Accurate NBTI-induced gate delay modeling based on intensive SPICE simulationsKostin, Sergei; Raik, Jaan; Ubar, Raimund-Johannes; Jenihhin, MaksimMEDIAN Finale : Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale : November 10-11, 2015, Tallinn, Estonia2015 / p. 21-26 : ill

BASTION : board and SoC test instrumentation for ageing and no failure foundJutman, Artur; Lotz, Christophe; Larsson, Erik; Sonza Reorda, Matteo; Jenihhin, Maksim; Raik, JaanProceedings of the 2017 Design, Automation & Test in Europe (DATE) : 27-31 March 2017, Swisstech, Lausanne, Switzerland2017 / p. 115-120 : ill https://doi.org/10.23919/DATE.2017.7926968

Gate-level modelling of NBTI-induced delays under process variationsCopetti, Thiago; Cardoso Medeiros, Guilherme; Bolzani Poehls, Leticia; Vargas, Fabian; Kostin, Sergei; Jenihhin, Maksim; Raik, Jaan; Ubar, Raimund-JohannesLATS 2016 : 17th IEEE Latin-American Test Symposium, Foz do Iguacu, Brazil, 6th-9th April 20162016 / p. 75-80 : ill http://dx.doi.org/10.1109/LATW.2016.7483343

Health index prediction of overhead transmission lines : a machine learning approachManninen, Henri; Kilter, Jako; Landsberg, MartIEEE transactions on power delivery2022 / p. 50-58 https://doi.org/10.1109/TPWRD.2021.3052721 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

Hierarchical identification of NBTI-critical gates in nanoscale logicKostin, Sergei; Raik, Jaan; Ubar, Raimund-Johannes; Jenihhin, MaksimLATW2014 : 15th IEEE Latin-American Test Workshop : Fortaleza, Brazil, March 12th-15th, 20142014 / [6] p. : ill

Identification and rejuvenation of NBTI-critical logic paths in nanoscale circuitsJenihhin, Maksim; Squillero, Giovanni; Tihhomirov, Valentin; Kostin, Sergei; Raik, Jaan; Ubar, Raimund-JohannesJournal of electronic testing : theory and applications (JETTA)2016 / p. 273-289 : ill http://dx.doi.org/10.1007/s10836-016-5589-x

Identifying NBTI-critical paths in nanoscale logicUbar, Raimund-Johannes; Vargas, Fabian; Jenihhin, Maksim; Raik, Jaan; Kostin, Sergei; Bolzani Poehls, Leticia16th Euromicro Conference series on Digital System Design : DSD 2013 : proceedings : 4-6 September 2013, Santander, Spain2013 / p. 136-141 : ill

Impregnated wood performance in outdoor environmentTubli, Peeter; Kallakas, Heikko; Kers, Jaan; Brischke, C.; Humar, M.; Jones, D.Proceedings of the 12th Meeting of the Northern European Network for Wood Science and Engineering (WSE) : Wood Science and Engineering - a Key Factor on the Transition to Bioeconomy : September 12-13, 2016, Riga, Latvia2016 / p. 115-116 http://www.kki.lv/dokumenti/WSE2016.pdf

Improved quantification of partial discharges for reliable diagnostics of multipath connections in MV substationsShafiq, Muhammad; Kiitam, Ivar; Isa, Muzamir; Taklaja, Paul; Palu, Ivo; Kütt, Lauri2021 IEEE 62nd International Scientific Conference on Power and Electrical Engineering of Riga Technical University (RTUCON)2021 / 6 p https://doi.org/10.1109/RTUCON53541.2021.9711585

Maristem - stem cells of marine/aquatic invertebrates : from basic research to innovative applicationsBallarin, Loriano; Rinkevich, Baruch; Bartscherer, Kestin; Bartscherer, Kestin; Cambier, Sebastien; Cammarata, Matteo; Domart-Coulon, Isabelle; Drobne, Damjana; Encinas, Juanma; Frank, Uri; Geneviere, Anne-Marie; Hobmayer, Bert; Lõhelaid, Helike; Lyons, Daniel; Martinez, Pedro; Oliveri, Paola; Peric, Lorena; Piraino, Stefano; Ramšak, Andreja; Rakers, Sebastian; Rentzsch, Fabian; Rosner, Amalia; Silva, Tiago Henriques da; Somorjai, Ildiko; Suleiman, Sherif; Coelho, Ana VarelaSustainability (Switzerland)2018 / Art. 526 https://doi.org/10.3390/su10020526 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

Measuring and identifying aging-critical paths in FPGAsPfeifer, Petr; Raik, Jaan; Jenihhin, Maksim; Ubar, Raimund-Johannes; Pliva, ZdenekMEDIAN 2015 : the 4th Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale : March 13, 2015, Grenoble, France2015 / p. 56-61 : ill

Modeling soft-error reliability under variabilityBalakrishnan, Aneesh; Cardoso Medeiros, Guilherme; Gürsoy, Cemil Cem; Hamdioui, Said; Jenihhin, Maksim; Alexandrescu, Dan2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) : 6-8 Oct. 20212021 / p. 1-6 https://doi.org/10.1109/DFT52944.2021.9568295

On BTI aging rejuvenation in memory address decodersGürsoy, Cemil Cem; Kraak, Daniel; Ahmed, Foisal; Taouil, Mottaqiallah; Jenihhin, Maksim; Hamdioui, Said2022 IEEE 23rd Latin American Test Symposium, LATS 20222022 / Code 184360 https://doi.org/10.1109/LATS57337.2022.9936940

On NBTI-induced aging analysis in IEEE 1687 reconfigurable scan networksDamljanovic, Aleksa; Squillero, Giovanni; Gürsoy, Cemil Cem; Jenihhin, MaksimVLSI-SoC 2019 : 27th IFIP/IEEE International Conference on Very Large Scale Integration : [proceedings]2019 / p. 335-340 : ill https://doi.org/10.1109/VLSI-SoC.2019.8920313

Possibilities of prolonging human life in the near futureKristjuhan, ÜloAgronomy research2013 / p. 435-440

Rejuvenation of nanoscale logic at NBTI-critical paths using evolutionary TPGPalermo, N.; Tihhomirov, Valentin; Copetti, Thiago; Jenihhin, Maksim; Raik, Jaan; Kostin, Sergei2015 16th Latin American Test Symposium (LATS 2015) : Puerto Vallarta, Mexico, 25-27 March 20152015 / [6] p. : ill http://dx.doi.org/10.1109/LATW.2015.7102405

Rejuvenation of NBTI-impacted processors using evolutionary generation of assembler programsPellerey, Francesco; Jenihhin, Maksim; Squillero, Giovanni; Raik, Jaan; Sonza Reorda, Matteo; Tihhomirov, Valentin; Ubar, Raimund-Johannes2016 IEEE 25th Asian Test Symposium : 21-24 November 2016, Hiroshima, Japan2016 / p. 304-309 : ill https://doi.org/10.1109/ATS.2016.57

Software-based mitigation for memory address decoder agingKraak, D. H. P.; Gürsoy, Cemil Cem; Jenihhin, Maksim; Raik, JaanLATS 2019 : 20th IEEE Latin American Test Symposium : Santiago, Chile, March 11th - 13th 20192019 / 6 p. : ill https://doi.org/10.1109/LATW.2019.8704595

SPICE-inspired fast gate-level computation of NBTI-induced delays in nanoscale logicKostin, Sergei; Raik, Jaan; Ubar, Raimund-Johannes; Jenihhin, Maksim2015 IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems DDECS 2015 : 22-24 April 2015, Belgrade, Serbia : proceedings2015 / p. 223-228 : ill

Study of the behaviour of partial discharges for proactive diagnostics in medium voltage cablesShafiq, Muhammad; Kiitam, Ivar; Taklaja, Paul; Parker, Martin; Palu, Ivo; Kütt, Lauri2021 IEEE PES/IAS PowerAfrica, PowerAfrica 20212021 / p. 1-5 https://doi.org/10.1109/PowerAfrica52236.2021.9543233

The interaction of electrostatic fields in humans and their work environment [Electronic resource]Koppel, Tarmo; Haldre, Heldur; Kaev, Kristjan JoanDoctoral Summer School 2012 : doctoral school in economics and innovation : 24-27 July 2012, Nelijärve, Estonia2012 / 16 p. : ill [CD-ROM]

Workability of older academicsKristjuhan, Ülo; Taidre, ErikaAgronomy research2013 / p. 441-448