HyFBIST : hybrid functional built-in self-test in microprogrammed data-paths of digital systemsUbar, Raimund-Johannes; Mazurova, Natalja; Smahtina, Julia; Orasson, Elmet; Raik, JaanProceedings of the 11th International Conference : Mixed Design of Integrated Circuits and Systems : MIXDES 2004 : Szczecin, Poland, 24-26 June 20042004 / p. 497-502 : ill

Sequential circuits BIST with status bit controlRaik, Jaan; Orasson, Elmet; Ubar, Raimund-JohannesProceedings of the 11th International Conference : Mixed Design of Integrated Circuits and Systems : MIXDES 2004 : Szczecin, Poland, 24-26 June 20042004 / p. 507-510 : ill