DefSim: CMOS defects on chip for research and educationPleskacz, Witold A.; Borejko, Tomasz; Walkanis, A.; Stopjakova, Viera; Jutman, Artur; Ubar, Raimund-Johannes7th IEEE Latin American Test Workshop LATW'06 : Buenos Aires, Argentina, March 26th-29th, 2006 : proceedings2006 / p. 74-79 : ill

Fault simulation with parallel critical path tracing for combinational circuits using structurally synthesized BDDsDevadze, Sergei; Raik, Jaan; Jutman, Artur; Ubar, Raimund-Johannes7th IEEE Latin American Test Workshop LATW'06 : Buenos Aires, Argentina, March 26th-29th, 2006 : proceedings2006 / p. 97-102 : ill