Analysis of a test method for delay faults in NoC interconnectsBengtsson, Tomas; Jutman, Artur; Kumar, Shashi; Ubar, Raimund-Johannes; Peng, ZeboProceedings of the IEEE East-West Design & Test Workshop (EWDTW'06) : Sochi, Russia, September 15-19, 20062006 / p. 42-46 : ill

Computer aided design support of FSM multiplicative decompositionSudnitsõn, Aleksander; Devadze, SergeiProceedings of the IEEE East-West Design & Test Workshop (EWDTW'06) : Sochi, Russia, September 15-19, 20062006 / p. 241-246 : ill

How to emulate Network-on-Chip?Ellervee, Peeter; Jervan, GertProceedings of the IEEE East-West Design & Test Workshop (EWDTW'06) : Sochi, Russia, September 15-19, 20062006 / p. 282-286 : ill