A scalable static test set compaction method for sequential circuitsAleksejev, Igor; Raik, Jaan; Jutman, Artur; Ubar, Raimund-JohannesProceedings of the 9th IEEE Latin-American Test Workshop : LATW2008 : February 17-20, 2008, Puebla, Mexico2008 / p. 87-92 : ill

Built-in self diagnosis with multiple signature analyzers in digital systemsUbar, Raimund-Johannes; Kostin, Sergei; Raik, JaanProceedings of the 9th IEEE Latin-American Test Workshop : LATW2008 : February 17-20, 2008, Puebla, Mexico2008 / p. 29-34 : ill

PSL assertion checking with temporally extended high-level decision diagramsJenihhin, Maksim; Raik, Jaan; Tšepurov, Anton; Ubar, Raimund-JohannesProceedings of the 9th IEEE Latin-American Test Workshop : LATW2008 : February 17-20, 2008, Puebla, Mexico2008 / p. 49-54 : ill