Deadlock-free generic routing algorithms for 3-dimensional Networks-on-Chip with reduced vertical link density topologiesYing, Haoyuan; Jaiswal, Ashok; Hollstein, Thomas; Hofmann, KlausJournal of systems architecture2013 / p. 528-542 : ill

Dynamic quadrant partitioning adaptive routing algorithm for irregular reduced vertical link density topology 3-dimensional network-on-chipsYing, Haoyuan; Hofmann, Klaus; Hollstein, ThomasProceedings of the 2014 International Conference on High Performance Computing & Simulation (HPCS 2014) : July 21-25, 2014, Bologna, Italy2014 / p. 516-522 : ill

Fast and optimized task allocation method for low vertical link density 3-Dimensional Networks-on-Chip based many core systemsYing, Haoyuan; Hollstein, Thomas; Hofmann, KlausProceedings : Design, Automation & Test in Europe : Grenoble, France, March 18-22, 20132013 / p. 1777-1782 : ill

GSNoC — the comprehensive design platform for 3-dimensional Networks-on-Chip based many core embedded systemsYing, Haoyuan; Hollstein, Thomas; Hofmann, KlausProceedings of the 2013 International Conference on High Performance Computing & Simulation (HPCS 2013) : July 1-July 5, 2013, Helsinki, Finland2013 / p. 217-223 : ill

A hardware/software co-design reconfigurable network-on-chip FPGA emulation methodYing, Haoyuan; Hollstein, Thomas; Hofmann, Klaus2014 9th International Symposium on Reconfigurable and Communication-Centric Systems-on-Chip (ReCoSoC) : Montpellier, France, 26-28 May, 20142014 / [8] p. : ill

NoCDepend : a flexible and scalable dependability technique for 3D networks-on-chipHollstein, Thomas; Azad, Siavoosh Payandeh; Kogge, Thilo; Ying, Haoyuan; Hofmann, Klaus2015 IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems DDECS 2015 : 22-24 April 2015, Belgrade, Serbia : proceedings2015 / p. 75-78 : ill http://dx.doi.org/10.1109/DDECS.2015.30

A simulation framework for 3-dimension networks-on-chip with different vertical channel density configurationsYing, Haoyuan; Jaiswal, Ashok; Abd El Ghany, Mohamed A; Hollstein, Thomas; Hofmann, KlausProceedings of the 2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) : April 18-20, 2012 Tallinn, Estonia2012 / p. 83-88 : ill