Evolutionary approach to test generation for functional BISTSkobtsov, Y.A.; Ivanov, D.E.; Skobtsov, V.Y.; Ubar, Raimund-Johannes; Raik, JaanInformal Digest of Papers : 10 IEEE European Test Symposium : Tallinn, Estonia, May 22-25, 20052005 / p. 151-155 : ill https://artiklid.elnet.ee/record=b1018764*est

Evolutionary approach to the functional test generation for digital circuitsSkobtsov, Y.A.; Ivanov, D.E.; Skobtsov, V.Y.; Ubar, Raimund-JohannesBEC 2004 : proceedings of the 9th Biennial Baltic Electronics Conference : October 3-6, 2004, Tallinn, Estonia2004 / p. 229-232 : ill