Untestable fault identification in sequential circuits using model-checkingRaik, Jaan; Fujiwara, Hideo; Ubar, Raimund-Johannes; Krivenko, AnnaProceedings of the 17th Asian Test Symposium ATS 2008 : November 24-27, 2008, Sapporo, Japan2008 / p. 21-26 : ill http://dx.doi.org/10.1109/ATS.2008.22

Untestable fault identification in sequential circuits using model-checkingRaik, Jaan; Fujiwara, Hideo; Ubar, Raimund-Johannes; Krivenko, Anna2002-2011 : 20th Anniversary compendium of papers from Asian Test Symposium2011 / p. 257-262 : ill https://ieeexplore.ieee.org/document/4711554