Dependability evaluation in fault-tolerant systems with high-level decision diagramsUbar, Raimund-Johannes; Jervan, Gert; Raik, Jaan; Jenihhin, Maksim; Ellervee, PeeterComputer Science Meets Automation : 10-13 September 2007 : proceedings. Volume II2007 / p. 147-152 : ill https://www.db-thueringen.de/receive/dbt_mods_00008864

On LFSR polynomial calculation for test time reductionJutman, ArturComputer Science Meets Automation : 10-13 September 2007 : proceedings. Volume II2007 / p. 153-158 : ill