Numerical simulation of electrothermal effects in ESD protection devicesHellstrom, S.; Freidin, Boris; Velmre, Enn; Udal, AndresTechn. Dig. of the 3rd European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 1992, Oct. 5-8, Schwäbisch Gmünd, Germany1992 / p. 77-80 https://d-nb.info/921228503/04

Sonar with digital signal processingArro, IlmarMicrosystem Technologies 961996 / p. 829-831