Correct reuse of complex design units during high level synthesis : verification issuesDušina, JuliaIEEE International High Level Design Validation and Test Workshop, Oakland, California, USA, November 15-16, 1996 : proceedings1996

Formalization and validation of the std logic-1164 and numeric-std VHDL packages using the nqthm theorem proverDušina, Julia; Borrione, Dominique2nd Workshop on Libraries, Component Modeling and Quality Assurance : proceedings : Toledo, Spain, April, 19971997 / p. 169-180

Formalization of finite state machines with data path for the verification of high-level synthesisBorrione, Dominique; Dušina, Julia; Pierre, LaurenceXI Brasilian Symposium on Integrated Circuit Design, September 30 - October 3, 1998, Rio de Janeiro, Brazil : proceedings1998 / p. 99-102: ill

FTGEN - система генерирования функциональных тестовUbar, Raimund-Johannes; Dušina, Julia; Zaugarov, Viktor; Крупнова Е.; Storožev, SergeiProceedings of CAD-93 : new information technologies for science, education and business, Yalta, May 4-13, 19931993 / p. 123-125

Functional test program generation for digital systemsUbar, Raimund-Johannes; Dušina, Julia; Krupnova, Helena; Storožev, Sergei; Zaugarov, ViktorTestmethoden und Zuverlässigkeit von Schaltungen und Systemen : proceedings of the 6th workshop, Vaals (Niederlande), March 6-8, 19941994 / p. 14-18: ill

Test generation for control faults in digital systemsDušina, Julia; Brik, MarinaBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 325-330: ill

Test program generation for microprocessor systemsDušina, Julia1993 https://www.ester.ee/record=b2090526*est

Verification formelle des resultats de la synthese de Haut Niveau : [doktoriväitekiri]Dušina, Julia1999

Система генерирования тестов для микропроцессоровUbar, Raimund-Johannes; Dušina, Julia; Zaugarov, Viktor; Крупнова Е.; Storožev, SergeiProceedings of international conference "Technical Diagnostics-93", St.-Peterburg, June 8-10, 19931993 / p. 87-89