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Fractal and multifractal analysis of complex networks : Estonian network of paymentsRendon de la Torre, Stephanie; Kalda, Jaan; Kitt, Robert; Engelbrecht, JüriThe European physical journal B2017 / art. 234, p. 1-8 : ill https://doi.org/10.1140/epjb/e2017-80214-5

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Fractality in geology : a possible use of fractals in the studies of partial melting processesSoesoo, Alvar; Kalda, Jaan; Bons, Paul; Urtson, Kristjan; Kalm, VolliProceedings of the Estonian Academy of Sciences. Geology2004 / 1, 13-27 : ill

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Higuchi fractal dimension and spectral entropy as measures of depth of sedation in intensive care unitAnier, Andres; Lipping, Tarmo; Melto, S.; Hovilehto, S.Proceedings of the 26th Annual International Conference of the IEEE Engineering in Medicine and Biology Society : San Francisco, CA, USA, September 1-5, 2004. Vol. 12004 / p. 526-529 : ill https://pubmed.ncbi.nlm.nih.gov/17271729/

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Long-term stability of resting state EEG-based linear and nonlinear measuresPõld, Toomas; Peäske, Laura; Hinrikus, Hiie; Lass, Jaanus; Bachmann, MaieInternational journal of psychophysiology2021 / p. 83-87 https://doi.org/10.1016/j.ijpsycho.2020.11.013 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

Multifractal analysis of high-temperature plasma irradiated tungsten surfacesMartsepp, Merike; Laas, Tõnu; Laas, Katrin; Priimets, Jaanis; Mikli, Valdek; Antonov, MaksimSurface topography : metrology and properties2021 / 13 p. : ill https://doi.org/10.1088/2051-672X/ac1dc3 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

Multifractal defects versus non-defects in surface analysisMartsepp, Merike; Laas, Tõnu; Tõkke, Siim; Mikli, ValdekGraduate School of Functional Materials and Technology (GSFMT) Scientific Conference : abstracts2022 / 37 l. Graduate School of Functional Materials and Technology (GSFMT) Scientific Conference 2022

On statistical topography of self-affine sets = Eneseafiinsete hulkade statistilisest topograafiastMandre, Marek2019 https://digi.lib.ttu.ee/i/?11232

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Reliability of electroencephalogram-based individual markers - case studyUudeberg, Tuuli; Päeske, Laura; Hinrikus, Hiie; Lass, Jaanus; Bachmann, Maie2020 42nd Annual International Conference of the IEEE Engineering in Medicine & Biology Society (EMBC)2020 / p. 276 - 279 https://doi.org/10.1109/EMBC44109.2020.9175274 Conference Proceedings at Scopus Article at Scopus Article at WOS

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