Determination of transistor low freqency noise parameters for SPICE programmeZeltinš, M.; Slaidinš, I.Automation, simulation & measurement : ASM'91 : 3rd biennal conference, Tallinn, October 7-11, 1991. Section S / Tallinn Technical University1992 / p. 127-131: ill

Measurement of transistor low frequency noise source parametersZeltinš, M.; Slaidinš, I.BEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 475-478: ill