-215 : ill., fot https://www.ester.ee/record=b5208765*est

Test development and deployment tool-set for mixed-signal and digital devicesMellik, Andres; Raik, JaanBEC 2008 : 2008 International Biennial Baltic Electronics Conference : proceedings of the 11th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 6-8, 2008, Tallinn, Estonia2008 / p. 163-166 : ill

Test generation for digital systemsUbar, Raimund-JohannesDigest of papers - FTCS 13th Annual International Symposium on Fault-Tolerant Computing, June 28 - 30, 1983, Milano, Italy1983 / p. 374-377

Test generation for digital systems at functional levelUbar, Raimund-Johannes; Kuchcinski, Ktzysztof; Peng, Z.Research report LiTH-IDA-R-90-06, Linköping University, Sweden1990 / p. 1-21

Test generation for microprocessor control mechanismsLohuaru, Tõnu; Ubar, Raimund-JohannesFTSD-10 : Deseta Mezdunarodnaja Konferencija "Nadezdnost i Diagnostika na ECM. Mikrokompjutri i Sistemi", Varna, Bulgaria, 1987 = 10th International Conference on Fault-Tolerant Systems and Diagnostics (1987)1987 / p. 305-311

Test generation for microprocessors on alternative graphsAlango, Villem; Kont, Toomas; Ubar, Raimund-Johannes33. Internationales Wissenschaftliches Kolloquium : 24.-28.10.1988. H.3 Vortragsreihe B, technische und angewandte Informatik/Computertechnik1988 / p. 11-14

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Test method for the total content of non-volatile phenols in wastewaterJohannes, Ille; Mölder, Leevi; Tiikma, LaineOil shale1998 / 3, p. 232-238

Test program generation for microprocessor systemsDušina, Julia1993 https://www.ester.ee/record=b2090526*est

Test scenario generator learning for model-based testing of mobile robotsKanter, Gert; Liibert, Marti IngmarSystem assurances : modeling and management2022 / p. 67-84 https://doi.org/10.1016/B978-0-323-90240-3.00005-9

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Testing as a means of consolidation of students' knowledgeShaymardanova, Sh.Kh.V Regional Seminar East-West Meeting of Language Testing, Tallinn, September 2-4, 1991 : summaries1991 / p. 94-95

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Testing English for specific purposesTsaturova, I.V Regional Seminar East-West Meeting of Language Testing, Tallinn, September 2-4, 1991 : summaries1991 / p. 100-102

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Testing generic strong accessibility of nonlinear control systems via polynomial (quadratic) immersionCarravetta, Francesco; Sarafrazi, Mohammad Amin; Bartosiewicz, Zbigniew; Kotta, Ülle61st IEEE Conference on Decision and Control, CDC 2022, Cancun, 6 December - 9 December 2022, proceedings2022 / p. 1841-1846 https://doi.org/10.1109/CDC51059.2022.9992952 Conference Proceedings at Scopus Article at Scopus Article at WOS

Testing in evaluating the effectiveness of teacher's workGolikova, Zh.V Regional Seminar East-West Meeting of Language Testing, Tallinn, September 2-4, 1991 : summaries1991 / p. 40-43

Testing in teaching speaking to non-communicative learnersKrasyuk, N.I.V Regional Seminar East-West Meeting of Language Testing, Tallinn, September 2-4, 1991 : summaries1991 / p. 61-62 https://www.ester.ee/record=b1257906*est

Testing knowledge-based systems : a case study and implicationsHeino, P.; Jaakkola, Hannu; Tepandi, JaakProceedings of the SAFECOMP '921992

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Testing procedure for gunn oscillator as a load variation detectorKrasavin, JevgeniXIX Convetion on Radio Science, Otaniemi, Oct. 25-26, 1993 : abstracts of papers. Report 211993 / p. 37-38

Testing requirements for the intensive course conditionsGnatkevich, Y.; Leshchinskaya, V.V Regional Seminar East-West Meeting of Language Testing, Tallinn, September 2-4, 1991 : summaries1991 / p. 37-40

Testing speaking skillsGredasova, N.V Regional Seminar East-West Meeting of Language Testing, Tallinn, September 2-4, 1991 : summaries1991 / p. 47-48

Testing the basic writing skillsHromov, VjatšeslavV Regional Seminar East-West Meeting of Language Testing, Tallinn, September 2-4, 1991 : summaries1991 / p. 56-58

Testing the characteristics of phasor measurement units using real-time digital simulatorTrummal, Tarmo18th International Symposium "Topical Problems in the Field of Electrical and Power Engineering". Doctoral School of Energy and Geotechnology III : Toila, Estonia, January 14-19, 2019 : [proceedings]2019 / p. 229-230 : ill https://www.ester.ee/record=b5183874*est

Testing the level of development of skills and habits of dialogic speech with students of non-linguistic colleges : (on the material of the English language)Omeltchenko, L.; Yatel, G.; Barkhatov, N.; Provotar, T.V Regional Seminar East-West Meeting of Language Testing, Tallinn, September 2-4, 1991 : summaries1991 / p. 70-73

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The didactical and pedagogical advantages of testing in computer assisted language learning (CALL)Ilyinskaja, L.; Lasmane, B.; Vevere, I.V Regional Seminar East-West Meeting of Language Testing, Tallinn, September 2-4, 1991 : summaries1991 / p. 49-51

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Unmanned ground vehicle energy efficiency validation in territory surveillance missionVäljaots, Eero; Sell, Raivo; Rimasauskas, MariusMechatronic Systems and Materials VII2016 / p. 164-170 http://dx.doi.org/10.4028/www.scientific.net/SSP.251.164

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Use of luminescent bacteria in toxicity testingKahru, AnneBiobalt'92 : Biotechnology in Estonia, Latvia and Lithuania : Tallinn, November 1992 : conference abstracts1992 / p. 33

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Ways for board and system test to benefit from FPGA embedded instrumentationEhrenberg, Heiko; Odintsov, Sergei; Devadze, Sergei; Jutman, Artur; Aleksejev, Igor; Wenzel, Thomas2019 IEEE AUTOTESTCON2019 / 10 p : ill https://doi.org/10.1109/AUTOTESTCON43700.2019.8961057

Web services testing in e-learning environmentsÕunapuu, Enn; Tepandi, JaakSecond International Conference on Multimedia and Information & Communication Technologies in Education (m-ICTE 2003) : Badajoz, Spain, 20032003 / p. 1170-1177

WebTT - digitaalskeemide testimine ja diagnostikaalaste õppelaborite e-keskkond : [TTÜ arvutitehnika instituut esitles e-Ülikooli konverentsil kolme õppetöös kasutatavat süsteemi]Robal, Tarmo; Orasson, ElmetMente et Manu2005 / 5. mai, lk. 5 : fot https://www.ester.ee/record=b1242496*est

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VHDL based test generation systemJervan, Gert; Markus, Antti; Raik, Jaan; Ubar, Raimund-JohannesProceedings of the 5th Electronic Devices and Systems Conference, Brno, June 11-12, 19981998 / p. 145-148

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В волости Раэ тестируют беспилотные автобусыStolitsa.ee2023 В волости Раэ тестируют беспилотные автобусы

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Исследование износостойкости подшипниковых материалов на четырехшариковых трибометрахAjaots, Maido; Lepre, M.Тезисы докладов XXXI студенческой научно-технической конференции1980 / с. 85-86 https://www.ester.ee/record=b1319482*est

Исследование форм предявления лексических единиц в тесте исходного уровняMurumets, S.; Võrk, Evi-Mai; Kokkota, ValmarТезисы докладов II зонального совещания заведующих кафедрами иностранных языков неязыковых факультетов и вузов Эстонской ССР, Белорусской ССР, Латвийской ССР, Литовской ССР и Калининградской области : Тарту, (4-7 мая 1977 г.)1977 / с. 82-84 https://www.ester.ee/record=b1317941*est

Лингводидактическое тестированиеKokkota, Valmar1989 https://www.ester.ee/record=b1521036*est

Метод дедуктивного анализа тестов для логических схемViilup, Agu; Kitsnik, Peeter; Ubar, Raimund-JohannesВопросы технической диагностики1977 / с. [?] https://www.ester.ee/record=b2353473*est

Методы тестового диагностирования дискретных системUbar, Raimund-JohannesМашинное проектирование электронных устройств и систем1986 / с. 57-69

Некоторые проблемы создания стандартных методов испытания на абразивное изнашивание в свете энергетической концепции : автореферат ... кандидата технических наук (05.02.04)Pappel, Toivo1975 http://www.ester.ee/record=b1318201*est

Некоторые проблемы создания стардартных методов испытания на абразивное изнашивание в свете энергетической концепции : диссертация ... кандидата технических наук : 05.02.04 - трение и износ в машинахPappel, Toivo1975 http://www.ester.ee/record=b2332186*est

О вынужденных колебаниях камертона при возбуждении одной ветвиKenk, Kalju; Mäeots, R.Тезисы докладов XXXI студенческой научно-технической конференции1980 / с. 46-47 https://www.ester.ee/record=b1319482*est

О проверке полноты контролирующих тестов цифровых схемUbar, Raimund-JohannesXV Областная научно-техническая конференция по системам и средствам управления, май 1979 года : Тезисы докладовПермь / с. 74-75

О синтезе тестов для микропроцессорных БИСLohuaru, Tõnu; Ubar, Raimund-JohannesПроектирование и диагностика вычислительных средств1987 / с. 30-42 : илл https://www.ester.ee/record=b1273275*est

О функциональном моделировании диагностических тестов в схемах ЦВМVaher, V.; Ubar, Raimund-JohannesXX студенческая научно-техническая конференция вузов Прибалтийских республик, Белорусской ССР и Молдавской ССР : тезисы докладов. Часть 11974 / с. 133 https://www.ester.ee/record=b1306141*est

Построение тестов для дискретных систем нам простых альтернативных графахVoolaine, Andrus; Pall, M.; Ubar, Raimund-JohannesТезисы докладов всесоюзной научно-технической конференции "Методы и средства борьбы с помехами в цифровой технике"1986 / с. 88-89

Построение тестов для неисправностей комбинационных схем на основе анализа ортогональных дизъюнктивных нормальных форм, представляемых альтернативными графамиMatrosova, A.Yu.; Pleshkov, A.G.; Ubar, Raimund-JohannesАвтоматика и телемеханика2005 / с. 158-174 : ил http://mi.mathnet.ru/at1333

Применение модели АГ для автоматизации синтеза тест-программ микропроцессорных БИСUbar, Raimund-JohannesЭлектронная техника. Серия 8, Управление качеством, стандардизация, метрология, испытания : научно-технический сборник1985 / с. 110-113 https://www.ester.ee/record=b2160764*est

Проектирование контролепригодных дискретных систем : учебное пособиеUbar, Raimund-Johannes1988 https://www.ester.ee/record=b1225400*est

Система синтеза тестовых программ для дискретных объектов диагностирования (ОД)Zaugarov, Viktor; Saarepera, Maimu; Storožev, SergeiTallinna Tehnikaülikooli Toimetised1990 / lk. 78-89: ill

Сотрудничество по тестированию в КПИ, РПИ и ТПИKokkota, ValmarТезисы докладов II зонального совещания заведующих кафедрами иностранных языков неязыковых факультетов и вузов Эстонской ССР, Белорусской ССР, Латвийской ССР, Литовской ССР и Калининградской области : Тарту, (4-7 мая 1977 г.)1977 / с. 53-55 https://www.ester.ee/record=b1317941*est

Тестирование продукционных систем по критерию покрытия операторовTepandi, JaakИзвестия АН Эстонии. Физика. Математика1990 / 1, с. 9-13

Тестовая диагностика цифровых устройств : учебное пособие. II, Синтез и анализ тестов. Дешифрация диагностических экспериментовUbar, Raimund-Johannes1981 https://www.ester.ee/record=b1326795*est

Фактор времени в языковых тестахKokkota, Valmar; Võrk, Evi-MaiИсследования по методике преподавания иностранных языков1978 / с. 41-49 https://www.ester.ee/record=b1314236*est

Формальный синтез тестов для микропроцессоровToomsalu, Arvo; Ubar, Raimund-JohannesXVII областная научно-техническая конференция по вопросам повышения эффективности и качества систем и средств управления (май 1981 г.): Тезисы докладов1981 / с. 111-112

Экспертная система тестирования программ по спецификациямTepandi, JaanIII Всесоюзная конференция "Автоматизация производства систем программирования" : тезисы докладов1986 / с. 137-138 https://www.ester.ee/record=b1216891*est

Электрические аппараты : пособие к лабораторным работам для студентов специальности 0628 и 06011982 https://www.ester.ee/record=b1264696*est