Pb and Bi nanoclaster precipitation in high-dose implated and RTA Si: SEM and RHEED analysesAngelov, Christo; Mikli, Valdek; Kalitzova, M.; Beshkov, G.Proceedings of 11th Conference "Materials for Information Tech. in the New Millenium" : ISCMP : Varna, 20012001 / p. 452-455

Use of atomic-force microscopy for characterization of silicon, implated with heavy ions at high dosesAngelov, Christo; Groudev, P.; Mikli, ValdekProceedings of 11th Conference "Materials for Information Tech. in the New Millenium" : ISCMP : Varna, 20012001 / p. 460-464